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Transcript
Mahatma Gandhi University
EE 010 408: Electronic Circuits Lab
Teaching scheme
3 hours practical per week
Credits: 2
Objectives
To expose the students to a variety of practical electronic circuits to prove the theories
behind them.
1.
2.
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13.
Diode Characteristics
BJT, FET and UJT characteristics.
Design and testing of clipping and clamping circuits
Design and testing of RC integrator and differentiator circuits.
Design and testing of rectifier circuits – Half wave – Full wave (centre – tapped and
bridge) circuits. Filter circuits.
Design and testing of Zener Shunt and Transistor Series Voltage Regulator.
Design and testing of RC coupled amplifier– frequency response.
Design and testing of Feedback amplifiers.
Design and testing of FET amplifier.
Sweep circuits – UJT and BJT based sweep generators – sweep circuit using constant
current source (BJT).
Design and Testing of RC phase-shift Oscillator and LC Oscillator.
Design and Testing of Astable and Bi-stable Multi-vibrators.
Relay driving circuit using transistors.
Optional
Simulation of the above circuits using EDA tools like
PSPICE.
(Any experiment relevant to EE 010 305 may be added)
References
1. A.P. Malvino, Electronic Principles– TMH
2. Floyd, Electronic Devices, Pearson Education, LPE
3. Robert L. Boylestad and Louis Nashelsky, Electronic Devices and Circuit
Theory, Pearson Education Asia, LPE.
4. Navas, Electronic Circuits Lab Manual
Syllabus – B.Tech. Electrical and Electronics Engineering