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optimiSE from data to knowledge optimiSE Gmbh München – Bruchsal Germany Werner-von-Siemens-Straße 47a D-76646 Bruchsal Telefon +49-7251- 930 667/668 Fax +49-7251- 930 666 Email: [email protected] Internet: www.optimiSE.de SETNET, London, 13 September 2001 The Cost of Test 1 What reduTec accomplishes… optimiSE from data to knowledge reduTec or how to cut down on your test cost budget reduTec analyses test data of complex electronic products with respect to underlying redundancies reduTec regroups tests into “necessary ones” and those without information gain Benefits Controlled dismissal of redundant tests of intact devices for high yield product lines Earliest possible detection of damages to shorten test cycles of defect devices for low yield products SETNET, London, 13 September 2001 The Cost of Test 2 reduTec optimises optimiSE your test management from data to knowledge Exampel: Chip-Testing Input real-valued (acceptance intervals) or binary (pass / fail) intact / defect data from frontend / backend tests raw wafer wafer fabrication processed wafer optional: extra process data, e.g. chip location frontend Methods deterministic, product-independent mathematical wafer probe procedure without arbitrary statistical assumptions assembled chip neuro-fuzzy-system for test data mining and process monitoring sawing & assembly backend tested device final test Output identification of redundancies for high yield products optimised test sequences w.r.t. first failure out for low yield product lines time yield learning and process control SETNET, London, 13 September 2001 The Cost of Test 3 optimiSE from data to knowledge What means redundant test in the context of reduTec ? A test Tk is redundant with respect to a given series of tests {Tj} jk,j=1,...,N, if the information gain obeys I k N for some user-defined > 0. Here I k N : W N Vk where W N and Vk represent the information vectors corresponding to the test subsets {Tj}j=1,...,N and {Tj}jk,j=1,...,N respectively. In most cases, the suitable metric is the Euclidean distance. Applies to intact devices, where tests resulting in large deviations from the ideal value and/or large variations around the actual mean value of the test series carry information about the control of the production process – they are “essential” tests which are “well-passed” by all devices are superfluous and potentially redundant and defect objects, where binary tests are ordered with respect to “first stop on failure” and probes without information gain can be neglected SETNET, London, 13 September 2001 The Cost of Test 4 Test ranking by reduTec – intact objects optimiSE from data to knowledge reduTec assigns quantitative, weighted redundancy factors to each test : 300 615,2 250 weighted information gain 200 obsolete tests (for instance) 150 100 50 0 ) ) 0 I D 8 1 --V IG r:0 I G S1 S1 3A EX I A IL 4:0 :3 :0 :0 :0 EX :0 :0 A2 :0 S :0 S :0 C V) :0 FP :1 1) :0 :3 x: p E (M4 (F1 32 -V ste _V_ TP PV 2S O_ p_T _TO p_ AN G2 CB OL T_ CG _OL IS OL t ES OL t CP OL _AC SA N1 _E C1 ) TC p_ 1 p_ 2 ma la m R A t F ( _ c _ _ A C O D V ) n Y ( M ) O S S 6 6 1 u u p p T ( o o / I_ V U HD H L N a n p p _ TC In n _I _ DI 4 1 IV 5 1 sa 0 sa 2 sa 5 LY B N L XT S S D -E _m _I In In p _ n_ _I i 1 IT _ 6 H t 8 A V 4 _ V 4 _ V 4 t R ISC IA_ p R (M n d Gr Gr sat _5_ G tG g_ g_ V C 4 4 FI S_ N_ G_ VB I ST An An_ n_ n_In In p 1 A An ig 0 IN RU 3 2S sa 3 _(IS 4_ a D C m 9 D 4 4 A A V O 4 _ A _ C Vs 47 8 8 cl a 6 S Vsa al o al o _4_ 0 IG 38 39 _( 3_ N C DI 4 I B 01 2 0 A n 0.0 02 4 32 1 C 41 43 4 V 1 n n C 4 -K AP s t- 21 7.1 4 0. 4 0.1 0.1 .08 0 A 28 9 0. 30 38 7 2 63 35 TM 4 1 5 52 7 1 A 2 A IG 5 2 5 0 M 0 2 2 A 3 . hk hk- Te 2 2 6 0 2 T 50 3 C 5 55 3 3 2 27 . 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Pi in id 0 0 P Br 36 1 2 2 1_ _ _ 20 20 1 2_4 20 SETNET, London, 13 September 2001 * digital engine control unit excerpt from (400+) test sequence* The Cost of Test 5 optimiSE from data to knowledge Test ranking by reduTec – stop on first failure tests defect devices potentially redundant tests (white) test analysis protocol essential tests (black) information gain SETNET, London, 13 September 2001 optimal test sequence w.r.t. first failure out original pass / fail test sequence The Cost of Test 6 optimiSE from data to knowledge Sequencing with reduTec - basics for the binary case test # object # 19 single tests to detect deficiencies reduTec 14 single detection tests 1 globally redundant test SETNET, London, 13 September 2001 The Cost of Test 7 optimiSE Estimation of test cost savings from data to knowledge 0,31 € 0,31 € Materials Personell - 33% - 16% 0,26 € 0,20 € Overhead Capex (Handler) Capex (Tester) Tester Parallelity Price Tag Investment T5365 64 0,9 Mio. € Devices under test (DUT) for amortization SETNET, London, 13 September 2001 T5581H 128 1,9 Mio. € 1,0 Mio. € 10 Mio. DUT T5365 10% savings under 80% correlation with test time reduction reduTec 50-100 T € 50-100 T € 0,3-0,8 Mio. DUT The Cost of Test 8 optimiSE from data to knowledge Further developments within reduTec Test Data Mining Automated test- and object qualification based on user-specific expert system Online neuro-fuzzy-system association rules Online analytic processing (OLAP) Test and know-how data bases for improved process control and test management from data to knowledge SETNET, London, 13 September 2001 The Cost of Test 9