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Circular and elliptical polarization Producing polarized light
Circular and elliptical polarization Producing polarized light

... amplitude with orthogonal linear polarizations, and 90˚ out of phase. The tip of E describes a circle (counterclockwise = RH and clockwise=LH depending on y component ahead or behind) ...
AC Circuits
AC Circuits

... function of the wavelength of the light. Because optical absorption in the visible and near-UV portions of the spectrum is generally the result of absorption of light by electrons in atoms, ions or molecules, the absorption characteristics can yield a considerable amount of information regarding the ...
Demonstration of Optical Rotatory Dispersion of Sucrose
Demonstration of Optical Rotatory Dispersion of Sucrose

... prism or polarizer sheet in order to ensure maximum linear polarization. If the output of the laser system is nearly linearly polarized, this polarizer feature may not be necessary, particularly for simple demonstrations. To demonstrate the effect, corn syrup (e.g., Karo syrup) is ideal; however, co ...
Fiber Optic
Fiber Optic

... iii ) Transit time: Transit time is the time it takes a light-induced carrier to travel across the depletion region. iv ) Spectral response: Spectral response is the range of wavelength values that can be used for a given photodiode. v ) Light sensitivity: Light sensitivity is the minimum optical po ...
Characterisation of the Tunable Laser Source
Characterisation of the Tunable Laser Source

... If the laser cavity is much longer than the wavelength, which is usually the case, more than one wavelength will be emitted. Looking at the spectrum (amplitude versus wavelength) of lasers, each individual spectral laser line is referred to as one mode. This type of laser is known as a Multiple Long ...
Nanometer optical coherence tomography using
Nanometer optical coherence tomography using

... [7] Jasny et al.: A single-shot spectrograph for the soft X-ray region, Review of Scientific Instruments, 1994 [8] Fuchs et al., Sensitivity calibration of an imaging extreme ultraviolet spectrometer-detector system for determining the efficiency of broadband extreme ultraviolet sources, Rev. Sci. I ...
Syllabus
Syllabus

... Introduction to optical waveguides and fibers, propagation characteristics of fibers, characterization methods, LEDs, laser diodes, optical receivers, optical amplifiers, all-optical switching and fiber optic communication systems. The objective is to give students a comprehensive understanding of t ...
Nanophotonics Lecture 1 - Groups
Nanophotonics Lecture 1 - Groups

... Using photons as bits of information instead of electrons would revolutionize data processing, optical communications, and possibly computing What is wrong with using electric current instead of photonic beams? Good: electrons are small; devices are potentially scalable to a size of a single molecul ...
Prepared By - ichapps.com
Prepared By - ichapps.com

File
File

... where λ is wavelength of light a is width of slit x is half linear width of central maxima (x = λD/a) D is distance between slit and screen 14. Unpolarised or ordinary light :In such light oscillation of electric field occur in all directions in a plane perpendicular to the direction of light propog ...
Problem 2
Problem 2

... The optical properties of a medium are governed by its relative permittivity (  r ) and relative permeability (  r ). For conventional materials like water or glass, which are usually optically transparent, both of their  r and  r are positive, and refraction phenomenon meeting Snell’s law occur ...
A simple demonstration of frustrated total internal reflection
A simple demonstration of frustrated total internal reflection

... sufficiently close to each other and controlling and measuring their distance precisely. Most experimental setups that have been tried employ an adjustable air gap between two right-angle prisms. If the exponential fall-off of the coupling is to be measured with good accuracy, we need a set-up that ...
1 Janaky Narayanan PC 5213 AY 2004
1 Janaky Narayanan PC 5213 AY 2004

... The three dimensional spatial arrangement of the atoms of a molecule is termed its stereochemistry. A molecule may be identified first by its chemical formula, then by its chemical structure, and finally by its molecular structure. For example, C2H6O is the chemical formula of ethyl alcohol. CH3-CH2 ...
Activity: Emission spectroscopy and smart sensors
Activity: Emission spectroscopy and smart sensors

... (clay ). The USB link is used to bring power the spectrometer and transmit data to the computer. Light is brought to the spectrometer using the optical fiber. ...
Design and Simulation of DPSS Laser with SHG for Material
Design and Simulation of DPSS Laser with SHG for Material

... method is to use a birefringent crystal as these have two refractive indices: ordinary index no and extraordinary index ne. Suppose that along a certain crystal direction at an angle to the optic axis, ne(2 ) at the second harmonic is the same as no( ) at the fundamental frequency: ne(2 )=no( ). Thi ...
12.5 Total Internal Reflection
12.5 Total Internal Reflection

Fourier Transform Infrared (FTIR) Spectroscopy
Fourier Transform Infrared (FTIR) Spectroscopy

... •  Coherence required for interference: only occurs if two waves have the same frequency and polarization Ordinary light is not coherent because it comes from independent atoms which emit on time scales of about 10-8 seconds. Laser light is an example of a coherent light source – a common stimulus t ...
Click To
Click To

... period of an array of permanent magnets arranged in a repelling configuration. It would be desirable to be able to vary the stress in a portion of an optical fiber segment and to vary the birefringence in the entire length of the segment. For information about this technology, please contact: Jeff A ...
PDF Format
PDF Format

... experience two different indices of refraction. Consequently, one polarization of light travels faster in the wave plate compared to the other. The birefringent material of the wave plate are asymmetric in that they have a different index of refraction in one polarization direction compared to the o ...
The petrographic microscope
The petrographic microscope

... A petrographic microscope is used to observe a series of characteristics in a mineral which reflect its properties and allow us to identify it. The petrographic microscope is a compound microscope which can work with plane polarised light, meaning that it has some peculiarities. This is always done ...
Cell Mechanics
Cell Mechanics

... modulus E can be determined by recording and analyzing force-distance-curves. In order to avoid damages of living cells during the measurement and to have well-defined probe geometry for the following calculation of the moduli, we modify commercially available cantilevers by gluing a small polystere ...
Measurement of Optical Characteristic of Plastic by UH4150
Measurement of Optical Characteristic of Plastic by UH4150

... a spectrophotometer. These measurements do not only provide the optical information but also the information related to optical functions such as UV and infrared ray shielding levels. This time, the optical properties of various plastic materials were measured by using UH4150 spectrophotometer, the ...
Optical properties
Optical properties

... broader than the input one. It is because light rays traveling in different trajectories have a variety of path lengths.  It is possible to avoid pulse broadening by using graded-index fiber. This results in a helical path for the light rays, as opposed to zig-zag path in a step-index fiber.  Here ...
Lab 5 - College of Science | Oregon State University
Lab 5 - College of Science | Oregon State University

... ways; one possibility is shown using a center of rotation adapter. The rotatable mount allows you to rotate the glass plate at measurable angles. The rotatable mount also helps to ensure that the rotation axis lies on the reflecting surface, which is important so that the laser beam remains on the g ...
Speed of Light Measurement Utilizing Octagonal
Speed of Light Measurement Utilizing Octagonal

... the optical path length, the focal length of the lens, and increasing the rotational frequency. The main obstacle in these measurements will be to have a beam intense enough to view. Because our optical path length, lensÕ focal length, and rotational frequencies were low intensity was not a problem. ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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