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Two-photon ablation with 1278nm laser radiation
Two-photon ablation with 1278nm laser radiation

... The use of femtosecond pulses and tight focusing leads to very high peak intensities, therefore allowing a precise two-photon interaction. It is crucial that the pulse duration of the radiation delivered to the sample is kept as short as possible. Here the low GVD of the Cr:Forsterite radiation in t ...
Combining Photonic Crystal and Optical Monte
Combining Photonic Crystal and Optical Monte

... periodic pattern (see Fig. 1). The algorithm solves Maxwell’s equations using a Fourier expansion of the electric field and yields scattering matrices R and T . These matrices correlate the amplitudes and phases of the incident and diffracted electromagnetic waves and facilitate the calculation of t ...
On-chip non-reciprocal optical devices based on quantum inspired
On-chip non-reciprocal optical devices based on quantum inspired

... reported in Refs. 8 and 12. Even more importantly, we demonstrate the versatility of our proposed device by showing that it can be used as a polarization splitter. The operation of this photonic diode is based on a complete transfer of optical intensity from one waveguide site at the input to anothe ...
Methods for data, time and ultrastable frequency transfer through
Methods for data, time and ultrastable frequency transfer through

... • Delay determination/synchronization requires a single shot of 10 Gb/s data lasting less than 1 ms – For comparison: state-of-the-art methods require 10-100 s of averaging to achieve 4 ps stability ...
Experimental demonstration of a narrowband, angular tolerant
Experimental demonstration of a narrowband, angular tolerant

... structures have been designed to have a low sideband reflectance, a spectral linewidth of 0.1 nm, and a 100% filtering efficiency [11] when they are illuminated by a plane wave. Yet, when they are illuminated by a Gaussian beam, the filtering efficiency of the single groove grating falls dramaticall ...
Manual for experiment on Acoustic Velocity, Impedance, Reflection
Manual for experiment on Acoustic Velocity, Impedance, Reflection

... All materials have some acoustical attenuation, unlike optics, where some materials have almost no attenuation. The acoustical attenuation, or loss, in solids is due to thermodynamics, phonon equilibrium, lattice imperfections, and, in conductors, interactions with electrons. In liquids, there are o ...
Downhole Optical Analysis of Formation Fluids- Disk 2
Downhole Optical Analysis of Formation Fluids- Disk 2

... light at visible and near infrared wavelengths. The relative intensity of transmitted light—transmittance, defined as the ratio of transmitted light energy to incident light energy—is measured at different wavelengths. Because transmittance of typical formation fluids may vary greatly versus wavelen ...
K. S. Al Mugren, Y. El Sayed, H. Shoukry, A. El Taher
K. S. Al Mugren, Y. El Sayed, H. Shoukry, A. El Taher

... The calorimetric measurements of prepared glasses were carried out in Setaram (DSC 131 Evo). Temperature and energy calibrations of the instrument were performed using the wellknown melting temperatures and melting enthalpies of high purity indium and zinc. For nonisothermal experiments, the prepare ...
Theoretical analysis of phase-matched second
Theoretical analysis of phase-matched second

... second-harmonic generation and by optical parametric oscillation. The specific guide material used in the calculation was ZnGeP2 on a GaP substrate. This structure has the added flexibility that phasematched coupling can occur between the various modes of the guide. Moreover the coupling is a functi ...
Statistical Mechanics
Statistical Mechanics

... significant problem within the main areas of nonlinear optics. Describe the photo induced refractive index using the induced polarization and apply the corresponding wave equation to explain transmission of short optical pulses. Differentiate between Raman and Brillouin scattering and explain these ...
Components of Optical Instruments, Cont…
Components of Optical Instruments, Cont…

Confocal Live Cell Microscopy
Confocal Live Cell Microscopy

... Optical Slice Thickness: The thickness of the area from which light is collected to form a confocal image. This is controlled by the size of the pinhole. Live Cell Imaging: Most of the time, samples for fluorescence microscopy are fixed and permeabilized to preserve cell structure and allow fluoroph ...
Wide-field extended-resolution fluorescence
Wide-field extended-resolution fluorescence

... must be done in the near-field [2]. Recent work demonstrated that far-field detection is possible with periodic corrugations in the metal layer [3], and that magnification can similarly be achieved [4]. While super-resolution on the order of λ/4 can be obtained with these methods, the sample must be ...
Phase contrast and DIC - Nikon Imaging Center at UCSF
Phase contrast and DIC - Nikon Imaging Center at UCSF

... of phase are all-important. Why then had phases never been considered before … in the microscope?” • Phases difficult to see – Must convert phase differences to intensity differences Frits Zernike ...
Observation of PT -Symmetry Breaking in Complex Optical
Observation of PT -Symmetry Breaking in Complex Optical

... passive optical double-well structure. The two waveguides were fabricated through a multilayer Alx Ga1x As heterostructure of varying concentrations [Fig. 3(a)]. The introduction of loss in the structure was carefully done in order to maintain the even real refractive index distribution necessary f ...
Laser Tweezers
Laser Tweezers

... Staring through a microscope at Bell Labs in New Jersey, Dr. Art Ashkin sat looking through his microscope onto the miniature world below. His sample, which had a laser focused on it, was behaving in a way that he did not expect. To his surprise, he noticed that some of the particles in his sample b ...
Generalized Polarization Ray Tracing using a Monte
Generalized Polarization Ray Tracing using a Monte

... Equation 5 well predicts the appearance of soap bubbles ([Glassner 1999]), but we should notice that light is actually polarized by reflection/refraction on thin-film according to Fresnel equations.Especially, we should take account the fact that two orthogonally and linearly polarized lights do not ...
External Reflection from Omnidirectional Dielectric Mirror Fibers
External Reflection from Omnidirectional Dielectric Mirror Fibers

... the fabrication of these typically fragile mirrors has been mostly restricted to planar geometries and remains costly. We combined some of the advantages of each of these seemingly dissimilar products in the fabrication of polymeric fibers with an exterior multilayer dielectric mirror. Thermal proce ...
WAVE PLATES
WAVE PLATES

... Polarization Cleanup -Often an optical system will require several reflections from metal or dielectric mirrors. There is no change in the polarization state of the reflection if the beam is incident normally on the mirrors, or if the plane of polarization lies in or normal to the plane of incidence ...
Experimental realization of three-color entanglement at optical fiber
Experimental realization of three-color entanglement at optical fiber

... crystals [18–22]. Recent years, for satisfying the requirements of the developing QIN the generation schemes of multicolor CV entangled states via intra-cavity nonlinear processes have been theoretically proposed [24–27]. In 2009, the first CV three-color entangled state was experimentally produced ...
Laser oscillation in proton implanted Nd:YAG waveguides
Laser oscillation in proton implanted Nd:YAG waveguides

... Introduction Nd doped YAG is one of the most attractive dielectric materials for solid state lasers. The efficiency of laser operation is enhanced by using waveguide geometries, because the optical modes propagate well confined in the waveguide structure, avoiding thus diffraction effects. Several t ...
Optic Version of the Mach-Zehnder Interferometer
Optic Version of the Mach-Zehnder Interferometer

... For the relative measurements of the index of refraction of water, a 50.0-mm long optical glass cuvet is filled with water and placed in the open air space between the beamsplitter and one of the fiber arm ends. A nichrome wire is wound uniformly around the cuvet in order to allow controlled and uni ...
PDF only - at www.arxiv.org.
PDF only - at www.arxiv.org.

... combination discussed above, only ~24% of light generated inside the high-index medium makes it to low-index surrounding through a smooth interface, while the remaining power is reflected back into the high-index material. Conventional anti-reflection coatings can minimize reflection (and thus maxim ...
Enhanced visualization of choroidal vessels using ultrahigh
Enhanced visualization of choroidal vessels using ultrahigh

... compared to 10% at ~800 nm for a double pass of the optical beam through a human eye. This will result in relative sensitivity loss of 2.4 dB when imaging at ~1060 nm and 21 dB at ~1300 nm. However, according to the ANSI standard10, the maximum permissible light exposure in the eye increases with wa ...
Palladium Ultra Thin Layer Profiles Evaluation by Evanescent Light
Palladium Ultra Thin Layer Profiles Evaluation by Evanescent Light

... DELI is an optical evanescent waves microscopy technique based on capturing the light extracted by nano layers deposited on a substrate which also serves as a waveguide [2,3]. The DELI technique used in this investigation is a far field optical microscopy measurement technique developed to achieve a ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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