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Optical Interferometers
Optical Interferometers

... them in bunches of 5 or 10 (i.e. 100 fringes = 10 bunches of 10 fringes). 4. Before the initial position X1 is read make sure that the micrometer has engaged the drive screw (There can be a problem with ”backlash”). 5. Avoid hitting the table which can cause a sudden jump in the number of fringes. ...
laser - SlideBoom
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Slowdown of light due to exciton-polariton propagation in ZnO
Slowdown of light due to exciton-polariton propagation in ZnO

... the α-measurement geometry (kc, E⊥c). Several important features can be noticed. First of all, the light could only be transmitted when photon energies are below 3.360 eV, which indicates strong near-band-edge absorption at the higher energies. [After decreasing thickness of the sample down to 0.13 ...
On Rayleigh Optical Depth Calculations
On Rayleigh Optical Depth Calculations

... Here we suggest a method for calculation of Rayleigh optical depth that goes back to first principles as suggested by Penndorf (1957) rather than using curve-fitting techniques, although it is true that the refractive index of air is still derived from a curve fit to experimental data. We suggest us ...
61
61

Plasmonic orbital angular momentum manipulation through
Plasmonic orbital angular momentum manipulation through

... switching and multiplexing, effective excitation and modulation of SPP with the help of nanostructures are required and reported recently, where fundamental plasmonic generators are employed to produce various diffractive SPP patterns on the metal/dielectric interfaces, originating from focusing and ...
Single-frequency blue light generation by single-pass
Single-frequency blue light generation by single-pass

... power allowing for higher circulating power compared to SHG where the losses are quadratic.14 The increased losses at high single-pass power will increase the coupling into the cavity as the input mirror M1 transmission ideally should match the losses in the cavity. Taking into account the losses in ...
Dunlap Institute Summer School: Fourier Transform Spectroscopy Lab
Dunlap Institute Summer School: Fourier Transform Spectroscopy Lab

... (see Question 2 below). Record these values for discussion with the lab group. QUESTION 2: Assuming you can read the micrometer to one-half of its smallest scale division, and can count fringe shifts with complete certainty, how much should the arm length be changed to guarantee a wavelength result ...
45.Z-scan measurement of the nonlinear refractive index of graphene
45.Z-scan measurement of the nonlinear refractive index of graphene

... ΔΦ saturates. In this high intensity regime, the exact modeling of the nonlinear response requires us to take into account χ 3 and higher order odd terms, such as χ 5 ; …. However, from the experimental data, an effective nonlinear index can be defined by n2 I  ΔΦ∕k0 LI:. One sees that n2 ...
Proposal and testing of dual-beam dynamic light
Proposal and testing of dual-beam dynamic light

... First, it provides a microscopic probe to study the local properties of rheologically inhomogeneous samples. Second, it requires only a minuscule sample volume, making the technique particularly useful for biological samples that are difficult to obtain in large quantities. To fully utilize these ad ...
FUL TEXT
FUL TEXT

Di raction and Interference PRECAUTION
Di raction and Interference PRECAUTION

... This experiment is greatly facilitated by the use of a laser as a light source. The laser light is highly monochromatic and coherent. Coherence means that there are surfaces, in this experiment approximately planes, in which the light is in phase. When such light falls on a ~ oscillates in phase ove ...
Optics-Diffraction - The Wave Nature of Light
Optics-Diffraction - The Wave Nature of Light

... In this lab we will study electromagnetic waves in the form of visible light. Unlike sound waves or other elastic waves, which must propagate in an elastic medium (such as air, water, solids or strings), electromagnetic waves can propagate in the vacuum of space itself. Much of we what we know about ...
Optical diffraction tomography for high resolution live cell imaging
Optical diffraction tomography for high resolution live cell imaging

... 16] for points close to the plane of focus. However, since the effect of diffraction is ignored, there is loss of resolution for samples which are large compared to the depth of focus of the imaging system. A more general approach, which takes the diffraction into account, is diffraction tomography ...
Special Optical Elements
Special Optical Elements

... l or the thickness of the layer is changed so that the two reflected waves are now in phase (i.e., the layer is l2 thick), then the total reflectivity at this wavelength is increased, although still quite low [about 10% from only two surfaces, Fig. 3.3(C,D)]. The total reflectivity can be increased ...
One-way invisible cloak using parity-time symmetric transformation optics Xuefeng Zhu, Liang Feng,
One-way invisible cloak using parity-time symmetric transformation optics Xuefeng Zhu, Liang Feng,

U17301 - 3B Scientific
U17301 - 3B Scientific

... Parameters of thick lenses – determination of radius of curvature Parameters of thick lenses – focal length Model of a normal eye Model of short-sighted eye Model of long-sighted eye Correction of spherical aberration by reducing the beam diameter Correction of spherical aberration by combination of ...
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PDF

Motion and Optical Flow
Motion and Optical Flow

... – Based on gradients in space and time – Dense correspondence estimates – Most common with video • Large displacements ...
Simulation of Optical Microfiber Loop Resonators for Ambient Refractive Index Sensing
Simulation of Optical Microfiber Loop Resonators for Ambient Refractive Index Sensing

... determined by several key structural parameters of the MLR: the radius of the microfiber a, the radius of the loop R and the length of the coupling region ∆l, so we perform our simulations to optimize these parameters for high-performance sensing. The operation wavelength is set in ~1.55µm, and we c ...
Light Measurement Handbook
Light Measurement Handbook

... cooled. Another strategy employed by thermal detectors is to modulate incident light with a chopper. This allows the detector to measure differentially between the dark (zero) and light states. Quantum type detectors are often used in the near infrared, especially below 1100 nm. Specialized detector ...
- Welcome to UC Santa Barbara
- Welcome to UC Santa Barbara

femtosecond laser - UCSB - Optical Characterization Lab
femtosecond laser - UCSB - Optical Characterization Lab

Optogenetic Neuromodulation
Optogenetic Neuromodulation

... for clinical implementation, and would significantly affect the component parameters. As this technique moves towards using exhibition and inhibition of specific neural circuits to address certain brain disorders, an understanding of the extent to which neural circuits are being addressed will be an ...
Reflection of X-rays with change of frequency
Reflection of X-rays with change of frequency

... glancing angles less than that at which any Bragg reflection of monochromatic X-rays by the crystal could appear. As in the case of light, however, we are not restricted to considering stratifications which are identifiable with sound-waves, and may extend the application ofequations(I), (2) and (3) ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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