RIT Technical Conference Publication - Edge
... cooling of the air in heat exchangers after compression. Although this model of compressor is being removed from use on aircraft carriers, it still provides a valuable test bed that directly relates to products in the air compressor industry. The unit could allow for implementation of various resear ...
... cooling of the air in heat exchangers after compression. Although this model of compressor is being removed from use on aircraft carriers, it still provides a valuable test bed that directly relates to products in the air compressor industry. The unit could allow for implementation of various resear ...
AN11176 Automotive qualified ESD protection for LVDS
... In the rail-to-rail concept, a negative ESD strike on the I/O pin causes one of the rail-to-rail diodes (the lower diode at the flash-sign in Figure 5, left side) to become forward biased and transfer the ESD strike through the lower diode to ground. A positive discharge strike causes the other rail ...
... In the rail-to-rail concept, a negative ESD strike on the I/O pin causes one of the rail-to-rail diodes (the lower diode at the flash-sign in Figure 5, left side) to become forward biased and transfer the ESD strike through the lower diode to ground. A positive discharge strike causes the other rail ...
Virtex-5 LX FPGA Prototype Platform www.BDTIC.com/XILINX User Guide
... DUT can be configured from any one of the following: ...
... DUT can be configured from any one of the following: ...
Double M/S – a Surround recording technique put to test
... It is possible to generate signals for two- or multi-channel stereophony from the three Double-M/S microphone signals obtained using the setup. This is conventionally done using an M/S-Matrix to generate the L/R signals from Mfront/S, and a second matrix to generate the LS/RS signals from Mrear/S. F ...
... It is possible to generate signals for two- or multi-channel stereophony from the three Double-M/S microphone signals obtained using the setup. This is conventionally done using an M/S-Matrix to generate the L/R signals from Mfront/S, and a second matrix to generate the LS/RS signals from Mrear/S. F ...
tb70.pdf
... Intrinsic Jitter Test Intrinsic jitter is the jitter created by the device itself. To test intrinsic jitter, Altera Applications configured APEX 20KE and Virtex-E devices with PLLs or DLLs in 2× mode. A 50-MHz low-jitter clock was applied to the clock input of the devices, and the output jitter was ...
... Intrinsic Jitter Test Intrinsic jitter is the jitter created by the device itself. To test intrinsic jitter, Altera Applications configured APEX 20KE and Virtex-E devices with PLLs or DLLs in 2× mode. A 50-MHz low-jitter clock was applied to the clock input of the devices, and the output jitter was ...
MAX14578E/MAX14578AE USB Battery Charger Detectors EVALUATION KIT AVAILABLE General Description
... In addition, the internal USB switch is compliant to Hi-Speed USB, full-speed USB, and low-speed USB signals. The devices feature low on-resistance, low on-resistance flatness, and very low capacitance. The devices also feature high-ESD protection up to Q15kV Human Body Model on the CD+ and CD- pins ...
... In addition, the internal USB switch is compliant to Hi-Speed USB, full-speed USB, and low-speed USB signals. The devices feature low on-resistance, low on-resistance flatness, and very low capacitance. The devices also feature high-ESD protection up to Q15kV Human Body Model on the CD+ and CD- pins ...
Circuit Breaker testing guide
... breaker has to function as specified and interrupt the current as soon as possible or severe damage may occur. The cost of damage caused by a malfunctioning circuit breaker can sometimes reach large sums. Proper functioning of a breaker is reliant on a number of individual components that have to be ...
... breaker has to function as specified and interrupt the current as soon as possible or severe damage may occur. The cost of damage caused by a malfunctioning circuit breaker can sometimes reach large sums. Proper functioning of a breaker is reliant on a number of individual components that have to be ...
JEDEC STANDARD
... JEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Directors level and subsequently reviewed and approved by the EIA General Counsel. JEDEC standards and publications are designed to serve the public interest through eliminatin ...
... JEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Directors level and subsequently reviewed and approved by the EIA General Counsel. JEDEC standards and publications are designed to serve the public interest through eliminatin ...
ANSI/SCTE 161 2016 Drop Amplifiers
... The purpose of this specification is to recommend mechanical and electrical standards for broadband radio frequency (RF) devices whose primary purpose is to amplify signals presented to an input port and deliver the amplified signals to one or more output ports. The devices are also required to pass ...
... The purpose of this specification is to recommend mechanical and electrical standards for broadband radio frequency (RF) devices whose primary purpose is to amplify signals presented to an input port and deliver the amplified signals to one or more output ports. The devices are also required to pass ...
LP5907 - Texas Instruments
... Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absol ...
... Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absol ...
Spirometer Demo with Freescale Microcontrollers
... Freescale provides a solution for medical applications developers to have a way to communicate the microcontrollers with a Host PC through a USB interface. That solution is the Freescale’s USB stack with personal healthcare device class (PHDC), which makes possible to connect medical devices with th ...
... Freescale provides a solution for medical applications developers to have a way to communicate the microcontrollers with a Host PC through a USB interface. That solution is the Freescale’s USB stack with personal healthcare device class (PHDC), which makes possible to connect medical devices with th ...
ASC/N2 Bus Network/Troubleshoot Guide
... applied across the N2+ and N2– lines. This bias voltage is referenced to the REF line. The bias resistors and the 220 ohm termination resistors combine to form a voltage divider. By taking the tolerances on the resistors and the power supply variations into account, you should expect to see the foll ...
... applied across the N2+ and N2– lines. This bias voltage is referenced to the REF line. The bias resistors and the 220 ohm termination resistors combine to form a voltage divider. By taking the tolerances on the resistors and the power supply variations into account, you should expect to see the foll ...
MCW 0406 AT - Precision Precision Wide Terminal Thin
... Vishay Intertechnology, Inc., its affiliates, agents, and employees, and all persons acting on its or their behalf (collectively, “Vishay”), disclaim any and all liability for any errors, inaccuracies or incompleteness contained in any datasheet or in any other disclosure relating to any product. Vi ...
... Vishay Intertechnology, Inc., its affiliates, agents, and employees, and all persons acting on its or their behalf (collectively, “Vishay”), disclaim any and all liability for any errors, inaccuracies or incompleteness contained in any datasheet or in any other disclosure relating to any product. Vi ...
Field Test Technology Relationships to Cable Quality
... obtained from increasingly expensive and difficult tests. VOM: Since the volt-ohmmeter is common, inexpensive, safe, and easy to use, it is very popular. Although useful for some applications, the volt-ohmmeter is virtually useless for evaluating cable insulation. The instrument usually relies on a ...
... obtained from increasingly expensive and difficult tests. VOM: Since the volt-ohmmeter is common, inexpensive, safe, and easy to use, it is very popular. Although useful for some applications, the volt-ohmmeter is virtually useless for evaluating cable insulation. The instrument usually relies on a ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.