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Analytical technique: Fluorescence Spectroscopy
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AFM-IR



AFM-IR refers to atomic force microscope (AFM) based infrared (IR) spectroscopy. AFM-IR is a technique for chemical analysis of samples at nanoscale spatial resolution. AFM-IR is related to techniques including Tip-Enhanced Raman Spectroscopy (TERS) and scanning near-field optical microscopy (SNOM) and other methods of vibrational analysis with scanning probe microscopy. The AFM-IR technique uses a sharp tip of an AFM probe to measure the absorption of infrared light by a sample. Recording the amount of IR absorption as a function of wavelength or wavenumber creates nanoscale IR absorption spectra, which can be used to chemically characterize and even identify unknown materials. Recording the IR absorption as a function of position can be used to create chemical composition maps that show the spatial distribution of different chemical components. AFM-IR can overcome the diffraction limit that limits the spatial resolution of conventional infrared microscopy and microspectroscopy to the scale of several microns. AFM-IR can achieve spatial resolution down to around 20 nm, limited in some case only by the sharpness of the AFM probe tip and sensitivity down to the scale of molecular monolayers.
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