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Page 1/9 Get better fidelity in Image View. PHYSICS 123 LAB – AUTUMN 2006 EXPERIMENT 4: DIFFRACTION, INTERFERENCE, AND THIN FILMS Experiment 4 SINGLE-SLIT DIFFRACTION, TWO-SLIT INTERFERENCE, AND THIN-FILM INTERFERENCE Objectives * Study single slit diffraction * Study double slit interference and observe other interference patterns * Learn how to use the optical path difference to analyze thin film interference * Observe and analyze the interference patterns produced by thin air gaps between flat glass plates Interference and Diffraction as Superposition of Light Waves If two light waves are present at the same place at the same time, their electric and magnetic fields add according to the superposition principle. If the two waves are in phase, they add constructively to produce a new wave with greater amplitude. If the two waves are 180° out of phase and have the same amplitude, they add destructively - the combined amplitude is zero. The result of adding two light wave amplitudes is called interference and can be observed in a variety of situations. Single Slit Diffraction Diffraction is the name we give to interference phenomena that occur when a light wave passes the edge of an obstruction. The diffraction of light is usually not noticeable because its effects are often too small or too faint to be seen with the naked eye. We will study diffraction by passing light from a laser through an opening with a size on the order of 100 times the wavelength of the light. Recall from lecture and tutorial that the equation describing the location of single slit diffraction minima is a sinq = nl, n = 1, 2, 3, ··· where a is the slit width, q is the angle from the central maximum to the nth minimum, and l is the wavelength of the light. In this experiment, we will be using He-Ne gas lasers that emit red light of wavelength 633nm, (1 nm = 10-9 m). 1. Locate the diffraction plate from your optics kit and observe the single slits A, B, and C using a magnifying glass. Rank the slits widths aA, aB and aC according to width. 2. Based on your ranking, predict how the diffraction patterns formed by these slits will compare. In particular, rank the distances 2x1(A ), 2x1(B ) and 2x1(C ) between the first minimum on one side of the central maximum to the first minimum on the other side, for slits A, B, and C Set up the apparatus as shown in Figure 1. Tape a piece of plain white paper on the front of the screen. Set the distance from the front of the component carrier to the screen to 1.000m (see diagram). Note the position of the carrier as measured by Name: ___________________ S.N.: ____________________ SECTION: PARTNER: DATE: INTERFERENCE.DOC 2017-05-01 4-1 Next Page Find Go to Page Thumbnail Index Image View Download a Copy Close