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Eight LVPECL Output, High-Performance Clock
Eight LVPECL Output, High-Performance Clock

... only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All supply voltages must be supplied simultane ...
0E7225 REV.qxd - Generator
0E7225 REV.qxd - Generator

doc-file
doc-file

... current silicon detector of the DØ experiment will start performing marginally by an integrated luminosity of 4 fb-1 due to radiation damage and low signal to noise ratio. It is for these reasons that the collaboration has designed a new silicon tracker [1]. The silicon tracking system will be a six ...
SN74LVC1G175-EP 数据资料 dataSheet 下载
SN74LVC1G175-EP 数据资料 dataSheet 下载

LP5951 - Texas Instruments
LP5951 - Texas Instruments

... The LP5951 will remain stable and in regulation with no external load. This is an important consideration in some circuits, for example CMOS RAM keep-alive applications. 7.3.2 Enable Operation The LP5951 may be switched ON or OFF by a logic input at the Enable pin, EN. A logic high at this pin will ...
LP5951 - Texas Instruments
LP5951 - Texas Instruments

... The LP5951 will remain stable and in regulation with no external load. This is an important consideration in some circuits, for example CMOS RAM keep-alive applications. 7.3.2 Enable Operation The LP5951 may be switched ON or OFF by a logic input at the Enable pin, EN. A logic high at this pin will ...
SN74LVC162244A 16-Bit Buffer/Driver with 3
SN74LVC162244A 16-Bit Buffer/Driver with 3

... This 16-bit buffer/driver is designed for 1.65-V to 3.6-V VCC operation. The SN74LVC162244A is designed specifically to improve the performance and density of 3-state memory address drivers, clock drivers, and busoriented receivers and transmitters. The device can be used as four 4-bit buffers, two ...
Example Temperature Measurement
Example Temperature Measurement

... Introduction Whenever measurement of various industrial sensors are required, accuracy of measurement can be significantly improved by characterizing the sensor performance over the range of temperatures in which it is expected to operate. This principle requires an accurate sensor temperature measu ...
Steps to selecting the right accelerometer
Steps to selecting the right accelerometer

... discernable signal. This parameter is based on the noise floor of the accelerometer (and in the case of an IEPE type, the internal electronics) expressed in terms of g rms. ...
MCP809/MCP810 3-Pin Microprocessor Reset
MCP809/MCP810 3-Pin Microprocessor Reset

powerpoint - Auburn University
powerpoint - Auburn University

PCA9543A 数据资料 dataSheet 下载
PCA9543A 数据资料 dataSheet 下载

... An active-low reset (RESET) input allows the PCA9543A to recover from a situation where one of the downstream I2C buses is stuck in a low state. Pulling RESET low resets the I2C state machine and causes all the channels to be deselected, as does the internal power-on reset function. The pass gates o ...
TRS3243 数据资料 dataSheet 下载
TRS3243 数据资料 dataSheet 下载

"Lessons In Industrial Instrumentation, version 1.20"
"Lessons In Industrial Instrumentation, version 1.20"

Chapter 2 - Part 1 - PPT - Mano & Kime
Chapter 2 - Part 1 - PPT - Mano & Kime

Z series (Z Foil) - Datasheet
Z series (Z Foil) - Datasheet

... The Bulk Metal® Foil resistor is based on a special thermo-metalic stress concept wherein a proprietary bulk metal cold rolled foil is cemented to a ceramic substrate. It is then photoetched into a resistive pattern. Then it is laser adjusted to any desired value and tolerance. Because the metals us ...
ADS9110 18-Bit, 2-MSPS, 15-mW, SAR ADC
ADS9110 18-Bit, 2-MSPS, 15-mW, SAR ADC

... external reference, offering a wide selection of input ranges without additional input scaling. The device consumes only 15 mW of power when operating at the full 2-MSPS throughput. Power consumption at lower throughputs can be reduced by using the flexible low-power modes (NAP and PD). The integrat ...
1 - DCC
1 - DCC

... 4 Output Noise Analysis The following section verifies that the output noise of the driver amplifiers is within specification. Only the quadrant drive portions of the signal chains are measured, and of the many possible switch configurations, only the configuration used for low noise control of the ...
Cnctvty2
Cnctvty2

Single Inverter Gate--SN74AUC1GU04 (Rev. L)
Single Inverter Gate--SN74AUC1GU04 (Rev. L)

NB4N121KMNGEVB Evaluation Board User's Manual Board Name: NB4N121KMNGEVB
NB4N121KMNGEVB Evaluation Board User's Manual Board Name: NB4N121KMNGEVB

... guarantees low output–to–output skews. Optimal design, layout, and processing minimize skew within a device and from device to device. System designers can take advantage of the NB4N121K’s performance to distribute low skew clocks across the backplane or the motherboard. The device is packaged in a ...
TI HealthTech Fitness Guide (Rev. A)
TI HealthTech Fitness Guide (Rev. A)

Inductors, Electromagnetic compatibility (EMC), General
Inductors, Electromagnetic compatibility (EMC), General

... EMC filters are virtually always designed as reflecting lowpass filters, i.e. they reach their highest insertion loss when they are – on the one hand – mismatched to the impedance of the interference source or disturbed equipment and – on the other hand – mismatched to the impedance of the line. Pos ...
Film Capacitors – AC Capacitors - Motor run capacitors
Film Capacitors – AC Capacitors - Motor run capacitors

INA300-Q1 Automotive-Grade, Overcurrent
INA300-Q1 Automotive-Grade, Overcurrent

... into a single product for the overcurrent detection function. Programming this comparison threshold is configured through a single external resistor, which simplifies the current design while allowing for easy adjustments to the threshold when needed. The threshold setting resistor value is selected ...
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Automatic test equipment



Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.
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