DRAFT OF PROPOSED NFPA 70® 2014 Edition National Electrical
... 2014 Edition National Electrical Code® Note: Copies of proposals are published in the NEC ROP for the 2013 Annual Revision Cycle. ...
... 2014 Edition National Electrical Code® Note: Copies of proposals are published in the NEC ROP for the 2013 Annual Revision Cycle. ...
Service and Metering Guide
... 2. Some of these standards may carry the name or logo of “Aquila”, “Aquila Networks Canada”, “UtiliCorp”, “UtiliCorp Networks Canada”, “UNC”, “West Kootenay Power” or “WKP”. Any such references are to be taken as a reference to FortisBC. By formal agreement between FortisBC, Aquila Networks Canada, ...
... 2. Some of these standards may carry the name or logo of “Aquila”, “Aquila Networks Canada”, “UtiliCorp”, “UtiliCorp Networks Canada”, “UNC”, “West Kootenay Power” or “WKP”. Any such references are to be taken as a reference to FortisBC. By formal agreement between FortisBC, Aquila Networks Canada, ...
Contents - Invertek
... VFD’s shall be capable of controlling and correctly protecting the motor/s detailed in section 14.3 throughout the required frequency range. VFD’s should include protection features to ensure that the motor may not operate in an overloaded condition which may cause damage to the connected motor. VFD ...
... VFD’s shall be capable of controlling and correctly protecting the motor/s detailed in section 14.3 throughout the required frequency range. VFD’s should include protection features to ensure that the motor may not operate in an overloaded condition which may cause damage to the connected motor. VFD ...
Contents - Invertek
... VSD specified for the motors listed in appendix C must be capable of supplying the required full load motor current at the project specified altitude. A statement of de-rating must be provided by the VSD manufacturer within the product user manual. ...
... VSD specified for the motors listed in appendix C must be capable of supplying the required full load motor current at the project specified altitude. A statement of de-rating must be provided by the VSD manufacturer within the product user manual. ...
MIL STD 883G
... to the actual service conditions existing in the field, and to obtain reproducibility of the results of tests. The tests described herein are not to be interpreted as an exact and conclusive representation of actual service operation in any one geographic or outer space location, since it is known t ...
... to the actual service conditions existing in the field, and to obtain reproducibility of the results of tests. The tests described herein are not to be interpreted as an exact and conclusive representation of actual service operation in any one geographic or outer space location, since it is known t ...
Test Structures for Benchmarking the Electrostatic
... electromigration, and MOSFET analysis for the optimization and understanding of various semiconductor processes. These standardized structures and metrics also provide a vehicle of communication between the customer and foundry. The test structures have been defined with the following assumptions: • ...
... electromigration, and MOSFET analysis for the optimization and understanding of various semiconductor processes. These standardized structures and metrics also provide a vehicle of communication between the customer and foundry. The test structures have been defined with the following assumptions: • ...
high frequency noise in cmos low noise amplifiers
... Contrary to the common assumption that drain current exhibits only 1/f and white channel thermal noise contributions, this study demonstrates that the substrate generates thermal fluctuations that produce additive channel noise, amplified by the substrate transconductance. This component produces an ...
... Contrary to the common assumption that drain current exhibits only 1/f and white channel thermal noise contributions, this study demonstrates that the substrate generates thermal fluctuations that produce additive channel noise, amplified by the substrate transconductance. This component produces an ...
White Paper 4 Understanding Electrical Overstress
... Damage signatures from Electrical Overstress (EOS) are the leading reported cause of returns in integrated circuits and systems that have failed during operation. Solutions to this problem are hindered by a prevailing misconception in the electronics industry that insufficient robustness to electros ...
... Damage signatures from Electrical Overstress (EOS) are the leading reported cause of returns in integrated circuits and systems that have failed during operation. Solutions to this problem are hindered by a prevailing misconception in the electronics industry that insufficient robustness to electros ...
Chapter 4: EOS Root Causes - Industry Council on ESD Target Levels
... Damage signatures from Electrical Overstress (EOS) are the leading reported cause of returns in integrated circuits and systems that have failed during operation. Solutions to this problem are hindered by a prevailing misconception in the electronics industry that insufficient robustness to electros ...
... Damage signatures from Electrical Overstress (EOS) are the leading reported cause of returns in integrated circuits and systems that have failed during operation. Solutions to this problem are hindered by a prevailing misconception in the electronics industry that insufficient robustness to electros ...
c62 series definitions
... A discrete surge protective device involving a single specific technology and intended to be installed as a component within a surge protector or as a component housed within the equipment to be protected. NOTE-- Examples are “component air gap surge-protective device”, “component gas tube surge-pro ...
... A discrete surge protective device involving a single specific technology and intended to be installed as a component within a surge protector or as a component housed within the equipment to be protected. NOTE-- Examples are “component air gap surge-protective device”, “component gas tube surge-pro ...
DNV-OS-D201: Electrical Installations
... This service document has been prepared based on available knowledge, technology and/or information at the time of issuance of this document, and is believed to reflect the best of contemporary technology. The use of this document by others than DNV is at the user's sole risk. DNV does not accept an ...
... This service document has been prepared based on available knowledge, technology and/or information at the time of issuance of this document, and is believed to reflect the best of contemporary technology. The use of this document by others than DNV is at the user's sole risk. DNV does not accept an ...
Coupled electromagnetic and structural analysis of support
... With increasing fuel prices and growing interest in environmentally friendly transportation the aerospace industry has set ambitious targets for all electric flight. At the same time there is growing interest in the rotorcraft market that is expected to grow significantly in the next decades. Althou ...
... With increasing fuel prices and growing interest in environmentally friendly transportation the aerospace industry has set ambitious targets for all electric flight. At the same time there is growing interest in the rotorcraft market that is expected to grow significantly in the next decades. Althou ...
Noise Modeling in MOSFET and Bipolar Devices
... Input referred noise spectra in these n channel TR vary very little as the gate voltage changes, both in the linear and saturation Regions of operation. The “independence” from gate bias voltage in the input referred noise suggests that flicker noise from these n-channel devices is due to carrier-de ...
... Input referred noise spectra in these n channel TR vary very little as the gate voltage changes, both in the linear and saturation Regions of operation. The “independence” from gate bias voltage in the input referred noise suggests that flicker noise from these n-channel devices is due to carrier-de ...
Electromagnetic compatibility
Electromagnetic compatibility (EMC) is the branch of electrical sciences which studies the unintentional generation, propagation and reception of electromagnetic energy with reference to the unwanted effects (electromagnetic interference, or EMI) that such energy may induce. The goal of EMC is the correct operation, in the same electromagnetic environment, of different equipment which use electromagnetic phenomena, and the avoidance of any interference effects.In order to achieve this, EMC pursues two different kinds of issues. Emission issues are related to the unwanted generation of electromagnetic energy by some source, and to the countermeasures which should be taken in order to reduce such generation and to avoid the escape of any remaining energies into the external environment. Susceptibility or immunity issues, in contrast, refer to the correct operation of electrical equipment, referred to as the victim, in the presence of unplanned electromagnetic disturbances.Interference mitigation and hence electromagnetic compatibility is achieved by addressing both emission and susceptibility issues, i.e., quieting the sources of interference and hardening the potential victims. The coupling path between source and victim may also be separately addressed to increase its attenuation.