Download 1.2 A Programmable Device Power Supply AD5560

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AD5560
Parameter
Comparator DAC Dynamic
Output Voltage Settling Time1
Slew Rate1
Digital-to-Analog Glitch Energy1
Glitch Impulse Peak Amplitude1
REFERENCE INPUT
VREF DC Input Impedance
VREF Input Current
VREF Range1
COMPARATOR
Error
VOLTAGE COMPARATOR
Propagation Delay1
Error1
CURRENT COMPARATOR
Propagation Delay1
Error1
MEASURE OUTPUT, MEASOUT
Measure Output Voltage Span1
Measure Output Voltage Span1
Measure Output Voltage Span1
Measure Output Voltage Span1
Measure Pin Output Impedance
Output Leakage Current
Output Capacitance1
Short-Circuit Current1
OPEN-SENSE DETECT/CLAMP/ALARM
Measurement Accuracy
Clamp Accuracy
Alarm Delay1
DUTGND
Voltage Range1
Pull-Up Current
Leakage Current
Trip Point Accuracy
Alarm Delay1
GUARD AMPLIFIER
Voltage Range1
Voltage Span1
Output Offset
Short-Circuit Current1
Load Capacitance1
Output Impedance
Alarm Delay1
DIE TEMPERATURE SENSOR
Accuracy1
Output Voltage at 25°C
Output Scale Factor1
Output Voltage Range1
Data Sheet
Min
Typ
3.5
1
10
40
1
−10
2
Max
Unit
Test Conditions/Comments
6
µs
V/µs
nV-s
mV
1 V change to 1 LSB.
MΩ
µA
V
Typically 100 MΩ.
Per input; typically ±30 nA.
+10
5
−7
Measured directly at comparator; does not
include measure block errors.
Uncalibrated.
With respect to the measured voltage.
+7
mV
+12
µs
mV
Uncalibrated.
−1.5
1
+1.5
µs
%
Of programmed current range, uncalibrated.
−12.81
+12.81
V
−6.405
0
+6.405
5.125
V
V
0
2.56
115
+100
V
Ω
nA
pF
mA
0.25
−12
0.25
−100
5
−10
+10
−200
600
50
−1
+50
−1
−30
+200
900
mV
mV
μs
+1
+70
V
μA
+1
μA
+10
mV
μs
AVDD − 2.25
25
+10
+20
100
V
V
mV
mA
nF
Ω
μs
50
AVSS + 2.25
−10
−20
100
200
−10
+10
1.54
4.7
1
2
Rev. D | Page 10 of 68
%
V
mV/°C
V
MEASOUT gain = 1, VREF = 5 V, offset DAC =
0x8000.
MEASOUT gain = 1, VREF = 2.5 V.
MEASOUT gain = 0.2, VREF = 5 V, offset DAC =
0x8000.
MEASOUT gain = 0.2, VREF = 2.5 V.
When HW_INH is low.
Pull-up for purpose of detecting open circuit on
DUTGND, can be disabled.
When pull-up disabled, DGS DAC = 0x3333 (1 V
with VREF = 5 V). If DUTGND voltage is far away
from one of comparator thresholds, more
leakage may be present.
If it moves 100 mV away from input level.
Relative to a temperature change.