Applying Interrupting Rating: Circuit Breakers
... side leads are connected to the test station through 4 feet of 1 AWG. The load side is shorted by 10 inch leads of rated conductor per pole. These “bus bar condition” tests still do not fully address the situation where a fault can occur less than 4 feet 10 inches from the circuit breaker. One point ...
... side leads are connected to the test station through 4 feet of 1 AWG. The load side is shorted by 10 inch leads of rated conductor per pole. These “bus bar condition” tests still do not fully address the situation where a fault can occur less than 4 feet 10 inches from the circuit breaker. One point ...
For Electrostatic Discharge Sensitivity Testing Human Body Model
... volt test. The withstand voltage of this device is 500 volts. HBM ESD tester: Equipment (also referred to as "tester" in this standard) that applies an HBM ESD to a component. Also referred to as an HBM Simulator. Human Body Model (HBM) ESD: An ESD event meeting the waveform criteria specified in th ...
... volt test. The withstand voltage of this device is 500 volts. HBM ESD tester: Equipment (also referred to as "tester" in this standard) that applies an HBM ESD to a component. Also referred to as an HBM Simulator. Human Body Model (HBM) ESD: An ESD event meeting the waveform criteria specified in th ...
MC33662, LIN 2.1 / SAEJ2602-2, LIN Physical Layer
... a Controller Area Network (CAN). As the lowest level of a hierarchical network, LIN enables cost-effective communication with sensors and actuators when all the features of CAN are not required. The three 33662 versions are designed to operate at different maximum baud rates. The 33662LEF and 33662B ...
... a Controller Area Network (CAN). As the lowest level of a hierarchical network, LIN enables cost-effective communication with sensors and actuators when all the features of CAN are not required. The three 33662 versions are designed to operate at different maximum baud rates. The 33662LEF and 33662B ...
S270-21-2 (Discontinued)
... zero (fault interrupted by the backup protective device). The pulse counter provides storage for up to three pulses. Depending upon the counts-to-open setting, the tripping circuit will turn on after one, two, or three count pulses have been registered. When turned on, the tripping circuit connects ...
... zero (fault interrupted by the backup protective device). The pulse counter provides storage for up to three pulses. Depending upon the counts-to-open setting, the tripping circuit will turn on after one, two, or three count pulses have been registered. When turned on, the tripping circuit connects ...
Electronics Mechanic
... Construct and test Astable, monostable, circuits using IC 555. Construct a dual power supply by using the fixed IC regulators with current limiting and short circuit protection features Construct the Adder cum Subtractor using IC 7483. Construct and Test a 3 to 8 Decoder/ Demux using IC 7413 ...
... Construct and test Astable, monostable, circuits using IC 555. Construct a dual power supply by using the fixed IC regulators with current limiting and short circuit protection features Construct the Adder cum Subtractor using IC 7483. Construct and Test a 3 to 8 Decoder/ Demux using IC 7413 ...
BS 7671:2008 forms
... A word to WORD creators! The forms are available from three sources, 1. In the original documents. In the case of the Wiring Regulation Online (WRO), the original documents are in Acrobat pdf format, and can be viewed and printed directly from those files. (This is in effect the normal way to use th ...
... A word to WORD creators! The forms are available from three sources, 1. In the original documents. In the case of the Wiring Regulation Online (WRO), the original documents are in Acrobat pdf format, and can be viewed and printed directly from those files. (This is in effect the normal way to use th ...
12V to 24V, 27A Brushed DC Motor Reference
... Placing RSENSE in an isolated position at the center of the board allows for the device to dissipate heat without harming other discrete devices in close proximity to it. The value of RSENSE in this design is 5 mΩ and it is rated for 6 W. The maximum current pulled through the board during testing w ...
... Placing RSENSE in an isolated position at the center of the board allows for the device to dissipate heat without harming other discrete devices in close proximity to it. The value of RSENSE in this design is 5 mΩ and it is rated for 6 W. The maximum current pulled through the board during testing w ...
L2_sensor_ec
... resistance and coupling capacitance. The remaining features on the test structure are arrays of mainly poly-silicon resistors. The characterization of the sensors is divided into three distinct parts. In the next section the measurements on the test structures will be described. The section followin ...
... resistance and coupling capacitance. The remaining features on the test structure are arrays of mainly poly-silicon resistors. The characterization of the sensors is divided into three distinct parts. In the next section the measurements on the test structures will be described. The section followin ...
P0340-CMP/CKP POSITION SENSOR CIRCUIT
... NOTE: The conditions that set the DTC are not present at this time. The following list may help in identifying the intermittent condition. With the engine running at normal operating temperature, monitor the DRB parameters related to the DTC while wiggling the wiring harness. Look for parameter valu ...
... NOTE: The conditions that set the DTC are not present at this time. The following list may help in identifying the intermittent condition. With the engine running at normal operating temperature, monitor the DRB parameters related to the DTC while wiggling the wiring harness. Look for parameter valu ...
3-Pin Supply Voltage Supervisor (Rev. D)
... the threshold voltage, VIT. An internal timer delays the return of the output to the inactive state (high) to ensure proper system reset. The delay time (td(typ) = 200 ms) starts after VDD rises above the threshold voltage, VIT. When the supply voltage drops below the VIT threshold voltage, the outp ...
... the threshold voltage, VIT. An internal timer delays the return of the output to the inactive state (high) to ensure proper system reset. The delay time (td(typ) = 200 ms) starts after VDD rises above the threshold voltage, VIT. When the supply voltage drops below the VIT threshold voltage, the outp ...
TPL0102 256-Taps Dual Channel Digital Potentiometer With Non
... degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. The algebraic convention, whereby the most negative value is a minimum and the most positive value is a maximum. All voltages are ...
... degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. The algebraic convention, whereby the most negative value is a minimum and the most positive value is a maximum. All voltages are ...
Single 3-Input Positive-NOR Gate (Rev. E)
... Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on ...
... Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.