mnl_epxa10devbd.pdf
... Supports intellectual property-based (IP-based) designs using a microprocessor Industry-standard interconnections ...
... Supports intellectual property-based (IP-based) designs using a microprocessor Industry-standard interconnections ...
INA260 Precision Current and Power Monitor with Low
... The INA260 is a digital-output, current, power, and voltage monitor with an I2C and SMBus™-compatible interface with an integrated precision shunt resistor. It enables high-accuracy current and power measurements and over-current detection at common-mode voltages that can vary from 0 V to 36 V, inde ...
... The INA260 is a digital-output, current, power, and voltage monitor with an I2C and SMBus™-compatible interface with an integrated precision shunt resistor. It enables high-accuracy current and power measurements and over-current detection at common-mode voltages that can vary from 0 V to 36 V, inde ...
Atlas ESR
... of resistance that is effectively in series with an ideal capacitor. No capacitor is ideal of course, the detailed equivalent circuit of a typical capacitor is very complex. For many electrolytic capacitors however, the most important parameters regarding the capacitor’s performance is the capacitan ...
... of resistance that is effectively in series with an ideal capacitor. No capacitor is ideal of course, the detailed equivalent circuit of a typical capacitor is very complex. For many electrolytic capacitors however, the most important parameters regarding the capacitor’s performance is the capacitan ...
RIGOL User’s Guide DM3068 Feb. 2014
... In order to prevent electric shock, DM3068 provides overvoltage protection for line-voltage mains connections meeting both of the following conditions: 1． The HI and LO input terminals are connected to the mains under Measurement Category II conditions, defined below. 2． The mains are limited to a m ...
... In order to prevent electric shock, DM3068 provides overvoltage protection for line-voltage mains connections meeting both of the following conditions: 1． The HI and LO input terminals are connected to the mains under Measurement Category II conditions, defined below. 2． The mains are limited to a m ...
NX3DV42 1. General description Dual high-speed USB 2.0 double-pole double-throw analog
... channel to channel crosstalk rejection results in minimal noise interference. The bandwidth is wide enough to pass high-speed USB 2.0 differential signals (480 Mb/s). It consist of two switches, each with two independent input/outputs (HSDn+ and HSDn) and a common input/output (D+ or D). One digit ...
... channel to channel crosstalk rejection results in minimal noise interference. The bandwidth is wide enough to pass high-speed USB 2.0 differential signals (480 Mb/s). It consist of two switches, each with two independent input/outputs (HSDn+ and HSDn) and a common input/output (D+ or D). One digit ...
TAS5404-Q1 - Texas Instruments
... ISO9000:2002 TS16949-Certified –40°C to 105°C Ambient Temperature Range ...
... ISO9000:2002 TS16949-Certified –40°C to 105°C Ambient Temperature Range ...
TMP451-Q1 ±1°C Remote and Local
... from conversions within the default measurement range are represented in binary form, as shown in the Standard Binary column of Table 1. Any temperature below 0°C results in a data value of 0 (00h). Likewise, temperatures above 127°C result in a value of 127 (7Fh). The device can be set to measure o ...
... from conversions within the default measurement range are represented in binary form, as shown in the Standard Binary column of Table 1. Any temperature below 0°C results in a data value of 0 (00h). Likewise, temperatures above 127°C result in a value of 127 (7Fh). The device can be set to measure o ...
IO-Link PHY BoosterPack™ (Rev. B)
... The MSP-EXP430FR4133 LaunchPad development kit is an easy-to-use evaluation module (EVM) for the MSP430FR4133 microcontroller. The development kit contains everything needed to start developing on the MSP430 ultra-low power (ULP) FRAM-based microcontroller platform, including on-board emulation for ...
... The MSP-EXP430FR4133 LaunchPad development kit is an easy-to-use evaluation module (EVM) for the MSP430FR4133 microcontroller. The development kit contains everything needed to start developing on the MSP430 ultra-low power (ULP) FRAM-based microcontroller platform, including on-board emulation for ...
LM317 adj reg LDO.PDF
... An optional output capacitor can be added to improve transient response. The adjustment terminal can be bypassed to achieve very high ripple rejection ratios which are difficult to achieve with standard 3-terminal regulators. Besides replacing fixed regulators, the LM117 is useful in a wide variety ...
... An optional output capacitor can be added to improve transient response. The adjustment terminal can be bypassed to achieve very high ripple rejection ratios which are difficult to achieve with standard 3-terminal regulators. Besides replacing fixed regulators, the LM117 is useful in a wide variety ...
bq2970 Li-Ion/Li Polymer Battery Protection IC (Rev. D)
... The bq2970 battery cell protection device provides an accurate monitor and trigger threshold for overcurrent protection during high discharge/charge current operation or battery overcharge conditions. The bq2970 device provides the protection functions for Li-Ion/Li-Polymer cells, and monitors acros ...
... The bq2970 battery cell protection device provides an accurate monitor and trigger threshold for overcurrent protection during high discharge/charge current operation or battery overcharge conditions. The bq2970 device provides the protection functions for Li-Ion/Li-Polymer cells, and monitors acros ...
ICS850S1601I Advance Data Sheet.fm
... the infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal commercial and industrial applications. Any other applications, such as those requiring high reliability ...
... the infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal commercial and industrial applications. Any other applications, such as those requiring high reliability ...
Contact Resistance
... Mechanical Endurance (Mechanical Life): Number of switching operations without contact load during which the relay remains within the specified characteristics. Electrical Endurance (Electrical Life): Number of switching operations until failure of a relay under defined conditions of load and of amb ...
... Mechanical Endurance (Mechanical Life): Number of switching operations without contact load during which the relay remains within the specified characteristics. Electrical Endurance (Electrical Life): Number of switching operations until failure of a relay under defined conditions of load and of amb ...
Quick Start Evaluation Board
... Demo board allows the user to be testing the SGX SMD metal oxide gas sensors within minutes after opening the While the MiCs SMD parts are difficult to test and require a 5 V power supply for correct operation, the box. The MiCs quick start board can use any input power supply from 7V to 15 V. One o ...
... Demo board allows the user to be testing the SGX SMD metal oxide gas sensors within minutes after opening the While the MiCs SMD parts are difficult to test and require a 5 V power supply for correct operation, the box. The MiCs quick start board can use any input power supply from 7V to 15 V. One o ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.