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Optical properties of metals and alloys
Optical properties of metals and alloys

... Since reflectometry normally deals with the variation of light intensities and is therefore a power measurement, the absolute reflectance coefficients obtained from it are only indirectly linked to the real and imaginary parts of the complex dielectric function, which requires multiple measurements ...
The Time-Shift Technique for Measurement of Size and Velocity of
The Time-Shift Technique for Measurement of Size and Velocity of

... The time-shift technique is used here in a somewhat modified form. This technique was first introduced by Semidetnov (1985) [3] and is further developed in Damaschke et al (2002) and Albrecht et al (2003). It is realized by creating an illuminated volume considerably smaller than the size of the par ...
O A
O A

... Networks (LANs) and Wide Area Networks (WANs), factory automation and premises wiring (Intelligent Telecommunication System. 2006). An optical waveguide is a physical structure that guides electromagnetic waves in the optical spectrum. Waveguides are basic components used for distributing electromag ...
Nanowire Grid Polarizers for Mid- and Long-Wavelength
Nanowire Grid Polarizers for Mid- and Long-Wavelength

... The wire grid polarizer (WGP) remains one of the most useful optical components in the field and is prevalent in applications ranging from imaging and displays to communications and scientific instrumentation. The WGP typically consists of an array of metallic lines with sub-wavelength pitch support ...
Radially and azimuthally polarized beams generated by space
Radially and azimuthally polarized beams generated by space

... direction of the vector, chosen such that it is perpendicular to the grating stripes. When the period of the grating is smaller than the incident wavelength, only the zeroth order is a propagating order, and such gratings behave as layers of a uniaxial crystal with the optical axes perpendicular and ...
Soleil-Babinet Compensator
Soleil-Babinet Compensator

Polarimetric imaging of crystals - Werner Kaminsky
Polarimetric imaging of crystals - Werner Kaminsky

... A variety of methods have been developed for tracking the polarization state of light as it passes through successive optical elements and complex samples. These are the Poincaré sphere,20 the Mueller calculus,21 and the Jones calculus.22 These tools, and their relative advantages, have been treate ...
Airway Luminal Diameter and Shape Measurement by Means of an
Airway Luminal Diameter and Shape Measurement by Means of an

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Overview of Surface Plasmon Resonance
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Tuneability of amplified spontaneous emission through control of the waveguide-mode... in conjugated polymer films

CNOT on polarization states of coherent light
CNOT on polarization states of coherent light

... The nonzero mean value of the magnitude of the vector of polarization density in the described direction is the crucial point for the operation of the CNOT. If the direction of polarization of the control beam will be parallel with the direction of target beam, the polarization of target beam will r ...
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Line Degeneracy and Strong Spin-Orbit Coupling of Light with Bulk

... biaxial birefringent crystals. For example, in the EFSs of biaxial birefringent crystals [9–11] each degeneracy point forms a double cone. When a narrow beam is incident along the degeneracy point it will spread into a hollow cone within the crystal. On the other hand, for the bianisotropic medium s ...
Polarization effects and the calibration of a donut beam axial optical
Polarization effects and the calibration of a donut beam axial optical

... goes from being anti-aligned to aligned with the topological charge. This can easily be achieved by simply rotating a quarter-wave plate (as we have done here) or, more rapidly, by employing a liquid crystal retarder. Such an approach would provide a way to apply subtle axial forces without a need t ...
Distributed-gain measurements of erbium
Distributed-gain measurements of erbium

... reflection, whereas the other is connected to the fiber under test. The sensitivity of the technique is deternlined by the laser intensity and its intensity noise, whereas the maximum detectable range is given by the laser linewidth. In our experimental setup we used a three electrodes semiconducto ...
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Flat optics with designer metasurfaces

... Three features distinguish metasurfaces from conventional optical components. First, wavefront shaping is accomplished within a distance much less than the wavelength from the interface after the incident light beam traverses or is reflected by the optically thin metasurface. Large and controllable ...
Hollow Retroreflectors Promote Precision Optical Alignment
Hollow Retroreflectors Promote Precision Optical Alignment

... them attractive replacements is the invariance of the reflected beam with the tilt of the device. Each ray of a beam that fully illuminates and enters the component is translated proportionally to its distance from the center. Ultimately, though, the principal applications of these devices are those ...
Optics I
Optics I

... Natural light is randomly polarized. We can mathematically represent natural light in terms of two arbitrary, incoherent, orthogonal, linearly polarized waves of equal amplitude (i.e., waves for which the relative phase difference varies rapidly and randomly). ...
Whispering gallery modes of microspheres in the presence of a
Whispering gallery modes of microspheres in the presence of a

... principle, to monitor species concentration changes in the medium surrounding a dielectric microcavity. Krioukov et al.,6 recently proposed a species concentration sensor using this approach. They monitored refractive index changes around an integrated microdisk-waveguide system by exciting the micr ...
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I. Introduction - ER Publications

... Optical wireless system and FSO links provide higher performance to the communication system.FSO links improve data rate transmission and overall SNR of the system for deep-space communication applications. The most important parameter for an optical system is low weight and coast of system are impr ...
paper - Crescimanno page - Youngstown State University
paper - Crescimanno page - Youngstown State University

Pockels effect
Pockels effect

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Physical Optics: Diffraction, Interference, and Polarization of Light
Physical Optics: Diffraction, Interference, and Polarization of Light

... called diffraction. When the size of the opening or object is large compared to the wavelength of the light, the spreading effect is small. That is why diffraction is not noticeable for a beam of light coming through a window or in the shadow cast by an opaque object. On close examination, however, ...
PART 3_ir spectra_01
PART 3_ir spectra_01

... Are you getting the concept? At what angle would you collect the 1st order diffracted light with l = 500 nm if a broad spectrum beam is incident on a 600 groove/mm grating at qi = 10°? For l = 225 nm? For l = 750 nm? ...
Diode-Array UV Solar Spectroradiometer Implementing
Diode-Array UV Solar Spectroradiometer Implementing

Sensitivity of the FluoroLog® and FluoroMax
Sensitivity of the FluoroLog® and FluoroMax

... vendors often cite excitation of deionized water at 350 nm, resulting in Raman emission at 397 nm (an energy loss of 3380 cm–1). This Raman emission band of water is used because the signal is red-shifted and weak, which mimics weak fluorescence. De-ionized water is easy to prepare, so sample-to-sam ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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