Laser Spectroscopy B3 - Imperial College London
... wavelength is poor (the visible spectrum is 700 nm). This means that the beam is far more powerful than it appears and additional precautions should be made to avoid exposure. Your blink reflex won't be able to save you at this wavelength. • Remove wristwatches and any other jewellery which may com ...
... wavelength is poor (the visible spectrum is 700 nm). This means that the beam is far more powerful than it appears and additional precautions should be made to avoid exposure. Your blink reflex won't be able to save you at this wavelength. • Remove wristwatches and any other jewellery which may com ...
supplementary document
... from Kurt J. Lesker Company. Sputtering conditions are 20 mTorr pressure, 150 W RF power, and constant Ar flow. Film thicknesses and optical properties (n, k vs. λ) of thin GST and HfO2 films on Si wafers are characterized by spectroscopic ellipsometer measurements. Deposition rates are calculated u ...
... from Kurt J. Lesker Company. Sputtering conditions are 20 mTorr pressure, 150 W RF power, and constant Ar flow. Film thicknesses and optical properties (n, k vs. λ) of thin GST and HfO2 films on Si wafers are characterized by spectroscopic ellipsometer measurements. Deposition rates are calculated u ...
Quasi-3D plasmonic coupling scheme for near-field optical lithography and imaging Y W
... utilizing plasmonic resonances, but the performance is not robust over a large range of sample materials. In this work we show a novel quasi-3D plasmonic scheme to focus light into the extreme subwavelength region in the near field with an efficiency orders higher than NSOM. The superb performance c ...
... utilizing plasmonic resonances, but the performance is not robust over a large range of sample materials. In this work we show a novel quasi-3D plasmonic scheme to focus light into the extreme subwavelength region in the near field with an efficiency orders higher than NSOM. The superb performance c ...
Direct measurement of standing evanescent waves with a photon
... collection efficiency E and the distance offset Az as fitting parameters. For the other parameters we used the values given in Section 2 and kept them fixed for the fitting procedure. There are several points that we should note here: (1) For 0 < z < 325 nm the data show an excellent fit by Eq. (3) ...
... collection efficiency E and the distance offset Az as fitting parameters. For the other parameters we used the values given in Section 2 and kept them fixed for the fitting procedure. There are several points that we should note here: (1) For 0 < z < 325 nm the data show an excellent fit by Eq. (3) ...
Introduction to Acousto Optics
... has become possible with the advent of spectroscopic systems with intelligence in the form of dedicated, or in some cases, built-in microprocessors or PC's. Typically, the analysis would proceed in up to four distinct phases: data collection, data processing, and finally calibration and prediction ( ...
... has become possible with the advent of spectroscopic systems with intelligence in the form of dedicated, or in some cases, built-in microprocessors or PC's. Typically, the analysis would proceed in up to four distinct phases: data collection, data processing, and finally calibration and prediction ( ...
(FT-IR) Microspectroscopic Measurements of Intact Spheres
... In a microscope, even for simple samples, the measured absorbance is not given by the thickness of the slab due to both sample boundaries as well as the angular diversity inherent in focusing. Instead, the recorded data are coupled to the slab geometry.12 All these effects are relevant in the case o ...
... In a microscope, even for simple samples, the measured absorbance is not given by the thickness of the slab due to both sample boundaries as well as the angular diversity inherent in focusing. Instead, the recorded data are coupled to the slab geometry.12 All these effects are relevant in the case o ...
Tomographic Interference Microscopy of Living Cells
... As mentioned above, an optically transparent sample is described by a 3D spatial distribution of refraction index. Therefore such a sample basically causes a phase shift of a probing light wave. In microscopy phase contrast and interference methods are used for its visualization. Phase contrast (pro ...
... As mentioned above, an optically transparent sample is described by a 3D spatial distribution of refraction index. Therefore such a sample basically causes a phase shift of a probing light wave. In microscopy phase contrast and interference methods are used for its visualization. Phase contrast (pro ...
N. Qureshi, H. Schmidt, A. Hawkins, “Near
... the material has different refractive indices for the two circularly polarized components of the light. This effect is used extensively in research and in industry as a non-invasive probe of magnetization in reflective thin films. Light is often focused using a microscope objective in order to obtai ...
... the material has different refractive indices for the two circularly polarized components of the light. This effect is used extensively in research and in industry as a non-invasive probe of magnetization in reflective thin films. Light is often focused using a microscope objective in order to obtai ...
High accuracy ranging with Yb -doped fiber-ring frequency
... measuring (via superposition of the test beam with a reference beam) the phase / = 2xh/c induced by propagation of the test beam through an incremental distance h to a reflecting (mirror) surface. Interferometric measurements provide only values of relative distances: they give the distance that the ...
... measuring (via superposition of the test beam with a reference beam) the phase / = 2xh/c induced by propagation of the test beam through an incremental distance h to a reflecting (mirror) surface. Interferometric measurements provide only values of relative distances: they give the distance that the ...
Enhanced visualization of choroidal vessels using ultrahigh
... bandwidth (9 nm loss in ~ 40 min), as well as an even slower power loss at the fiber output. Free space resolution of 3.5 µm x 4 µm (lateral x axial), corresponding to 2.5 µm x 3 µm in tissue and 98 dB sensitivity at 2 mW incident power was achieved by interfacing the PCF based source to the OCT sy ...
... bandwidth (9 nm loss in ~ 40 min), as well as an even slower power loss at the fiber output. Free space resolution of 3.5 µm x 4 µm (lateral x axial), corresponding to 2.5 µm x 3 µm in tissue and 98 dB sensitivity at 2 mW incident power was achieved by interfacing the PCF based source to the OCT sy ...
Doppler-Free Spectroscopy MIT Department of Physics
... MHz served to limit the resolution of optical spectroscopy. Various atomic and molecular interactions, presumed to be small but capable of producing significant features in optical spectra, were never observed because of shrouding and broadening due to the Doppler effect. The primary feature of satu ...
... MHz served to limit the resolution of optical spectroscopy. Various atomic and molecular interactions, presumed to be small but capable of producing significant features in optical spectra, were never observed because of shrouding and broadening due to the Doppler effect. The primary feature of satu ...
The Spectrum Analyzer and The Mode Structure
... Where d is the separation between the mirrors in the Fabry-Perot Cavity. Since d can be varied, the Fabry-Perot interferometer can accommodate different integral half wavelengths at different values of the separation d. When the separation d is increased considerably such that ∆σ is large enough, on ...
... Where d is the separation between the mirrors in the Fabry-Perot Cavity. Since d can be varied, the Fabry-Perot interferometer can accommodate different integral half wavelengths at different values of the separation d. When the separation d is increased considerably such that ∆σ is large enough, on ...
A negative permeability material at red light
... impedance η = η ′ + ιη ′′ . To obtain these parameters, the complex values of the transmitted and reflected fields should be available either from optical experiments or simulations [1,2]. In addition, along with its effective n and η , the layer can be characterized by its effective permittivity ε ...
... impedance η = η ′ + ιη ′′ . To obtain these parameters, the complex values of the transmitted and reflected fields should be available either from optical experiments or simulations [1,2]. In addition, along with its effective n and η , the layer can be characterized by its effective permittivity ε ...
Optical Coherence Tomography
... direction, while maintaining a longer scanning depth by using objective lenses of low numerical aperture. The spectroscopic optical coherence tomography further extracts the spectroscopic information from acquired data by analyzing the time-frequency distribution [2]. OCT has been proven to be usefu ...
... direction, while maintaining a longer scanning depth by using objective lenses of low numerical aperture. The spectroscopic optical coherence tomography further extracts the spectroscopic information from acquired data by analyzing the time-frequency distribution [2]. OCT has been proven to be usefu ...
IOSR Journal of Applied Physics (IOSR-JAP)
... determined from absorption and scattering spectroscopy and is found to depend on the shape, size and dielectric constants of both the metal and the surrounding medium. As the shape, size and surrounding medium changes of the nanoparticle environment causing a shift in the electric field density on t ...
... determined from absorption and scattering spectroscopy and is found to depend on the shape, size and dielectric constants of both the metal and the surrounding medium. As the shape, size and surrounding medium changes of the nanoparticle environment causing a shift in the electric field density on t ...
Metal surface structuring with spatiotemporally focused femtosecond
... observation is rather unclear and provides a nice topic of research to be systematically investigated in the future. Nevertheless, generally speaking, the physics has to be related to the different material properties of the metals as has been discussed in Ref. 22. The three metals investigated in t ...
... observation is rather unclear and provides a nice topic of research to be systematically investigated in the future. Nevertheless, generally speaking, the physics has to be related to the different material properties of the metals as has been discussed in Ref. 22. The three metals investigated in t ...
Contactless visible light probing for nanoscale ICs through 10 μm
... right side of Figure 2 we can see that due to the increased absorption the signal reflected from the active device becomes very faint. This signal is much harder to detect, and there is a lot of light from the back surface reflection entering the optics, which contains no information about the devic ...
... right side of Figure 2 we can see that due to the increased absorption the signal reflected from the active device becomes very faint. This signal is much harder to detect, and there is a lot of light from the back surface reflection entering the optics, which contains no information about the devic ...
IMAGING WITH THZ PULSES TX 7725
... delay. The measured signal is the coherent superposition of the electric fields from these two arms. Due to the Gouy phase shift acquired by the signal beam as it passes through a focus, it is 180” out of phase from the reference beam [9]. As a result, if the sample reflects the THz pulse without di ...
... delay. The measured signal is the coherent superposition of the electric fields from these two arms. Due to the Gouy phase shift acquired by the signal beam as it passes through a focus, it is 180” out of phase from the reference beam [9]. As a result, if the sample reflects the THz pulse without di ...
1.1 Objectives
... medium and form narrow channels with altered refraction index (waveguides) in the bulk media [13]. This phenomenon can be utilized for synthesis of various microoptical elements, e.g. phase diffraction lenses [14], bulk wave splitters for telecommunication [15] and various photonic crystals or even ...
... medium and form narrow channels with altered refraction index (waveguides) in the bulk media [13]. This phenomenon can be utilized for synthesis of various microoptical elements, e.g. phase diffraction lenses [14], bulk wave splitters for telecommunication [15] and various photonic crystals or even ...
WHITEPAPER Centration Measurement, Alignment
... Differences to VIS from a Technical Perspective From a technical side, apart from using suitable optics and illumination sources in the measurement heads, the most important difference between visual and infrared range is that in the infrared range every object, including the sample, emits light in ...
... Differences to VIS from a Technical Perspective From a technical side, apart from using suitable optics and illumination sources in the measurement heads, the most important difference between visual and infrared range is that in the infrared range every object, including the sample, emits light in ...
EELS
... ‣One can show that the EELS is a very good approximation of the EMLD ‣EMLDOS is a very concise description of optical excitations ‣The EELS is a map of the plasmons “eigenfunction” (with some marks... ‣The STEM-EELS is a decent plasmonic counterpart of the STM for ...
... ‣One can show that the EELS is a very good approximation of the EMLD ‣EMLDOS is a very concise description of optical excitations ‣The EELS is a map of the plasmons “eigenfunction” (with some marks... ‣The STEM-EELS is a decent plasmonic counterpart of the STM for ...
Three-dimensional imaging by optical sectioning in the aberration
... in focus compared with the other particles. From this, we can infer that these particles are at different heights on the support. To counter the effects of sample drift, each image in the focal series was aligned using a cross correlation with an appropriate reference image. The choice of this refer ...
... in focus compared with the other particles. From this, we can infer that these particles are at different heights on the support. To counter the effects of sample drift, each image in the focal series was aligned using a cross correlation with an appropriate reference image. The choice of this refer ...
r 5 fs hinner ljuset färdas 1
... profile in the gain medium has a better overlap with the pumped volume in modelocked operation compared to CW operation. The laser in the lab has been set up in this way, but when the titanium sapphire crystal is pumped, lasing will start where the gain is highest (a small number of modes at the pe ...
... profile in the gain medium has a better overlap with the pumped volume in modelocked operation compared to CW operation. The laser in the lab has been set up in this way, but when the titanium sapphire crystal is pumped, lasing will start where the gain is highest (a small number of modes at the pe ...
BEC: many weakly interacting particles Gross
... Confinement. Magnetic. Optical. Reduced dimensions. Arrays Observables. Images. Shot noise. Atom counting. Interactions. The G-P equation. Speed of sound. ...
... Confinement. Magnetic. Optical. Reduced dimensions. Arrays Observables. Images. Shot noise. Atom counting. Interactions. The G-P equation. Speed of sound. ...
Tutor 4
... In the last issue, we described how defocus affects the formation of an image. This information, combined with the basic imaging theory introduced in the first two parts of this series, has given us a fairly clear picture of how lithographic imaging systems work. We are now in a position to make a l ...
... In the last issue, we described how defocus affects the formation of an image. This information, combined with the basic imaging theory introduced in the first two parts of this series, has given us a fairly clear picture of how lithographic imaging systems work. We are now in a position to make a l ...
AFM-IR
AFM-IR refers to atomic force microscope (AFM) based infrared (IR) spectroscopy. AFM-IR is a technique for chemical analysis of samples at nanoscale spatial resolution. AFM-IR is related to techniques including Tip-Enhanced Raman Spectroscopy (TERS) and scanning near-field optical microscopy (SNOM) and other methods of vibrational analysis with scanning probe microscopy. The AFM-IR technique uses a sharp tip of an AFM probe to measure the absorption of infrared light by a sample. Recording the amount of IR absorption as a function of wavelength or wavenumber creates nanoscale IR absorption spectra, which can be used to chemically characterize and even identify unknown materials. Recording the IR absorption as a function of position can be used to create chemical composition maps that show the spatial distribution of different chemical components. AFM-IR can overcome the diffraction limit that limits the spatial resolution of conventional infrared microscopy and microspectroscopy to the scale of several microns. AFM-IR can achieve spatial resolution down to around 20 nm, limited in some case only by the sharpness of the AFM probe tip and sensitivity down to the scale of molecular monolayers.