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Opto-Mechanical Image Quality Degradation of Single Point
Opto-Mechanical Image Quality Degradation of Single Point

... A thorough lens design tolerancing can be done only after a opto-mechanical layout is established. The knife edge method, centered on the mechanical axis, may not provide the correct spot size diameter since the spot could be off by 100 um. To reduce this 100 um offset, a doublet design will reduce ...
OSA journals template (MSWORD)
OSA journals template (MSWORD)

... containing two different poling periods. We furthermore present observations of secondary optical parametric oscillators pumped by the circulating signal wave and the generated yellow light. 2. Experimental setup The experimental setup is shown in figure 1. It consists of a diode-pumped Q-switched Y ...
Ammonia Optical Sensing by Microring Resonators
Ammonia Optical Sensing by Microring Resonators

... Since microring resonance wavelengths are more than 20 nm spaced whereas maximum resonance wavelength shift over the sensor operating range is below 2 nm, the minimal detectable cladding refractive index shift also depends on accuracy in estimating the resonance wavelength shift. If a tunable laser ...
1.1 Objectives
1.1 Objectives

... in isotropic medium [8]. Light filaments propagating in noble gases generate intense pulses as short as few optical cycles (<5 fs duration), which have a potential for generation of high order harmonics seeking for atosecond pulses in VUV and X-ray spectral range [9]. Intensive research of plasma c ...
Low-coherence heterodyne photon correlation spectroscopy
Low-coherence heterodyne photon correlation spectroscopy

... lengths across our 1 cm sample cell. We find that the number of scattering path lengths across the sample cell (L, where  is the calculated photon scattering mean-free-path length) is the relevant experimental parameter, rather than the volume fraction. For example, a 0.01% aqueous suspension of ...
Reflection and critical angle
Reflection and critical angle

... 2.4. Wave propagation at an interface - reflection and refraction Now, if we take the plane wave solution to the wave equation, we can determine what happens when a wave strikes a dielectric interface. We know from our discussion on ray optics that when a ray hits a mirror, the angle of reflection (wi ...
Generalized Laws of Reflection and Refraction
Generalized Laws of Reflection and Refraction

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Dynamic Simulation of Optical MEM Switches
Dynamic Simulation of Optical MEM Switches

... For simplicity, we simulate only a single input switching to either the cross or bar state throughout this paper. Both output states are seen in Figure 1, represented by the solid and dashed arrows, respectively. The mirror fabrication and positioning can be achieved in a variety of ways. For exampl ...
Precession optomechanics - EECS @ UMich
Precession optomechanics - EECS @ UMich

... light would tend to apply a force to deform this waveguide that is preventing it from changing its trajectory. In the following section, this force will be calculated from the angularmomentum conservation consideration. This type of force is general and is taken into account for the non-optical case ...
Ocean Optical Properties - The Oceanography Society
Ocean Optical Properties - The Oceanography Society

... cameras for measuring irradiance and radiance distributions, apparently pioneered by the Scandinavians (Hojerslev, 1989), although there were probably similar achievements by the Russians though the literature is somewhat inaccessible (see, for example, Shifrin, 1972, and Monin and Shifrin, 1974). M ...
05_LC Applications
05_LC Applications

... are normally randomly oriented in the solid. •They are not conductors. •When a dielectric material is placed in an external electric field, the polar molecules rotate so they align with the field. This creates an excess of positive charges on one face of the dielectric and a corresponding excess of ...
P2SF: Physically-based Point Spread Function for
P2SF: Physically-based Point Spread Function for

... For image processing the PSF is usually approached in 3 different ways: model-based approach, experimental measurement and ray-tracing estimation. Model-based PSF can be a valuable solution in iterative optimization, for example, depth estimation [1] and image restoration [2]. On the other hand, thi ...
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... the shorter its wavelength c / f c .Wavelength Vs Frequency The higher the frequency of the signal. m/s The standard unit of frequency is Hertz If a wave completes one cycle per second.. then f Hz THz cycles per second . Optical Concepts . ...
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... • The intensity of the reflected light vs. incident angle will have a minimum that corresponds to the resonant frequency. From the location and magnitude of this minimum the concentration of the analyte can be determined.” Surface plasmon resonance sensors using optical grating • In this technique, ...
Reflection, Refraction and the Prism
Reflection, Refraction and the Prism

... of the path of light through any optical system. However, as seen in the chapter on Light, the Huygens wavefront construction can be become complicated, especially in systems with a large number of optical components. A simpler approach to track the behavior of light is based on the propagation of l ...
Quantitative force measurements with optical tweezers: The JPK
Quantitative force measurements with optical tweezers: The JPK

... The axial gradient force is similarly caused by momentum transfer upon refraction, resulting in a restoring force towards the focus, as in Figure 1b. The scattering force would cause the object to be propelled out of the focus (along the positive z–direction). The object is stably trapped only if th ...
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... The optical gain cutoff frequency should be lower than 80 GHz but, thanks to the improved waveguiding properties, theoretical evaluations of the device predict that 90 % of the light will be absorbed (at  = 1.55 µm), resulting in an internal responsivity of 1.1 A/W; output power should take advanta ...
DU4301727731
DU4301727731

Style Guides and Templates
Style Guides and Templates

in aligned and ordered films
in aligned and ordered films

... these substrates are shown in Figs. 2(d)–2(f). The thicknesses, determined by x-ray diffraction, are 340, 235, and 270 Å, respectively. The x-ray data shown in Fig. 1 were measured in the film from Fig. 2(d). The films completely cover the substrate. Interestingly, parallel elongated molecular terra ...


... recombined at the sample at an angle of 16.8° to the normal with an appropriate set of mirrors, and the spatial frequency obtained was 1125 lines/mm. The working intensity at 514 nm was 5 mW/cm2. The diffracted and transmitted intensity were monitored in real time with a He-Ne laser positioned at Br ...
Midterm2
Midterm2

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1 Experiment #1: Reflection, Refraction, and Dispersion Purpose: To

... Fig. (c) above. Supplementary Problem 3: Derive an expression for c in terms of the indices of refraction of the incident and transmitted media ni and nt, respectively. ...
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RADIOMETRY - gamma

... Radiometric Sensors may be comprised of a detector (i.e. silicon or germanium) and a filter, or a combination of filters. Filters can be spectrally matched to detectors to create a desired response curve. This is accomplished by attenuating certain wavelengths. The relationship between detectors and ...
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Index of Refraction (IoR) Technology for

... buffer preparation to chromatography and sanitization require liquid chemical concentration and temperature monitoring to optimize and ensure process performance. Errors in chemical concentration at any process step can result in loss of high-value product, reduced product quality/efficacy and reduc ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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