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AR26272276
AR26272276

Design of illumination and projection optics for projectors with single
Design of illumination and projection optics for projectors with single

... system to steer the light onto and away from the DMD. As shown in Fig. 3, the prism system comprises three transparent prisms, between which there are two air gaps. Total internal reflection 共TIR兲 at the interface between the prism and the air gap is utilized to separate the light bundles by angle. ...
Optical Detection of Early Damage in Retinal Ganglion Cells in a
Optical Detection of Early Damage in Retinal Ganglion Cells in a

... intensity was compensated by taking a reflectance image from a clear glass surface with the same condition. The normalized spectra were fitted with a power law function based on a spectral model of kD4, as illustrated in Figure 1C. The modeling is described in detail in the next section. ...
22-Test Talk
22-Test Talk

... actual beamwidth. A laser producing a purely fundamental mode beam, for example, has an M2 of 1.0; a laser with an M2 of 1.2 will produce a spot width 9.5% larger than theoretical. It is not surprising, then, that the parameter is widely used to characterize beam quality. What is surprising is that ...
Light consists of electromagnetic waves that have oscillating electric
Light consists of electromagnetic waves that have oscillating electric

... We will denote the propagation direction of a plane wave by the wave vector k. In real optical systems, such (infinitely spread) plane waves do not exist because of the finite size of the optical elements. Non-planar optical components cause further deviations of the wave from planarity so the wave ...
Lecture 5
Lecture 5

... The MTF uses the power density (W/cm2 or (J/sec)/cm2). The resist responds to the total amount of energy absorbed. Thus, we need to define the Dose, with units of energy density (mJ/cm2), as the Intensity (or power density) times the exposure time. • We can also define D100= the minimum dose for whi ...
Get PDF - OSA Publishing
Get PDF - OSA Publishing

... Kista, Sweden ...
Guiding and Confining Light in Void Nanostructure
Guiding and Confining Light in Void Nanostructure

... presents optical properties similar to those of the TM eigenmode in the studied slab-based slot-waveguide structure. We numerically simulated the quasi-TE eigenmode of the slot-waveguide structure shown in Fig. 1(b) using a full-vectorial finite difference mode solver [12]. Non-uniform grid mesh is ...
Polarization of Light
Polarization of Light

... encounters electrons that are essentially bound to the narrow width of individual polymer molecules. For this polarization component, the wave passes through the material much like it does through typical dielectrics such as glass (i.e. the refractive index is real). Today, there is a wide variety o ...
Ultra high capacity networks
Ultra high capacity networks

... ADM- Add / Drop Multiplexer- Facility in SONET networks to add or drop the sub channels. DWDM – Dense Wavelength Division Multiplexing- High capacity , data rate 10 Gbps , close spacing of wavelengths Hop- No of intermediate nodes Shuffle net- Topology used in multihop broadcast & select network 2. ...
Get PDF - OSA Publishing
Get PDF - OSA Publishing

... phase defects, as well as to locate their positions with an accuracy no better than half the width of the interference fringe. However, the application of this method is rather limited if there are two (or more) dislocations in close proximity, because two vortices can be successfully resolved only ...
10 fs ultrafast all-optical switching in polystyrene nonlinear photonic
10 fs ultrafast all-optical switching in polystyrene nonlinear photonic

... sample is displayed in Fig. 1共a兲. The sample has a facecentered cubic structure and its 共111兲 plane is parallel to the surface of the substrate, namely, the ⌫ − L crystalline direction is perpendicular to the surface. Although the opal photonic crystal does not have a complete band gap due to low in ...
Path-reversed substrate-guided- wave optical interconnects for
Path-reversed substrate-guided- wave optical interconnects for

... We use a 514-nm argon-ion laser to record the output holographic grating. The reconstruction wavelength is designed to be 800 nm. A Ti:sapphire tunable laser is employed to characterize the performance of the device. The DuPont photopolymer film HRF 6003001-20 with a thickness of 20 mm is chosen for ...
Role of Color Interference on the Insect`s Cuticle Coloration
Role of Color Interference on the Insect`s Cuticle Coloration

... attribute that depends on illumination, the spectral reflectance of an object and its surroundings, as well as the spectral receptor types and further neural processing in the animal in question. Thus the same object might appear differently colored to different viewing organisms. Insects are master ...
Laser tweezers and their applications
Laser tweezers and their applications

... radiation) has been extended to pulling and twisting of invisible objects in just the past twenty-five years. Could this technology provide a "boom" for nanotechnology and micromanipulation in a similar style to the technological explosion caused by the arrival of the microprocessor? Perhaps one of ...
Numerical modelling of LCD electro
Numerical modelling of LCD electro

... The simulation of liquid crystal display devices (LCDs) via numerical modelling has become an indispensable part of the research and development of new electro-optical effects in LCs (i.e. development of novel display types) and of the optimisation of existing display effects, because it allows exac ...
AOTF-based system for image cytometry
AOTF-based system for image cytometry

Rotating light with light: Generation of helical modes of light by spin
Rotating light with light: Generation of helical modes of light by spin

EEE440 Modern Communication Systems Optical Fibre
EEE440 Modern Communication Systems Optical Fibre

... If the light ray strikes the core-to-cladding interface at an angle greater than the critical angle then it is reflected back into the core. Since the angle of incidence is always equal to the angle of reflection the reflected light will again be reflected The light ray will then continue this bounc ...
Content
Content

introduction - Academic Science,International Journal of Computer
introduction - Academic Science,International Journal of Computer

... periodic arrangement of dielectric/semiconducting materials [1-2] with alternating regions of higher and lower potential magnitudes where localization of electromagnetic wave can be obtained by tuning the structural parameters of the device. Alternatively, it can be treated as a photonic crystal wit ...
Analyzing optical spectra by computer simulation
Analyzing optical spectra by computer simulation

... of experimental setups. A quick, simple and very useful test for reflectance accessories is to compare the measured reflectance of a silicon wafer (for a given angle of incidence and polarization) with simulated data. The simulation can be based on literature data for the optical constants of silico ...
Overview
Overview

... What is the flux from a Lambertain source of radiance L, onto a receive at distance r? We will first use point source approximations…..that is, we are at least 10 x the radius of the source (i.e., 1% error). ...


Transmisi Optik Pertemuan 10
Transmisi Optik Pertemuan 10

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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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