IS 13947-5-2 (2004): Low-Voltage Switchgear and Controlgear, Part
... These proximity switches are self-contained, have semiconductor switching elements(s) and are intended to be connected to circuits, the rated voltage of which does not exceed 250 V 50 Hz/60 Hz a.c. or 300 V d.c. This Standard is not intended to cover proximity switches with analogue outputs. The obj ...
... These proximity switches are self-contained, have semiconductor switching elements(s) and are intended to be connected to circuits, the rated voltage of which does not exceed 250 V 50 Hz/60 Hz a.c. or 300 V d.c. This Standard is not intended to cover proximity switches with analogue outputs. The obj ...
Reasons for selecting the intrinsically safe concept
... to all the problems of hazardous areas (for equipment requiring limited power) and is the only technique, which meets this criterion. The significant factors are as follows: a) The IS technique is accepted throughout the world. There is an increasing acceptance of international certificates issued u ...
... to all the problems of hazardous areas (for equipment requiring limited power) and is the only technique, which meets this criterion. The significant factors are as follows: a) The IS technique is accepted throughout the world. There is an increasing acceptance of international certificates issued u ...
MIL-STD-202
... method is 106A, the second revision, 106B, etc. 1.3 Method of reference. When applicable, test methods contained herein shall be referenced in the individual specification by specifying this standard, the method number, and the details required in the summary paragraph of the referenced method. To a ...
... method is 106A, the second revision, 106B, etc. 1.3 Method of reference. When applicable, test methods contained herein shall be referenced in the individual specification by specifying this standard, the method number, and the details required in the summary paragraph of the referenced method. To a ...
TR41.9.2-04-11-003-R1-TSB31C
... Bulletin from time to time as may be occasioned by changes in technology, industry practice, government regulations, technical criteria, or other appropriate reasons. This document outlines test methods for the technical criteria contained in the following documents: CFR, Title 47, Part 68 TIA-968-A ...
... Bulletin from time to time as may be occasioned by changes in technology, industry practice, government regulations, technical criteria, or other appropriate reasons. This document outlines test methods for the technical criteria contained in the following documents: CFR, Title 47, Part 68 TIA-968-A ...
ESD Myths and the Latency Controversy
... cause of ESD problems can be very simple. Many printed wiring assemblies (circuit packs) include a cover or faceplate that provides a protective covering when the pack is installed in a shelf (see Figure 1). In many designs, these faceplates are metallic and grounded to provide good electromagnetic ...
... cause of ESD problems can be very simple. Many printed wiring assemblies (circuit packs) include a cover or faceplate that provides a protective covering when the pack is installed in a shelf (see Figure 1). In many designs, these faceplates are metallic and grounded to provide good electromagnetic ...
Design Considerations For Logic Products
... Texas Instruments (TI) reserves the right to make changes to its products or to discontinue any semiconductor product or service without notice, and advises its customers to obtain the latest version of relevant information to verify, before placing orders, that the information being relied on is cu ...
... Texas Instruments (TI) reserves the right to make changes to its products or to discontinue any semiconductor product or service without notice, and advises its customers to obtain the latest version of relevant information to verify, before placing orders, that the information being relied on is cu ...
BDTIC
... Surge transients can damage, destroy and cause malfunction of any personal, commercial electronic as well as any industrial facilitiy. A basic origin of a surge is power switching between the electrical units inside facilities or buildings such as household appliances or their switch mode power supp ...
... Surge transients can damage, destroy and cause malfunction of any personal, commercial electronic as well as any industrial facilitiy. A basic origin of a surge is power switching between the electrical units inside facilities or buildings such as household appliances or their switch mode power supp ...
DLP5500 DLP 0.55 XGA Series 450 DMD (Rev. F)
... resolution DLP5500 (0.55" XGA) digital micromirror device (DMD) is a spatial light modulator (SLM) that modulates the amplitude, direction, and/or phase of incoming light. This advanced light control technology has numerous applications in the industrial, medical, and consumer markets. The DLP5500 e ...
... resolution DLP5500 (0.55" XGA) digital micromirror device (DMD) is a spatial light modulator (SLM) that modulates the amplitude, direction, and/or phase of incoming light. This advanced light control technology has numerous applications in the industrial, medical, and consumer markets. The DLP5500 e ...
unclassified
... reason for all this concern. The fundamental electrical quantities of a circuit are voltage and current and are dependent on the circuit characteristics of resistance, capacitance, and inductance. In addition to these three individual characteristics, don’t forget that many electronic components exh ...
... reason for all this concern. The fundamental electrical quantities of a circuit are voltage and current and are dependent on the circuit characteristics of resistance, capacitance, and inductance. In addition to these three individual characteristics, don’t forget that many electronic components exh ...
Model 196 System DMM
... Do not exceed the maximum signal levels of the instruments and accessories, as defined in the specifications and operating inform&ion, and a~ shown on the instrument or test fixture rear panel, or switchiig card. Do not connect switching cards directly to unlimited power circuits. They are intended ...
... Do not exceed the maximum signal levels of the instruments and accessories, as defined in the specifications and operating inform&ion, and a~ shown on the instrument or test fixture rear panel, or switchiig card. Do not connect switching cards directly to unlimited power circuits. They are intended ...
1.2V to 3.6V, 12-Bit, Nanopower. 4
... This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete devi ...
... This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete devi ...
High Strain Rate Compression Testing of Ceramics and
... yield strength of 2 GPa; however, this paper also applies to systems with different bar dimensions (or even different bar materials) that have been optimized for testing high-strength, low-failure-strain brittle specimens. Load and displacement are conventionally measured using strain gages mounted ...
... yield strength of 2 GPa; however, this paper also applies to systems with different bar dimensions (or even different bar materials) that have been optimized for testing high-strength, low-failure-strain brittle specimens. Load and displacement are conventionally measured using strain gages mounted ...
generator (alternator) overhaul
... MOTORS CS SERIES • If the charge indicator light is on in the dash, unplug the connector (which can have up to four wires connected). • Check all fuses, all fusible links, and the charge light indicator bulb. ...
... MOTORS CS SERIES • If the charge indicator light is on in the dash, unplug the connector (which can have up to four wires connected). • Check all fuses, all fusible links, and the charge light indicator bulb. ...
2. Checklists
... This checklist helps designers of USB peripherals to assess their products’ compliance with the Universal Serial Bus Specification, Revision 2.0 and the On-The-Go Supplement, Revision 1.0. Unless explicitly stated otherwise, all references to the USB Specification refer to Revision 2.0. This checkli ...
... This checklist helps designers of USB peripherals to assess their products’ compliance with the Universal Serial Bus Specification, Revision 2.0 and the On-The-Go Supplement, Revision 1.0. Unless explicitly stated otherwise, all references to the USB Specification refer to Revision 2.0. This checkli ...
DS90UB933-Q1 FPD-Link III Serializer for 1-MP/60
... GPO[3] can be configured to be the output for input signals coming from the GPIO[3] pin on the deserializer or can be configured to be the output of the local register setting on the Input/Output, serializer. It can also be configured to be the input clock pin when the DS90UB933-Q1 LVCMOS serializer ...
... GPO[3] can be configured to be the output for input signals coming from the GPIO[3] pin on the deserializer or can be configured to be the output of the local register setting on the Input/Output, serializer. It can also be configured to be the input clock pin when the DS90UB933-Q1 LVCMOS serializer ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.