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... The resonance lines are found by calculating the transmission through the quantum dot as function of X` and Xr . One then finds [30] that when either X` or Xr is varied while the other parameter is kept fixed, the maxima of the transmission occur on two ‘resonance lines’, shown in thick lines in Fig ...
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as PDF

... where atomic units have been used such that C is 3(3π2)2/3/10 and the Coulomb interaction between two electrons appears as 1/r12 with r12 being the separation between the electrons. The first term on the right is the kinetic energy functional, the second is the electrostatic repulsion between electr ...
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Calculation of Dispersion Energies - Psi-k

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New Developments in Transmission Electron Microscopy for

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... in the H atom. This is within range of ESR and NMR spectrometers, and if found would be very useful in analytical laboratories. In the H atom it depends on th eprincipal quantum number n, but in general in atoms and molecules it would produce a rich and new spectral structure. If this structure is ...
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... was published in 2013 (IPCC, 2013) and Work Group II report was published in 2014 (IPCC, 2014), it was stated that the global mean surface temperatures for the period 2081-2100 may rise 0.3-4.8 ◦ C relative to 1986-2005, depending on the emissions. This does not mean a similar rise in temperature ev ...
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... as a very simple model for the electron of the hydrogen atom that is kept close to the proton. Since the potential is constant for |x| < a, the solution just corresponds to a superposition of plane waves (1.11). For |x| > a, the wave function has to vanish because of the infinite potential. At |x| = ...
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THE SYMMETRY GROUP PARADOX FOR NON

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X-ray photoelectron spectroscopy



X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the elemental composition at the parts per thousand range, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy and number of electrons that escape from the top 0 to 10 nm of the material being analyzed. XPS requires high vacuum (P ~ 10−8 millibar) or ultra-high vacuum (UHV; P < 10−9 millibar) conditions, although a current area of development is ambient-pressure XPS, in which samples are analyzed at pressures of a few tens of millibar.XPS is a surface chemical analysis technique that can be used to analyze the surface chemistry of a material in its as-received state, or after some treatment, for example: fracturing, cutting or scraping in air or UHV to expose the bulk chemistry, ion beam etching to clean off some or all of the surface contamination (with mild ion etching) or to intentionally expose deeper layers of the sample (with more extensive ion etching) in depth-profiling XPS, exposure to heat to study the changes due to heating, exposure to reactive gases or solutions, exposure to ion beam implant, exposure to ultraviolet light.XPS is also known as ESCA (Electron Spectroscopy for Chemical Analysis), an abbreviation introduced by Kai Siegbahn's research group to emphasize the chemical (rather than merely elemental) information that the technique provides.In principle XPS detects all elements. In practice, using typical laboratory-scale X-ray sources, XPS detects all elements with an atomic number (Z) of 3 (lithium) and above. It cannot easily detect hydrogen (Z = 1) or helium (Z = 2).Detection limits for most of the elements (on a modern instrument) are in the parts per thousand range. Detection limits of parts per million (ppm) are possible, but require special conditions: concentration at top surface or very long collection time (overnight).XPS is routinely used to analyze inorganic compounds, metal alloys, semiconductors, polymers, elements, catalysts, glasses, ceramics, paints, papers, inks, woods, plant parts, make-up, teeth, bones, medical implants, bio-materials, viscous oils, glues, ion-modified materials and many others.XPS is less routinely used to analyze the hydrated forms of some of the above materials by freezing the samples in their hydrated state in an ultra pure environment, and allowing or causing multilayers of ice to sublime away prior to analysis. Such hydrated XPS analysis allows hydrated sample structures, which may be different from vacuum-dehydrated sample structures, to be studied in their more relevant as-used hydrated structure. Many bio-materials such as hydrogels are examples of such samples.
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