1 Electronics Introduction
... Most – Follow block diagrams for electronic devices Some – Will be able to design a block diagram for an electronic device ...
... Most – Follow block diagrams for electronic devices Some – Will be able to design a block diagram for an electronic device ...
108-1472 Product Specification Connector, Short Point Receptacle Contact
... This specification covers performance, tests and quality requirements for TE Connectivity (TE) short point receptacle contact and connector system. This contact is a separable electrical connection device for mating to .025 inch square posts. It can be crimped to 20 to 32 AWG wire sizes and is inten ...
... This specification covers performance, tests and quality requirements for TE Connectivity (TE) short point receptacle contact and connector system. This contact is a separable electrical connection device for mating to .025 inch square posts. It can be crimped to 20 to 32 AWG wire sizes and is inten ...
AC RESONANT TEST SYSTEMS
... series resonant test system has some outstanding advantages. In the event of a breakdown, the fault current is very small as the resonance circuit is detuned. In most cases, the complete test system can be trailer or truck-mounted to provide mobility for field tests of installed power cables or gene ...
... series resonant test system has some outstanding advantages. In the event of a breakdown, the fault current is very small as the resonance circuit is detuned. In most cases, the complete test system can be trailer or truck-mounted to provide mobility for field tests of installed power cables or gene ...
TB426: Characterization of the Output Protection Circuitry of
... harmless to the human, although it can smart a little, it has devastating effects on an integrated circuit. Most ICs have some level of ESD protection, but special attention must be placed on those I.C.’s that come in frequent contact with humans. ...
... harmless to the human, although it can smart a little, it has devastating effects on an integrated circuit. Most ICs have some level of ESD protection, but special attention must be placed on those I.C.’s that come in frequent contact with humans. ...
Slides - Agenda INFN
... The idea of the project (“mini-DOM”): A multi-PMT (5 PMTs) in an ANTARES sphere, enabled to receive power / commands and send data from / to the standard ANTARES LCM electronics, will allow to disentangle the L1 coincidence rate as a function of the space angle between the PMTs. A first multi-PMT te ...
... The idea of the project (“mini-DOM”): A multi-PMT (5 PMTs) in an ANTARES sphere, enabled to receive power / commands and send data from / to the standard ANTARES LCM electronics, will allow to disentangle the L1 coincidence rate as a function of the space angle between the PMTs. A first multi-PMT te ...
MDM1200E33D
... 1. The information given herein, including the specifications and dimensions, is subject to change without prior notice to improve product characteristics. Before ordering, purchasers are advised to contact Hitachi sales department for the latest version of this data sheets. 2. Please be sure to rea ...
... 1. The information given herein, including the specifications and dimensions, is subject to change without prior notice to improve product characteristics. Before ordering, purchasers are advised to contact Hitachi sales department for the latest version of this data sheets. 2. Please be sure to rea ...
Connected Array - Electronic Polymers Incorporated
... EPI-FLO – PVS Connector Array Device Description The EPI-FLO Polymer Voltage Suppressor (PVS) connector array provides a shunt for electro staticdischarge (ESD) which protects sensitive electronic circuits from the damaging effects of over voltage and over current events. EPI-FLO devices are capable ...
... EPI-FLO – PVS Connector Array Device Description The EPI-FLO Polymer Voltage Suppressor (PVS) connector array provides a shunt for electro staticdischarge (ESD) which protects sensitive electronic circuits from the damaging effects of over voltage and over current events. EPI-FLO devices are capable ...
Application Note – AN1302 Reinforced insolation testing on a power
... from customers to verify the isolation barrier on their application without causing an electrical stress on internal components. When testing as a complete power supply or system the Customer must use the DC equivalent of 4kV AC, which is 5.6kVDC. (For margin the Xgen series have been designed to wi ...
... from customers to verify the isolation barrier on their application without causing an electrical stress on internal components. When testing as a complete power supply or system the Customer must use the DC equivalent of 4kV AC, which is 5.6kVDC. (For margin the Xgen series have been designed to wi ...
108-1332 Product Specification AMPMODU* 50/50 Grid Connector System
... and shrouded headers containing at least 30 contacts total. Test group 1 shall consist of the smallest and largest position sizes available. Test groups 2, 3 and 4 shall each consist of the largest position size available. ...
... and shrouded headers containing at least 30 contacts total. Test group 1 shall consist of the smallest and largest position sizes available. Test groups 2, 3 and 4 shall each consist of the largest position size available. ...
project2 - UTK-EECS
... (a) Characterize a MOSFET and a BJT, extract their dc models, and use SPICE to simulate the transistor characteristics and compared with measured characteristics. (b) Design, build, and test current mirror circuits using either MOSFETs or BJTs. Procedure example using a 2N7000 MOSFET: (1) Use HP 414 ...
... (a) Characterize a MOSFET and a BJT, extract their dc models, and use SPICE to simulate the transistor characteristics and compared with measured characteristics. (b) Design, build, and test current mirror circuits using either MOSFETs or BJTs. Procedure example using a 2N7000 MOSFET: (1) Use HP 414 ...
TS6001G3-2.5DB Datasheet
... 0.2V to 12.6V as needed. Please refer to the TS6001 product datasheet “Electrical Characteristics” section for more information. Note: In order to add a Kelvin connection to the output test point VOUT, connect the positive terminal of a DVM to VOUT and the negative terminal to GND. Then, place a res ...
... 0.2V to 12.6V as needed. Please refer to the TS6001 product datasheet “Electrical Characteristics” section for more information. Note: In order to add a Kelvin connection to the output test point VOUT, connect the positive terminal of a DVM to VOUT and the negative terminal to GND. Then, place a res ...
14.7 Transverse Balance, VDSL/VDSL2 ANSI/TIA-968
... are connected to the test ground plane. Similarly, if the EUT provides connections to other equipment through which ground may be introduced to the equipment, then these points are connected to the test ground plane. Equipment that does not contain any of these potential connections to ground are pl ...
... are connected to the test ground plane. Similarly, if the EUT provides connections to other equipment through which ground may be introduced to the equipment, then these points are connected to the test ground plane. Equipment that does not contain any of these potential connections to ground are pl ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.