Sidelobe decline in single-photon 4Pi microscopy by Toraldo rings
... 1 ΒΌ 1:6: Due to the wavelengths mismatch, the illumination and the detection PSFs have now quite different scales so that the secondary peak of the illumination PSF is multiplied by low value of the detection PSF. Additionally, the secondary peaks of the detection PSF are multiplied by low values of ...
... 1 ΒΌ 1:6: Due to the wavelengths mismatch, the illumination and the detection PSFs have now quite different scales so that the secondary peak of the illumination PSF is multiplied by low value of the detection PSF. Additionally, the secondary peaks of the detection PSF are multiplied by low values of ...
Modes Effective Refractive Index Difference Measurement
... The effective refractive indices of the modes, and effective refractive index differences between the modes are important characteristics for few-mode optical fibers. By measuring the reflection spectrum of the fiber Bragg grating (FBG) fabricated in the few-mode fiber, some discrete information of ...
... The effective refractive indices of the modes, and effective refractive index differences between the modes are important characteristics for few-mode optical fibers. By measuring the reflection spectrum of the fiber Bragg grating (FBG) fabricated in the few-mode fiber, some discrete information of ...
THE VARIATION O F .THE STRESS OPTICAL COEFFICIENT WITH
... lurgical Engineering at The University of Arizona, for his patience and aide in the dull task of finalizing the thesis; and Dr. Clarence L. Babcock, Professor of Optical Sciences at The University of Arizona, who, whenever the author began to stray, quietly appeared on the scene to point the way. ...
... lurgical Engineering at The University of Arizona, for his patience and aide in the dull task of finalizing the thesis; and Dr. Clarence L. Babcock, Professor of Optical Sciences at The University of Arizona, who, whenever the author began to stray, quietly appeared on the scene to point the way. ...
Holographic particle image velocimetry
... accuracy in the particle position is limited only by the area on the hologram that intercepts scattered light from the particles. All efforts connected to large-aperture optics in traditional imaging can be avoided. Real-image reconstruction may also be employed for the successful compensation of ab ...
... accuracy in the particle position is limited only by the area on the hologram that intercepts scattered light from the particles. All efforts connected to large-aperture optics in traditional imaging can be avoided. Real-image reconstruction may also be employed for the successful compensation of ab ...
IOSR Journal of Electronics and Communication Engineering (IOSR-JECE)
... Where is the total atmospheric co-efficient, contributed by absorption and scattering and L is the distance between the transmitter and receiver [3]. It can be seen that typical terrestrial communication wavelengths like 808 nm, 1064 nm or 1550 nm are applicable because they fall inside the atmosphe ...
... Where is the total atmospheric co-efficient, contributed by absorption and scattering and L is the distance between the transmitter and receiver [3]. It can be seen that typical terrestrial communication wavelengths like 808 nm, 1064 nm or 1550 nm are applicable because they fall inside the atmosphe ...
Mach Zehnder Interferometer and its Applications
... the core produce an interference pattern thus producing a very effective in-line MZI. This MZI has the same physical path length in both sensing and reference arms but has different optical path lengths because of modal dispersion as the beam passing through cladding experiences refractive index whi ...
... the core produce an interference pattern thus producing a very effective in-line MZI. This MZI has the same physical path length in both sensing and reference arms but has different optical path lengths because of modal dispersion as the beam passing through cladding experiences refractive index whi ...
Impact of Liquid Crystals in Active and Adaptive Optics
... relative orientation of liquid crystal directors and the direction of propagation and plane of vibration of the optical field. Additionally, due to its liquid like behavior, this relative orientation can be easily tuned by using electric, magnetic or optical fields [1-6], so anisotropy and tuning ca ...
... relative orientation of liquid crystal directors and the direction of propagation and plane of vibration of the optical field. Additionally, due to its liquid like behavior, this relative orientation can be easily tuned by using electric, magnetic or optical fields [1-6], so anisotropy and tuning ca ...
Measurement considerations when specifying
... to verify loss at normal incidence. For critical applications, it is important for system designers to know whether they are receiving measurements over the full angle range or theoretical data at high angles when they purchase a lens. Spectrophotometer-based reflection measurements There is always ...
... to verify loss at normal incidence. For critical applications, it is important for system designers to know whether they are receiving measurements over the full angle range or theoretical data at high angles when they purchase a lens. Spectrophotometer-based reflection measurements There is always ...
EBSD SEM TEM
... When the radiation from the probe source strikes on the sample, interaction with the matter occurs. This interaction is measured and reveals the characteristics of the microstructure. Of course the intention is to obtain maximum information with the least amount of damage to the sample . A general r ...
... When the radiation from the probe source strikes on the sample, interaction with the matter occurs. This interaction is measured and reveals the characteristics of the microstructure. Of course the intention is to obtain maximum information with the least amount of damage to the sample . A general r ...
Diffraction effects in optical interferometric displacement detection in nanoelectromechanical systems
... The NEMS devices used in these experiments were silicon doubly clamped beams. The devices were fabricated on a silicon-on-insulator wafer with a 219-nm-thick silicon device layer on top of a 396-nm-thick sacrificial oxide layer. Figure 1(a) shows a scanning electron micrograph of a completed family ...
... The NEMS devices used in these experiments were silicon doubly clamped beams. The devices were fabricated on a silicon-on-insulator wafer with a 219-nm-thick silicon device layer on top of a 396-nm-thick sacrificial oxide layer. Figure 1(a) shows a scanning electron micrograph of a completed family ...
Spectacle lens design following Hamilton, Maxwell
... We have a very useful way to characterize magnification and distortion. However, how to compute the point eikonal matrix S? Recall that we need to compute it for many gaze directions, and do so very fast, since it must be done at each iteration of the optimization process. Clearly, this cannot be do ...
... We have a very useful way to characterize magnification and distortion. However, how to compute the point eikonal matrix S? Recall that we need to compute it for many gaze directions, and do so very fast, since it must be done at each iteration of the optimization process. Clearly, this cannot be do ...
pdf file
... waveforms of the THz field at the focus are plotted in figure 5. It is seen from the figure that the pulse widths agree with each other but the pulse shapes are slightly different. The simulated waveform increases faster in the rising stage but decreases slower in the decay state. It may be attribut ...
... waveforms of the THz field at the focus are plotted in figure 5. It is seen from the figure that the pulse widths agree with each other but the pulse shapes are slightly different. The simulated waveform increases faster in the rising stage but decreases slower in the decay state. It may be attribut ...
Optical aberration
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An optical aberration is a departure of the performance of an optical system from the predictions of paraxial optics. In an imaging system, it occurs when light from one point of an object does not converge into (or does not diverge from) a single point after transmission through the system. Aberrations occur because the simple paraxial theory is not a completely accurate model of the effect of an optical system on light, rather than due to flaws in the optical elements.Aberration leads to blurring of the image produced by an image-forming optical system. Makers of optical instruments need to correct optical systems to compensate for aberration.The articles on reflection, refraction and caustics discuss the general features of reflected and refracted rays.