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Reflection of X-rays with change of frequency
Reflection of X-rays with change of frequency

... glancing angles less than that at which any Bragg reflection of monochromatic X-rays by the crystal could appear. As in the case of light, however, we are not restricted to considering stratifications which are identifiable with sound-waves, and may extend the application ofequations(I), (2) and (3) ...
TOLERANCING OPTICAL SYSTEMS
TOLERANCING OPTICAL SYSTEMS

... Δxi is the tolerance for xi which could be adjusted ΔΦ is the effect from a single parameter xi having an error equal to its tolerance Δxi It should be evident that certain parameters are more sensitive than others and therefore have a large effect on system performance. From this point, tolerances ...
Holographic fabrication of 3D photonic crystals using silicon based
Holographic fabrication of 3D photonic crystals using silicon based

... electromagnetic wave propagation is forbidden [1,2]. Studies of photonic crystals have been driven by their potential applications. One-dimensional PhCs such as fiber Bragg gratings can be fabricated easily for applications in fiber optical communications and fiber sensors [3]. Two-dimensional PhCs ...
PowerPoint 簡報
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...  Selecting the appropriate code sequence will maximize the autocorrelation and minimize the cross-correlation function and then the receiver would be able to distinguish the correct address.  In order to extract data with the desired optical pulse sequence, we therefore have to design sequences th ...
Structure of Optical Vortices
Structure of Optical Vortices

... lated wavefront is transferred by a telescope to the back aperture of a 100 × NA 1.4 oil immersion objective lens mounted in a Zeiss Axiovert S100TV inverted optical microscope. The objective lens focuses the light into optical traps, in this case a single optical vortex. The same lens also forms im ...
Optical forces through guided light deflections
Optical forces through guided light deflections

... in the presence of aberrations when trapping through a thick sample chamber, which can somehow be recovered by aberration correction [25]. Having higher quality factors is needed to fully exploit light’s momentum either to achieve stronger optical forces or to avoid the use of high input powers. On ...
Helicity-dependent three-dimensional optical trapping of chiral
Helicity-dependent three-dimensional optical trapping of chiral

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Time-domain optical data storage by use of Raman coherent population trapping
Time-domain optical data storage by use of Raman coherent population trapping

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Étendue and spectral resolution
Étendue and spectral resolution

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Cladding
Cladding

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Interference with monochromatic light

Reflection of a Ray of Light Introduction: Purpose
Reflection of a Ray of Light Introduction: Purpose

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A Practical Guide to Optical Trapping
A Practical Guide to Optical Trapping

... as small as 10 nm using the radiation pressure from a focused laser beam. In addition, measurement of the light deflection yields information about the position of the object in the laser focus. Many excellent reviews have been written about optical trapping, its uses, and designs, see e.g. [2, 6, 2 ...
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Ultra-thin plasmonic optical vortex plate based on phase
Ultra-thin plasmonic optical vortex plate based on phase

... (azimuthal) Laguerre-Gaussian mode index, and the upper bar denotes the complex conjugate. The relative charge distribution of an optical vortex is obtained by summing all the modes with the same azimuthal index l0, Cl ¼ Rp CLG p;l0 . A his0 togram representing the relative charge distribution for o ...
Novel 3-D microscopy techniques - Purdue University Cytometry
Novel 3-D microscopy techniques - Purdue University Cytometry

... Effect of increased incident power on generation of signal. Samples of acidfucsin-stained monkey kidney were imaged at a depth of 60 µm into the sample by confocal (550 µW of 532-nm light) and by multiphoton (12 mW of 1047-nm light) microscopy. Laser intensities were adjusted to produce the same mea ...
GF2612641270
GF2612641270

... by the photon absorption and, as a consequence of this, a marked sharp increase in the absorption coefficient α (e) will result. The onset of this rapid change in α (e) is called “the fundamental absorption edge”, and the corresponding energy is defined as “the optical energy gap”. Photons with a ce ...
Originally published as “Ultrafast spin polarization in a multiferroic
Originally published as “Ultrafast spin polarization in a multiferroic

... To understand the photo-induced charge- and spin-related response of BFMO, we need to consider the charge transfer (CT) transitions [24]. The band gap for BiFexMn1-xO3 could be modulated from 1.2 ~2.6 eV by altering the doping ratio x, between 0 and 1 [25]. Since the onset of the d-d CT transitions ...
INTERFEROMETERS NOTE: Most mirrors in the apparatus are front
INTERFEROMETERS NOTE: Most mirrors in the apparatus are front

... interferometer consists of parallel semi-silvered glass plates, so that multiple reflections take place. This results in very narrow sharp interference fringes, allowing small wavelength differences to be measured. In particular, this interferometer has been used in the measurement of Zeeman effect ...
Attosecond angular streaking - the Max Planck Institute for the
Attosecond angular streaking - the Max Planck Institute for the

Introduction
Introduction

... directs it on the grating. The second mirror gathers the light from the grating and directs the multiple images of the input slit onto the detector. The concave mirrors are carefully arranged to minimize the optical aberrations introduced by the mirrors. The range of wavelengths detected can be vari ...
Sorting by Periodic Potential Energy Landscapes: Optical
Sorting by Periodic Potential Energy Landscapes: Optical

... κ(a) ∝ 1/ w02 + a2 . Similarly, the potential depth V0 and driving force F0 scale as simple powers of a in the absence of nonlinear effects such as Mie resonances [8]. Consequently, the prefactor q(a) describes no more than algebraic sensitivity to size and material properties. Comparable selectivit ...
Total Reflection X-Ray Fluorescence Spectrometer
Total Reflection X-Ray Fluorescence Spectrometer

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... optical fiber must be connected exactly each other by straight line on x,y,z. However it is impossible actually that the manufacturer of optical components produce all their products through centered the core in the ferrule. And so TIA/EIA recommended all manufacturers to place the core center towar ...
2 - Hal
2 - Hal

... Here n0 is the value of the host dielectric refractive index, the dimensionless function U(z) describes the coordinate dependence of the dielectric susceptibility. This heterogeneity can result in the formation of a cut-off frequency  , dependent upon the gradient and curvature of the  z  profil ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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