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An Optical ‘‘Janus’’ Device for Integrated Photonics By Xiang Zhang*
An Optical ‘‘Janus’’ Device for Integrated Photonics By Xiang Zhang*

Full Text  - Journal of The Royal Society Interface
Full Text - Journal of The Royal Society Interface

... Whenever spatial information about the scattered light is not required, the overall optical response can be measured using an integrating sphere [24]. With this instrument, it is possible to measure the reflectivity/transmissivity of the sample integrated for all directions. The sphere consists of a ...
Electromagnetic forces for an arbitrary optical trapping of a spherical
Electromagnetic forces for an arbitrary optical trapping of a spherical

... force models has been the partial wave decomposition of an arbitrarily located high numerical aperture incident beam with any polarization. Approximations and circular polarization beams have been used to overcome the GMLT mathematical difficulties [2-9]. The linear polarization is important for the ...
Simultaneous Negative Phase and Group Velocity of Light in a
Simultaneous Negative Phase and Group Velocity of Light in a

... and metamaterial/substrate. Thus, the experiments must be accompanied by transmittance/ reflectance spectroscopy and by theory to ensure that these phase factors do not dominate over those due to propagation (see below). This interface aspect can generally also influence the group delay, but turns o ...
6,
6,

... theoretical and experimental treatment for the diffraction efficiencies of transmission HOEs and three- and two-element cascades when subject to broad spectral and field angle detuning. C. Shakher and S . Sirohi [4] have shown that a pair of thick phase holograms can be used to image extended object ...
Two-state Optical Filter Based on Micromechanical
Two-state Optical Filter Based on Micromechanical

... is not needed, since focusing is achieved using a Fresnel zone-shaped microrelief pattern. For mechanical simplicity, the fabricated test component shown in Figure 2 has an array of rectangular diffractive sub-elements of equal size and distance. In this case the sub-element edges do not coincide wi ...
Photons and Polarization
Photons and Polarization

... Let’s imagine that we have a beam of light polarized in the vertical direction, which could be produced by passing an unpolarized beam of light through a vertically oriented polarizer. If we now place a second vertically oriented polarizer in the path of the beam, we know that all the light should p ...
TAP 322- 3: Grating calculations
TAP 322- 3: Grating calculations

... The longest visible wavelength is that of red light with  = 750 nm. The shortest visible wavelength is violet where  = 400nm. Use this information to calculate the width of the angle into which the first-order spectrum is spread out when white light is shone onto the grating. ...
Stokes Polarimetry - Hinds Instruments
Stokes Polarimetry - Hinds Instruments

... The setup above is not sufficient for determining the complete polarization state in situations where the linear polarization direction is not initially defined. Thus, two measurements at 45 degrees with respect to each other must be made. This is a requirement of all general purpose polarimeters. W ...
Visualization of optical deflection and switching operations by a
Visualization of optical deflection and switching operations by a

... the device. The induced refractive-index change related to p-polarized light can be derived from Eq. (2) by replacing the electro-optic coefficient r33 with r13 and the extraordinary refractive index (ne) with the ordinary refractive index (no). Anyway, this induced refractiveindex change is not par ...
A Reliable Method For Extraction Of Material Parameters In
A Reliable Method For Extraction Of Material Parameters In

... When the samples are optically thin, terahertz pulse echoes get superimposed. If the signal is cut off at a nonzero value, it gives unexploitable results because the number of echoes to be taken into account is not an integer. The only solution consists in recording the signal over the entire time d ...
Multispectral Optical Coatings Are Tough, Versatile for IR
Multispectral Optical Coatings Are Tough, Versatile for IR

... The development goal for the h-DLCARCs was to improve the spectral performance over the mid-wavelength IR (3 to 5 µm) or long-wavelength IR (8 to 12 µm) wave bands, for the substrate materials germanium and silicon, over the performance provided by a standard DLC singlelayer application. A multilaye ...
Verification on Malus`s Law
Verification on Malus`s Law

... For unpolarized light, the electric and magnetic field components of light waves oscillate in random directions having more than one plane. In our modern life, we could have unnoticed polarized light from some electronic devices, such as calculators, computer screens and digital watches. The liquid ...
Light Propagation in optical Fibres
Light Propagation in optical Fibres

Thick Lenses and the ABCD Formalism
Thick Lenses and the ABCD Formalism

... Note the beam can only be re-imaged onto itself if d<2R. Another way of saying that is 0≤g2≤1 the “stability criterion” for a resonator. ...
1 Light Microscopy
1 Light Microscopy

... specimens is typically the result of well-established physical phenomena described as being either fluorescence or phosphorescence. The emission of light through the fluorescence process is nearly simultaneous with the absorption of the excitation light due to a relatively short time delay between p ...
- Natural Sciences Publishing
- Natural Sciences Publishing

... Abstract: GexSb40-xSe60 (where 10≤ x≤ 30 at %) thin films were prepared on glass substrates by thermal evaporation technique. X-ray diffraction analysis for as – deposited films showed that they have amorphous structure. The optical constants of the as- deposited films were calculated from optical t ...
Visible Light, Wide-Angle Graded Metasurface for Back Reflection
Visible Light, Wide-Angle Graded Metasurface for Back Reflection

... θ0, the reflected wave does not align with the incident wave and the structure operates as an ultrathin back reflector, redirecting light back into the half-space of incidence. Compared to previous attempts to realize highly efficient back-reflecting gratings, this approach is fully analytical, where cal ...
Optical Wave Guide Polarization Measurement System Students
Optical Wave Guide Polarization Measurement System Students

... factors that affect the signal that is being transferred and polarization is one of the main factors. Light is an electromagnetic wave. Polarization has to do with how the electric and magnetic fields align themselves. There are 3 types of polarization for light. They are linear, circular and ellipt ...
Fundamentals of Optical Interferometry for Thermal Expansion
Fundamentals of Optical Interferometry for Thermal Expansion

... changes in the speed of light [1]. Since then the development of lasers, solid state electronics, high speed photodetectors, CCD cameras and computerized data acquisition systems have considerably improved the versatility, range and resolution of interferometers, allowing a wide variety of applicati ...
Laser beam profiling
Laser beam profiling

... succeeding in modifying and shaping the laser’s output. Profiling is particularly helpful in building optical systems for laser printers and fiber optic collimators. Until you know the beam profile, it is difficult or even impossible to put the laser light to use. What is Beam Profiling? Spatial cha ...
File - Electrical Engineering
File - Electrical Engineering

... a set distance.  If we look at a single ray of light moving through a clear material the distance advanced by the wavefront would be quite regular.There is a widely held view that light always travels at the same speed.  This ‘fact’ is simply not true. The speed of light depends upon the material ...
All Facts for Choosing LED Optics Correctly
All Facts for Choosing LED Optics Correctly

... One may simplified say that the easier and the more controlled the requested light distribution is, the better is the performance. Spoken in practical terms, often a pure collimator lens has the best overall performance, for the best ones highly over 90%. Making optical versions of the same collimat ...
Surface-plasmon-polariton-induced suppressed
Surface-plasmon-polariton-induced suppressed

... −17:5 dB, at the resonant wavelength λ0 ¼ 1524 nm. Compared to the case of unstructured metal film of the same thickness (shown by the dashed curve), the transmittance drops from −12 to −17:5 dB. Note that in this case the metal surface coverage is only around 52%. The result shows a phenomenon oppo ...
lecture 7 OPL and interference
lecture 7 OPL and interference

... 2t is split into 3t and 3r; at this point, all these rays are in phase (no shift high to low η). 3r reflects back as 4 within polymer, its phase then changes relative to 2t. 3t + 4 = resultant, constructive + or destructive - depends on the λ. So to solve this for max. constructive transmitted inter ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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