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RTCA SC-135 and EUROCAE WG-14
Change Proposal Form
(One major comment per form.)
(Shaded blocks for committee use only.)
SC-135/WG-14 Paper Number:
Date:
DO-160F/ED-14F Section:
Rev G #092
5/2/08
Section 22
AE-2_G P001
Author’s Name, Affiliation, and E-mail:
Paragraph:
Page:
[email protected]
22.5.1 (a)
22-9
Summary of Change (25 words or less):
Remove guidance on hipot testing from procedures and add to Users Guide Section
Reason for Change (Justification):
New format is expected to make requirements clearer by separating guidance and expanding on it in the
Users Guide.
Revise From:
A dielectric withstand voltage or high potential (hi-pot) test may be used in lieu of the pin
injection test to verify the ability of electrically simple devices such as actuators, linear variable
differential transformers (LVDTs), and speed sensors to demonstrate compliance to the pin test
requirements. These simple electrical devices must be passive with no EMI filters or transient
voltage suppressors (or other similar electrical circuit elements that are connected through case
ground to aircraft structure). In addition, the hi-pot test is applicable for electrical devices that are
electrically isolated from case and local airframe grounds. In these cases, the interface signal and
return wiring must be routed together (e.g. twisted pair) in the intended installation such that an
insignificant line-to-line induced voltage results. The hi-pot test voltage level is to be at least the
peak amplitude of a level in Table 22-2 (Note: when testing pins which normally have a bias
voltage, i.e. power line inputs or other sources, this voltage must be added to the peak test voltage
of Table 22-2). This test voltage may be applied from each pin to case or from all pins,
simultaneously, to case.
Revise To:
Pin injection testing shall be used on the EUT however a dielectric withstand voltage method
(hi-pot) may be used when the EUT is an electrically simple device. The dielectric withstand test voltage
level shall be at least the peak amplitude of a level in Table 22-2 (Note: when testing pins which
normally have a bias voltage, i.e. power line inputs or other sources, this voltage must be
added to the peak test voltage of Table 22-2). Justification for the use of the hi-pot test and a description of
the test shall be provided in the test report.
Proposal Page Number:
1 of 2
SC-135/ED-14 Change Proposal Form Rev G
As Modified Text:
Pin injection testing shall be used on the EUT, however a dielectric withstand voltage method (hi-pot) may
be used when the EUT is a simple electrical or electromechanical device that is isolated from case and
local airframe ground. The Hi-pot test is not applicable for any EUT containing electronic components.
The dielectric withstand voltage test level shall be at least the peak amplitude of a level in Table 22-2.
When testing pins which normally have a bias voltage, i.e. power line inputs or other sources, this voltage
must be added to the peak test voltage of Table 22-2. This satisfies the intent of the pin test requirement
however the category must be marked as Z. Identification of the simple device(s), and a description of the
test shall be provided in the test report.
WG31 is concerned by the risk of loosing the description of simple devices and when /why this simple
Alternate method can be used. Also consider a table listing the type of devices on which this is applicable
and take into account corrections such as those due to altitude.
X
Accepted As Written
Withdrawn
Accepted As Modified by AE2
Rejected
Deferred
Other
Rejection Reason / Comments:
Proposal Deferred To:
RTCA SC-135 Concurrence
Proposal Disposition By:
SC135
EUROCAE WG-14 Concurrence
Date:
3/19/09
Proposal Page Number:
2 of 2
SC-135/ED-14 Change Proposal Form Rev G