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Optical fiber communication
Optical fiber communication

... If symmetry is perfectly round and free from all stresses, both polarization modes would propagate at exactly the same speed, resulting in zero PMD. called (DGD) ...
Optical trapping using cascade conical refraction of light
Optical trapping using cascade conical refraction of light

... Optical traps are used in a wide variety of experimental setups from basic studies of atom dynamics to biological cell stretching studies. The early work owes much to the insight of Ashkin and his associates who led off this research area in 1986 [8, 9]. Traps are now routinely used to optically man ...
NicholasBarbutoPoster - Physics
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... Interference effects inside photonic crystals provide mechanisms for the precise control of light both within and outside of the photonic crystal. In particular the emission direction, spectrum, and intensity can be affected by the band structure. We will study photoluminescence properties in one-di ...
Optimized back-focal-plane interferometry directly measures forces
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... However, using the deflection of the trapping beam to measure the motion of the sample connected the measurements of positions and of momenta. The deflection of the light cone used by Ghislain and Webb naturally contains information on the change in the momentum of the photons, as S. Smith et al. [ ...
Fundamental Limit to Linear One-Dimensional Slow Light Structures
Fundamental Limit to Linear One-Dimensional Slow Light Structures

... structures with large relative dielectric constants ε r , such as metals ( ε r ∼ 100 in the near infra-red); it does not, however, show how to design such systems nor does it prove that attaining such a limit is practically possible, especially given loss in such systems. This limit does say that re ...
Optical properties of Pittsburgh glass subjected to mechanical and
Optical properties of Pittsburgh glass subjected to mechanical and

... The measurements performed by means of integrating sphere and standard reflectometry give a rather average reflectance over a larger scale reflected samples. In order to study the reflection from small surface areas, an optical profilometer (OP) [9] was applied. The scattered radiation measured by O ...
Harnessing a Quantum Design Approach for Making Low
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... but they use materials with negative dielectric responses, and they absorb much of the light in a way that seriously degrades both the resolution and brightness of the image. Here we demonstrate an alternative “quantum metamaterials” (QM) approach that uses materials structured at the nanoscale, i.e ...
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Miniaturized Fiber-Optic Fabry-Perot Interferometer for Highly
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... interferometer with a micrometric tip for highly sensitive refractive-index measurement. By demodulation of the interference spectrum, the change of optical path distance caused by the environment can be obtained. This effect can be very useful in a broad range of biomedical applications, such as re ...
A New Fiber Optic Spring
A New Fiber Optic Spring

... springs are used for a large variety of functions in sensor applications such as the measurement of force, acceleration, vibration, and pressure. Although they provide different information, coiled metal springs have been used for at least 500 years in a variety of machine design applications and me ...


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... The simulation arrangement for FWM configuration is shown in fig. 1. Block diagram of the system is divided into three sections: transmitter, channel and receiver. In transmitter section first block is data source where data rate and bit is customized. The data source is the pseudo number sequence. ...
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... be crossed. When Congo red-stained amyloid is considered, this arrangement is what is usually meant by ‘polarized light,’ but a more accurate expression is examination of a specimen between crossed polarizer and analyzer. There are two observations to explain, namely, how Congo red-stained amyloid a ...
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Refractive index dispersion and related properties in fluorine doped

... Refractive index dispersion has been determined for fluorine doped fused silica containing 1 and 2%fluorine. Addition of fluorine is found to reduce the refractive index and material dispersion. Fibers modeled for minimization of modal dispersion having fused silica cores and fluorine doped silica c ...
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UV-light microscope: improvements in optical imaging for a

... been used for stable isotope analyses of geological samples at high precision and accuracy.1,2 Isotope analyses are performed by sputtering of the sample surface using Cs+ or O primary ions that are focused, typically, to a diameter of 10–15 mm; secondary ions ejected from the sample surface are ex ...
Design and investigation of properties of nanocrystalline diamond
Design and investigation of properties of nanocrystalline diamond

... Moreover, in both papers [7, 8] the NCD films were deposited on optically non-transparent substrates, which are rather mirrors and from the text in [7] it is not clear if the conditions for waveguiding properties are fulfilled. What concerns the NCD films deposited on Si [8] there could be found a p ...
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Optical Parametric Generation Spontaneous parametric down
Optical Parametric Generation Spontaneous parametric down

... crystal for phase matching. In uniaxial crystals, the phasematching angle depends only on the angle between the Z axis and the k vector of the laser beam. This polar angle is usually called the phase-matching angle. The crystal cut is chosen to allow rotation of the phase-matching angle, while keepi ...
General principles of spectroscopy and spectroscopic analysis
General principles of spectroscopy and spectroscopic analysis

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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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