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Get PDF - OSA Publishing
Get PDF - OSA Publishing

Refraction
Refraction

... Less energy loss than electrical cables Much smaller than electrical wires. Less interference with optical fibres Medicine – optical fibres are used in endoscopes to look at inaccessible parts of the body e.g. stomach. Dentist's drill to carry light near the drill bit and so make it easier to see th ...
PDF Link
PDF Link

... input and output complex fields of the imaging system: F[Ui(x, y)] = C(fx, fy)F[Us(xʹ, yʹ)] (1) Here, C(fx, fy) is the imaging system coherent transfer function (CTF) for spatial frequencies (fx, fy), Us(xʹ, yʹ) and Ui(x, y) are the 2D scalar monochromatic optical fields at the sample and image pla ...
Brownian motion of a colloidal particle immersed in a polymeric
Brownian motion of a colloidal particle immersed in a polymeric

... decades. Such properties are very important for industrial processes of foods, cosmetics and paints, and also for understanding the microrheology of certain biological systems. In 1995, Mason and Weitz [1] presented a new method for measuring the viscoelastic properties of fluids through the determi ...
INTRODUCTION TO AO MODULATORS AND DEFLECTORS
INTRODUCTION TO AO MODULATORS AND DEFLECTORS

... extinct RF power driving the modulator. For maximum contrast ratio, l max must be optimized. This is done by maximizing the diffraction efficiency of the acousto-optic modulator through careful adjustment of the Bragg angle and optimizing the RF drive power. Application of too much RF drive power ca ...
Optical fibres
Optical fibres

... avoid the consequence as reflection this improves laser emission spectrum. Further, it causes quality deterioration which causes quality of transmission. To avoid above, a optical isolation is used across external modulator and transmitter laser. External modulators The direct modulation technique c ...
Two-dimensional control of light with light on metasurfaces
Two-dimensional control of light with light on metasurfaces

... Ideal performance requires a thin film or metasurface of deeply subwavelength thickness that absorbs 50% of a single beam illuminating the structure. Exploiting that the nanostructure of metasurfaces can be carefully engineered to achieve suitable optical properties and, guided by numerical modeling, ...
Physical Optics - Old Mill High School
Physical Optics - Old Mill High School

...  This experiment gave the wave model of light a great deal of credibility.  It was inconceivable that particles of light could ...
Real-time fiber-based multi-functional spectral- domain optical coherence tomography at 1.3 m μ
Real-time fiber-based multi-functional spectral- domain optical coherence tomography at 1.3 m μ

Coherent Light Transport in a Cold Strontium Cloud
Coherent Light Transport in a Cold Strontium Cloud

... light is collected in the backward direction by placing a CCD camera in the focal plane of an achromatic doublet. The angular resolution of our apparatus is 0.1 mrad, roughly twice the CCD pixel angular resolution. To avoid recording the MOT fluorescence signal while recording the CBS signal, a time ...
Exp7. Birefringence in Calcite Crystals
Exp7. Birefringence in Calcite Crystals

... As illustrated in the figure, when the beam of polarized light is incident on the surface of crystal, the refractive indices are different since the light has both parallel and perpendicular electric field component on the optical axis. Hence, every point on the wave-front propagates as elliptic wav ...
Hyperfine Structure of Rubidium
Hyperfine Structure of Rubidium

Perspectives for GAIA
Perspectives for GAIA

... Perspectives for investigation of CVs with ESA Gaia (I):  Profiles of the light curves of cataclysmic variables (CVs) will be significantly affected by the sampling of the Gaia data.  The individual outbursts in dwarf novae are expected to be covered by only a few Gaia data points – no or very li ...
White top-emitting organic light-emitting diodes using one
White top-emitting organic light-emitting diodes using one

Beyond Snel`s law: Refraction of a nano-beam of light.
Beyond Snel`s law: Refraction of a nano-beam of light.

... direction of propagation changes. If the light is a wide plane wave incident on a relatively large and flat interface of two different isotropic media, the change of wave direction is well described by Snel’s law. Snel’s Law of refraction is one of the oldest fundamental laws of optics [1] used in vi ...
A Carpet Cloak Device for Visible Light
A Carpet Cloak Device for Visible Light

... cloak device are shown in Figure 4 for three different excitation wavelengths of 480nm, 520nm, and 700nm. The 700nm beam is the direct output from the Ti-Sapphire laser, whereas the other two are the outputs of the second harmonic generation in the OPO, and thus the beam profiles are slightly differ ...
Technical Information on Optics
Technical Information on Optics

... The distance of the paraxial focus from the last vertex of an optical system (the distance from the last surface of a lens or lens system to its image plane). Unlike the effective focal length, the back focal length can be measured directly. Birefringence In optical anisotropic crystals, the index o ...
Generalized Multiprotocol Label Switching: An Overview of Routing
Generalized Multiprotocol Label Switching: An Overview of Routing

... • At the start of OPS (year 2000) Most OPS approaches assumed fixed length packets and synchronous operation of switches. • If the goal is to carry variable length packets (as in Ethernet) asynchronous operation may be necessary. • Use of wavelength dimension to resolve contention is also shown to b ...
Polarization rotation of slow light with orbital angular momentum in
Polarization rotation of slow light with orbital angular momentum in

... manifests itself in a rotation of the polarization plane of linearly polarized light. To extract a pure rotational phase shift, we suggest to measure a difference in the angle of the polarization plane rotation by two consecutive light beams with opposite OAM. The differential angle ⌬␣l is proportio ...
Get PDF - OSA Publishing
Get PDF - OSA Publishing

... (paleoecology),14 the monitoring of pollution15 or environmental changes. In many of these applications it is important to have precise estimates of cell volume. This allows the calculation of the biomass with the help of an appropriate conversion factor.16 The biovolume is usually achieved using si ...
Optical communication systems
Optical communication systems

... Today, infrared light is being used increasingly as the carrier for information in communication systems. The transmission medium is either free space or a light-carrying cable called a fiber-optic cable. Because the frequency of light is extremely high, it can accommodate very high rates of data tr ...
Polarization microscopy with the LC-PolScope
Polarization microscopy with the LC-PolScope

... Most of the imaging approaches discussed in this Lab Manual are based on the use of fluorescent molecules and their detection inside living cells. Only a decade ago, live cell imaging was dominated by techniques such as phase contrast, differential interference contrast and polarized light microscop ...
An optical fibre based evanescent wave sensor to
An optical fibre based evanescent wave sensor to

... photometric method uses the oscillatory nature of the interference effect of a reflected or transmitted beam from the film–substrate combination during deposition. This method is mainly used for monitoring and controlling the deposition of multilayer dielectric films. Optical methods have the advant ...
Introduction to Acousto Optics
Introduction to Acousto Optics

... on-line data processing and chemometrics, which has become possible with the advent of spectroscopic systems with intelligence in the form of dedicated, or in some cases, built-in microprocessors or PC's. Typically, the analysis would proceed in up to four distinct phases: data collection, data proc ...
worksheet
worksheet

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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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