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Conductive atomic force microscope for investigation of thin-film gate insulators G. WIELGOSZEWSKI
Conductive atomic force microscope for investigation of thin-film gate insulators G. WIELGOSZEWSKI

... on transistors made in 45-nm technology, which means that the length of the channel is less than 25 nm. Since 1997 the length has been reduced four times. The thickness of the gate insulation had to be correspondingly decreased which led to serious increase of the probability of breaking the insulat ...
Soft x-ray laser holography with wavelength resolution *
Soft x-ray laser holography with wavelength resolution *

... line-cuts through the image. An example of such a linecut as indicated in Fig. 3(a) is shown in Fig. 3(b). Figure 3(a) is a zoom-out of the region indicated in Fig. 2(b) with a white dotted square. This cut, realized in a region where we clearly reached a “plateau” in the maximum and minimum intensi ...
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... Universal ATR (UATR) UATR is a versatile ATR accessory ideal for the analysis of solids, liquids, pastes and gels. The UATR employs a DiCompTM crystal, which is composed of a diamond ATR with a zinc selenide focusing element which is in direct contact with the diamond. The focusing element provides ...
Laser beam profiling
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... can be shown as a plot of the relative intensity of points across a plane that intersects projected path of the beam. The most basic measurement of the beam’s irradiance is a single number defining its width or diameter. Since optical beams do not actually have sharp physical edges, the beam width i ...
Materialanalytik Praktikum UV-VIS Absorption B507
Materialanalytik Praktikum UV-VIS Absorption B507

... deeper understanding of the correlation between material properties (e.g. size, shape) surrounding environment and the observed color of a metal suspension. An understanding of the optical properties of noble metal nanoparticles can enable us to realize some new functional system, in particular in n ...
QIM 2013 Verifying Entanglement poster final
QIM 2013 Verifying Entanglement poster final

... Bi-photons are generated in the 1st crystal (12mm long PPKTP), pumped by a single-frequency diode laser at 880 nm with up to 1 W power. Reflection of the bi-photons from mirrors M2 and M3 is accompanied by a spectral phase shift. Both biphotons and pump enter the 2nd identical crystal. The resulting ...
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Three-Dimensional Transmission Electron Microscopy: A Novel
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Physical Optics - Haverford College
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Principles of Spectroscopy
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... scale (typically a few hundredths of a wavenumber). This advantage of FT spectrometers is known as CONNES’ advantage. 2) The JAQUINOT advantage arises from the fact that the circular apertures used in FTIR spectrometers has a larger area than the slits used in grating spectrometers, thus enabling hi ...
www.durnin.info
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... that the intensity pattern in a transverse plane is unaltered by propagating in free space. These beams can have extremely narrow intensity profiles with effective widths as small as several wavelengths and yet possess an infinite depth of field. We further show (by using numerical simulations based ...
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... It is often found that concepts of photon optics can be adapted to matter-wave optics. In our article we choose the conjugate approach. We use the simplicity of the interaction between light and matter waves to design complex periodic potentials for the matter waves and reveal optical concepts. As a ...
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... polarizers perform best for short-wavelength infrared light, and are widely used in optical fiber communications. Beam-splitting polarizers come in many varieties and two basic types: 1. Use simple materials and employ the Brewster angle. Advanced Materials B, part 1 - script - Page 2 ...
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... (ceramic piece) on the OMX stage. Either slides, or a variety of sample holders will fit into the heating plate. The lower piece is the objective warming ring. Since the sample and objective are thermally isolated from the rest of the optics block and mechanics, only the sample and objective are bro ...
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... the range of samples that can be studied and introduce uncertainties due to incomplete knowledge of the surface condition. If thick capping layers are present, it may be impossible to obtain a usable signal from the later of interest. Conversely, if the sample is not capped but a thick oxidation lay ...
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IOSR Journal of Applied Physics (IOSR-JAP) e-ISSN: 2278-4861.

... The functional groups presented in the title compound have been identified by Bruker IFS 66V model FTIR spectrometer using KBr pellet technique in the region 450-4000 cm-1. The infrared absorption spectrum of CMTD crystal is shown in fig 2. In the high energy region, there is a broad band between 35 ...
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... measured directly by recording the intensity at successive, narrow, wavelength ranges. In FT-IR spectrometers all wavelengths from the IR source impinge simultaneously on the detector. This leads to the multiplex, or FELLGETT’S, advantage. The combination of the Jaquinot and Fellgett advantages mean ...
Document
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... - The grating polychromator disperses the light into the component wavelengths - All wavelengths are measured simultaneously - Resolution depends upon the distance between the diodes and amount of dispersion ...
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Diffraction topography

Diffraction topography (short: ""topography"") is an quantum beam imaging technique based on Bragg diffraction.Diffraction topographic images (""topographies"") record the intensity profile of a beam of X-rays (or, sometimes, neutrons) diffracted by a crystal.A topography thus represents a two-dimensional spatial intensity mapping of reflected X-rays, i.e. the spatial fine structure of a Laue reflection.This intensity mapping reflects the distribution of scattering power inside the crystal; topographs therefore reveal the irregularities in a non-ideal crystal lattice.X-ray diffraction topography is one variant of X-ray imaging, making use of diffraction contrast rather than absorption contrast which is usually used in radiography and computed tomography (CT). Topography is exploited to a lesser extends with neutrons and other quantum beams. In the electron microscope community, such technique is called dark field imaging or diffraction contrast imaging.Topography is used for monitoring crystal quality and visualizing defects in many different crystalline materials.It has proved helpful e.g. when developing new crystal growth methods, for monitoring growth and the crystal quality achieved, and for iteratively optimizing growth conditions.In many cases, topography can be applied without preparing or otherwise damaging the sample; it is therefore one variant of non-destructive testing.
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