Download Capacitance Requirements for High Speed

Survey
yes no Was this document useful for you?
   Thank you for your participation!

* Your assessment is very important for improving the workof artificial intelligence, which forms the content of this project

Document related concepts

Telecommunications engineering wikipedia , lookup

History of electric power transmission wikipedia , lookup

Automatic test equipment wikipedia , lookup

Surge protector wikipedia , lookup

Power MOSFET wikipedia , lookup

Opto-isolator wikipedia , lookup

Nominal impedance wikipedia , lookup

Zobel network wikipedia , lookup

Impedance matching wikipedia , lookup

Transcript
Application Report
SLVA793 – June 2016
Capacitance Requirements for High Speed Signals
Guy Yater
ABSTRACT
This application report addresses the capacitive loads presented by transient voltage suppressors (TVS)
to high-speed signals. With the industry trend towards smaller and smaller chipset feature sizes with
higher data rates, the chipset’s tolerance to transient voltages has decreased. Electrostatic discharge
(ESD) protection is more important now than ever before. The challenge in using a TVS which presents a
lower clamping voltage to the protected chipset during a transient voltage event is that in order to lower
the clamping voltage a TVS will, typically, also present a higher capacitance. These two TVS
characteristics, clamping voltage and capacitance are inversely proportional to each other, so that
lowering one increases the other. To counter this, Texas Instruments continuously develops new device
processes to reduce both the clamping voltage and the capacitive load. Still, within the same process, it is
a general rule that a higher capacitance TVS leads to lower clamping voltages. With this basic rule it
becomes important to understand how much capacitance a high-speed signal can tolerate and still
maintain proper signal integrity.
1
2
3
4
5
6
Contents
Introduction ...................................................................................................................
Why Impedance Mismatches Matter ......................................................................................
USB 3.0 Gen 1 ..............................................................................................................
USB 3.1 Gen 2 ..............................................................................................................
Conclusion ....................................................................................................................
References ...................................................................................................................
2
2
4
6
8
8
List of Figures
1
Segment of Two-Wire Transmission Line ................................................................................ 2
2
Equivalent Circuit for a Two-Wire Transmission Line
3
Impedance of TPD1E04U04DPY from 192-ps Rise-Time TDR ....................................................... 3
4
Impedance of TPD4E02B04DQA from 192-ps Rise-Time TDR ....................................................... 3
5
Binary Code in an Eye Diagram ........................................................................................... 3
6
USB 3.0 Gen 1 Full-Compliance Schematic without ESD Protection
7
USB 3.0 Gen 1 Eye Diagram without ESD Protection .................................................................. 5
8
USB 3.0 Gen 1 Eye Diagram with TPD4E02B04DQA ESD Protection .............................................. 5
9
USB 3.0 Gen 1 Full-Compliance Schematic with ESD Protection .................................................... 6
10
USB 3.1 Gen 2 Eye Diagram without ESD Protection .................................................................. 7
11
USB 3.1 Gen 2 Eye Diagram with TPD4E02B04DQA ESD Protection .............................................. 7
12
USB 3.1 Gen 2 Eye Diagram with 0.5-pF TVS .......................................................................... 8
1
Eye Diagram Measurements with and without ESD Protection ....................................................... 6
2
Eye Diagram Measurements with and without ESD Protection
..................................................................
................................................
2
4
List of Tables
SLVA793 – June 2016
Submit Documentation Feedback
.......................................................
Capacitance Requirements for High Speed Signals
Copyright © 2016, Texas Instruments Incorporated
8
1
Introduction
1
www.ti.com
Introduction
High-speed signals are typically routed by impedance matched transmission lines. This can be in the form
of traces on a printed circuit board (PCB) or a cable connecting a source to a sink. ESD protection devices
are usually placed on a PCB very near to the connector where ESD is anticipated. The transmission line
architecture of most high speed signals on a PCB is in the form of differential signal pairs. A simplified
model of this is shown in Figure 1. Each unit length of the transmission line is comprised of an inductor,
resistor, and capacitor. In an equivalent circuit with small enough unit lengths, the losses become
negligible enough to consider only the inductance and capacitance as shown in Figure 2. The equation for
the characteristic impedance, Z0, then simply becomes
The inductance in a TVS which is in series with the differential line is usually nonexistent (this is especially
true for the TVS that has one protection pin for each protected line) while the parallel capacitance is
somewhere on the order of 0.1 pF to 1 pF. This arrangement presents mostly capacitance to the node of
the transmission line, so that the characteristic impedance becomes much lower at that point.
L
R
G
C
L
R
Figure 1. Segment of Two-Wire Transmission Line
L
C
Figure 2. Equivalent Circuit for a Two-Wire Transmission Line
2
Why Impedance Mismatches Matter
Any mismatch in impedance at the node where the TVS connects to the transmission line has an impact
on the signal integrity. The effect from a mismatch in impedance on a voltage-varying signal propagating
down a transmission line is to reflect back some voltage towards the source, of which some voltage can
then reflect back again if there is another change in impedance. This back and forth reflection continues
through the line wherever there are any impedance mismatches. Depending on the distance between the
impedance mismatches, the signal may be attenuated or amplified due to any part of the signal that has
been reflected back and forth being added to the signal propagating down the line. If the impedance
mismatches are big enough, then these reflections can change the voltage levels of the signal outside of
the receivers input logic levels, leading to a loss of data.
2
Capacitance Requirements for High Speed Signals
Copyright © 2016, Texas Instruments Incorporated
SLVA793 – June 2016
Submit Documentation Feedback
Why Impedance Mismatches Matter
www.ti.com
110
110
105
105
100
100
Impedance (Ohms)
Impedance (Ohms)
Some industry specifications stipulate how much total parasitic capacitance a source or a sink can have,
not including what resides in the receiver chipset. For USB 3.1 Gen 1 this is 1.25 pF for a source and for
Gen 2 it is 1.1 pF. Other industry specifications don’t specify the capacitance by value, but rather by the
impact on the characteristic impedance of the transmission line when measured by a time domain
reflectometer (TDR) using a specified rise-time. The HDMI 2.0 specification stipulates no single excursion
beyond 100 Ω ±25% for a duration of 250 ps when measured with a TDR rise-time of less 200 ps.
Impedances for some Texas Instruments TVS devices are shown in Figure 3 and Figure 4.
95
90
95
90
85
85
80
80
75
75
0
1
2
3
4
5
0
1
Time (ns)
2
3
4
5
Time (ns)
Figure 3. Impedance of TPD1E04U04DPY from 192-ps
Rise-Time TDR
Figure 4. Impedance of TPD4E02B04DQA from 192-ps
Rise-Time TDR
Controlling the impedance in a transmission line is paramount to maintaining good signal integrity. The
HDMI 2.0 specification follows the section defining impedance characteristics with the stipulation that the
eye diagram mask test must be passed. One of the most useful tools for verifying good signal integrity is
the data eye diagram. The data eye diagram is comprised of every unit interval in a multi-bit pseudorandom bit sequence (PRBS) signal superimposed on one another. Figure 5 show six example transitions
mapped by the eye diagram.
Figure 5. Binary Code in an Eye Diagram
SLVA793 – June 2016
Submit Documentation Feedback
Capacitance Requirements for High Speed Signals
Copyright © 2016, Texas Instruments Incorporated
3
USB 3.0 Gen 1
3
www.ti.com
USB 3.0 Gen 1
Figure 6 shows a full-channel USB 3.1 Gen 1 compliant model without the addition of a TVS. The
resultant eye diagram can be seen in Figure 7. Figure 8 shows the eye diagram for the same circuit
utilizing the TPD4E02B04 ESD protection device by Texas Instruments at the source connector. The
schematic model is shown in Figure 9.
Figure 6. USB 3.0 Gen 1 Full-Compliance Schematic without ESD Protection
4
Capacitance Requirements for High Speed Signals
Copyright © 2016, Texas Instruments Incorporated
SLVA793 – June 2016
Submit Documentation Feedback
USB 3.0 Gen 1
www.ti.com
Figure 7. USB 3.0 Gen 1 Eye Diagram without ESD Protection
Figure 8. USB 3.0 Gen 1 Eye Diagram with TPD4E02B04DQA ESD Protection
SLVA793 – June 2016
Submit Documentation Feedback
Capacitance Requirements for High Speed Signals
Copyright © 2016, Texas Instruments Incorporated
5
USB 3.1 Gen 2
www.ti.com
Figure 9. USB 3.0 Gen 1 Full-Compliance Schematic with ESD Protection
Table 1 shows the eye diagram measurements with and without ESD protection
Table 1. Eye Diagram Measurements with and without
ESD Protection
No ESD
Protection
TPD4E02B04
Change
Rise Time
81.96 ps
86.18 ps
+4.22 ps
Fall Time
81.89 ps
86.11 ps
+4.22 ps
Eye Height
266 mV
243 mV
–23 mV
Eye Width
182.8 ps
177.7 ps
–5.1 ps
Jitter(PP)
17.2 ps
22.8 ps
+5.6 ps
Jitter(RMS)
2.969 ps
3.836 ps
+0.867 ps
The additional capacitance of a TVS has an impact on rise and fall-times by slowing them down. This
negatively impacts the rest of the table values as well. However, the low-capacitance of TPD4E02B04
only minimally impacts the eye diagram making it an excellent choice for ESD protection in a USB 3.0
Gen 1 system. TPD4E02B04 is also successful in a USB 3.1 Gen 2 application.
4
USB 3.1 Gen 2
USB 3.1 Gen 2 allows a data rate of 10 Gbps. Figure 10, Figure 11 and Figure 12 map out the data eye
without a TVS, with the TPD4E02B04 TVS, and with a 0.5-pF TVS.
6
Capacitance Requirements for High Speed Signals
Copyright © 2016, Texas Instruments Incorporated
SLVA793 – June 2016
Submit Documentation Feedback
USB 3.1 Gen 2
www.ti.com
Figure 10. USB 3.1 Gen 2 Eye Diagram without ESD Protection
Figure 11. USB 3.1 Gen 2 Eye Diagram with TPD4E02B04DQA ESD Protection
SLVA793 – June 2016
Submit Documentation Feedback
Capacitance Requirements for High Speed Signals
Copyright © 2016, Texas Instruments Incorporated
7
Conclusion
www.ti.com
Figure 12. USB 3.1 Gen 2 Eye Diagram with 0.5-pF TVS
Table 2 lists the eye diagram measurements with and without ESD protection.
Table 2. Eye Diagram Measurements with and without
ESD Protection
Rise Time
No ESD
Protection
TPD4E02B04
0.5-pF TVS
63.55 ps
67.11 ps
NA
Fall Time
63.77 ps
66.15 ps
NA
Eye Height
132.3 mV
112 mV
NA
Eye Width
84 ps
81.93 ps
NA
Jitter(PP)
15.6 ps
18.07 ps
NA
Jitter(RMS)
2.725 ps
3.167 ps
NA
The 10-Gbps signal is still able to maintain signal integrity with the low capacitance of the TPD4E02B04
while providing ESD protection for the Gen 2 USB 3.1 transmitter. When using a TVS with a capacitance
of 0.5 pF, the results from selecting the wrong ESD protection TVS are an eye diagram that does not pass
the eye mask test.
5
Conclusion
Today's high-speed signals push the envelope of technology. Texas Instruments ESD protection devices
help the system-level designer keep pace while providing IEC 61000-4-2 Level 4 ESD protection. With a
large family of ultra-low capacitance TVS diodes designed to be easy to layout on PCB, Texas
Instruments offers the correct TVS for a wide range of applications up to 20 Gbps.
6
References
•
•
•
8
Reading and Understanding an ESD Protection Datasheet (SLLA305)
ESD Protection Layout Guide (SLVA680)
TI ESD Protection and the HDMI CTS (SLVA747)
Capacitance Requirements for High Speed Signals
Copyright © 2016, Texas Instruments Incorporated
SLVA793 – June 2016
Submit Documentation Feedback
IMPORTANT NOTICE
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other
changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest
issue. Buyers should obtain the latest relevant information before placing orders and should verify that such information is current and
complete. All semiconductor products (also referred to herein as “components”) are sold subject to TI’s terms and conditions of sale
supplied at the time of order acknowledgment.
TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary
to support this warranty. Except where mandated by applicable law, testing of all parameters of each component is not necessarily
performed.
TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and
applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide
adequate design and operating safeguards.
TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or
other intellectual property right relating to any combination, machine, or process in which TI components or services are used. Information
published by TI regarding third-party products or services does not constitute a license to use such products or services or a warranty or
endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual property of the
third party, or a license from TI under the patents or other intellectual property of TI.
Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration
and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered
documentation. Information of third parties may be subject to additional restrictions.
Resale of TI components or services with statements different from or beyond the parameters stated by TI for that component or service
voids all express and any implied warranties for the associated TI component or service and is an unfair and deceptive business practice.
TI is not responsible or liable for any such statements.
Buyer acknowledges and agrees that it is solely responsible for compliance with all legal, regulatory and safety-related requirements
concerning its products, and any use of TI components in its applications, notwithstanding any applications-related information or support
that may be provided by TI. Buyer represents and agrees that it has all the necessary expertise to create and implement safeguards which
anticipate dangerous consequences of failures, monitor failures and their consequences, lessen the likelihood of failures that might cause
harm and take appropriate remedial actions. Buyer will fully indemnify TI and its representatives against any damages arising out of the use
of any TI components in safety-critical applications.
In some cases, TI components may be promoted specifically to facilitate safety-related applications. With such components, TI’s goal is to
help enable customers to design and create their own end-product solutions that meet applicable functional safety standards and
requirements. Nonetheless, such components are subject to these terms.
No TI components are authorized for use in FDA Class III (or similar life-critical medical equipment) unless authorized officers of the parties
have executed a special agreement specifically governing such use.
Only those TI components which TI has specifically designated as military grade or “enhanced plastic” are designed and intended for use in
military/aerospace applications or environments. Buyer acknowledges and agrees that any military or aerospace use of TI components
which have not been so designated is solely at the Buyer's risk, and that Buyer is solely responsible for compliance with all legal and
regulatory requirements in connection with such use.
TI has specifically designated certain components as meeting ISO/TS16949 requirements, mainly for automotive use. In any case of use of
non-designated products, TI will not be responsible for any failure to meet ISO/TS16949.
Products
Applications
Audio
www.ti.com/audio
Automotive and Transportation
www.ti.com/automotive
Amplifiers
amplifier.ti.com
Communications and Telecom
www.ti.com/communications
Data Converters
dataconverter.ti.com
Computers and Peripherals
www.ti.com/computers
DLP® Products
www.dlp.com
Consumer Electronics
www.ti.com/consumer-apps
DSP
dsp.ti.com
Energy and Lighting
www.ti.com/energy
Clocks and Timers
www.ti.com/clocks
Industrial
www.ti.com/industrial
Interface
interface.ti.com
Medical
www.ti.com/medical
Logic
logic.ti.com
Security
www.ti.com/security
Power Mgmt
power.ti.com
Space, Avionics and Defense
www.ti.com/space-avionics-defense
Microcontrollers
microcontroller.ti.com
Video and Imaging
www.ti.com/video
RFID
www.ti-rfid.com
OMAP Applications Processors
www.ti.com/omap
TI E2E Community
e2e.ti.com
Wireless Connectivity
www.ti.com/wirelessconnectivity
Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265
Copyright © 2016, Texas Instruments Incorporated