Download Quantitative analysis of nanoparticles with EPMA

Survey
yes no Was this document useful for you?
   Thank you for your participation!

* Your assessment is very important for improving the workof artificial intelligence, which forms the content of this project

Document related concepts

Super-Kamiokande wikipedia , lookup

Weakly-interacting massive particles wikipedia , lookup

ALICE experiment wikipedia , lookup

Identical particles wikipedia , lookup

Electron scattering wikipedia , lookup

Elementary particle wikipedia , lookup

Compact Muon Solenoid wikipedia , lookup

ATLAS experiment wikipedia , lookup

Transcript
I5.P515
- 183 -
MC2009
Quantitative analysis of nanoparticles with EPMA
F. Galbert, D. Berger
Zentraleinrichtung Elektronenmikroskopie, Technische Universität Berlin,
Straße des 17 Juni 135, 10623 Berlin, Germany
[email protected]
Keywords: nanoparticles, quantitative analysis, electron microprobe
Quantitative element analysis of single nanoparticles (less than 1µm) is very
important in research on e.g. mineralogy, environmental pollution, and catalysis.
Usually, nanoparticles are analysed in a transmission electron microscope (TEM) with
Energy Dispersive X-Ray-Spectroscopy (EDS). Since it is a standardless analysis, the
resulting element concentrations are normalised to 100 Wt%. Unfortunately, the standardless
analysis fails, if not all elements of the sample are known and are considered. Moreover the
precision is low for the case of interfering peaks, e.g. overlapping peaks, which do not have a
simple Gaussian shape.
On the contrary, the Electron Probe Micro Analysis (EPMA) uses crystal
spectrometers (i.e. Wavelength Dispersive X-Ray-Spectroscopy, WDS), which may discover
all elements of the sample, due to its higher spectral resolution. Moreover, the X-ray
interaction cross section is larger compared to TEM-EDX, since the EPMA works with a
considerably smaller acceleration voltage resulting in a higher X-ray signal.
Since the spectrometer signal in EPMA is very sensitive to tilted sample surfaces, the
nanoparticles are normally included in resin (fig.1).Then, the sample is polished and coated
with graphite for better conductivity. But this sample preparation has the disadvantage that
most of the X-rays from the sample have to pass through the resin (83 Wt% C, 14 Wt% O, H
and Cl) causing problems by more or less unknown absorption and fluorescence. Therefore,
high precision measurements are hardly possible.
In this paper, we present a new preparation and analysis procedure for the high
precision element analysis of nanoparticles with EPMA. The particles are not included in
resin but suspended in methanol. After a short dispersing in ultrasonic device, a liquid drop is
deposited on a well polished carbon glass surface (fig. 2). During the analysis, the X-rays are
detected by two opposite spectrometers. The two opposite signals are used by simple
summation to compensate for the changes of the X-ray intensities due to the tilted surface of
the nanoparticles.
This method is tested with nanoparticles (400nm to 4 µm) scraped from a well known
and homogeneous olivine mineral (50.51 Wt% MgO, 40.85 Wt% SiO2, 8.26 Wt% FeO, 0.38
Wt% NiO). For small nanoparticles, the beam diameter may exceed the particles size. In this
case, the sum concentrations obtained from the EPMA analysis with standards is smaller than
100%. However, this sum is a measure for the particle size.
Fig. 3 shows the MgO-concentration (dots and squares) of several nanoparticles with
different sizes measured with both opposite spectrometers. As usual, there is a strong
variation due to fluctuations typical for EPMA and due to irregular 3D-shape of the particles.
The mean values are shown by a straight line showing a clear trend different for both
spectrometers. The promising result is that the sum of both mean values gives a constant
MgO-concentration corresponding to the value of a bulk olivine sample very well. The
advantage of the method is the experimental result that the MgO-concentration is determined
with a 2% higher relative precision, which is important for most users of EPMA.
G. Kothleitner, M. Leisch (Eds.): MC2009, Vol. 1: Instrumentation and Methodology,
DOI: 10.3217/978-3-85125-062-6-090, © Verlag der TU Graz 2009
MC2009
- 184 -
I5.P515
The measurements were performed on EPMA CAMEBAX MICROBEAM (Company
CAMECA ) with SAMx programs (WWW.samx.com).
Figure 1. Standard preparation of
nanoparticles for the analysis in EPMA
having the disadvantage of strong Xrays interaction with the resin .
Figure 2. New sample preparation and
analysis method using freestanding
particles combined with the sum signal
of two opposite detectors.
Element concentration of MgO of olivine particles with different sizes
particle size below 0.5 µm
0.5 µm to 1.5µm
bigger than 1.5 µm
MgO- Wt % normalised
56
54
52
50
48
WDS detector 2
WDS detector 1
Linear (WDS detector 1)
Linear (WDS detector 2)
46
44
10.0
20.0
30.0
40.0
50.0
60.0
70.0
80.0
90.0
particle size in terms of sum concentrations of all elements
100.0
110.0
Wt %
Figure 3. MgO-concentration in olivine nanoparticles with different sizes measured
with EPMA with standards and two opposite detectors (black and blue); the straight
lines show the mean values of the statistically fluctuating values; the red dashed line
depicts the expected MgO-concentration equal to bulk olivine.
G. Kothleitner, M. Leisch (Eds.): MC2009, Vol. 1: Instrumentation and Methodology,
DOI: 10.3217/978-3-85125-062-6-090, © Verlag der TU Graz 2009