Download Commun-ications Test Facility

DRDO
1. IRDE (INSTRUMENTS RESEARCH DEVELOPMENT ESTT.), DEHRADUN
TEST FACILITIES / EQUIPMENT AVAILABLE AT IRDE, DEHRA DUN
Ser Test Facilities/
No. Parameter
Test
Equipment/
Machine
Range/
Accuracy
Availability
at
Station
Remarks
1.
Stabilisation Accuracy
Measurement Test
Facility
3 Axis motion
Simulator with Line
of Sight Measurement
Instrumentation
upto 400 /s
Measurement
accuracy upto
5 sec of an arc
Yes
--
2.
Inspection of Aspheric/
Spherical/Lenses, Flat
mirrors and measurement
of roughness as per
optical parameters
Form Taly Surf
0.01
Resolution
Yes
--
Inspection/measurement of
optical parameters such as
EFL, BFL, Resolution &
Concentricity
Askania Optical
Collimator
0.001mm
Yes
--
3.
2
4.
a) MTF/OTF, EFL,
Transmission
b) MRTD, MDTD
Thermal Imaging
performance Test set up
IRMTF
Yes
--
MRID
8-11m
Spectral Bond
5.75 cycles/mrad
Yes
--
5. Testing of Image Intensifier
Tubes for Resolutions, EBI,
Magnifications, distortions,
Lumineous Gain, Radiant
Gain, Signal to Noise ratio,
Screen Brightness, Photocathode spectral Response,
Veiling Glare etc.
Test setup for
various
parameters
within +/-2%
photometric
accuracy
Yes
An extensive
test lab has been
created at IRDE
for testing
II Tubes of
various types.
6. Apparatus for Measurement
of % Transmission/(Integrated
& Spectral) & Reflectivity
Test setup
+/- 2%
Yes
--
7. Apparatus for Measurement
of Veiling Glare index.
--do--
+/-2%
Yes
--
8. Performance Evaluation Test
facility for Image Intensifier
Based Night Vision Devices
to measure technical
parameters viz. Mag., FOV,
Definition and system
resolutions etc.
Illuminators with
80 metres long
suitable combination
dark hall
of filters and lamps to
simulate varied night light
conditions(10-1 to 10-4 lux)
ranging from full moon to
overcast conditions
encountered during night.
High, medium and low
contrast USAF resolution
pattern to check performance
under different contrast
conditions.
Yes
This facility is
unique of its
kind and is being
extensively used
for testing of
NVDs by
various PAs.
3
9. Adherence of thin film
coating
10. Reflection & Transmission
measurement from 1-27 m
Adherence Tester
+1 psi
Yes
--
FTIR Spectro
photometer
+1%
Yes
--
11. Measurement of radius of
Curvature of Lenses and
test plates
12. Measurement of Focal
Length/Back focal length
and eccentricity of lenses
Precision
Spherometer
4mm to  /
.001mm
Yes
--
Focometer
10mm to
Yes
1200mm +ve
10mm to 1050mm
-ve/.04mm to .05mm
--
13. Measurement of Refractive
index and V value
Abbe’s
Refractometer
1.3 to 1.7 /
.0001
Yes
--
14. Measurement of angles
Pyramidal error through
angles, Surface flatness
15. Measurement of radius of
curvature and surface
accuracy of flats, spherical
and performance of subassembly
Precision
Spherometer
360/1sec of an
arc
Yes
--
Phase shifting
Laser
interferometer
Max. aperture
Yes
/150mm, Radius
measurement upto
.001mm, surface
deformation upto
 /20,where  =632.8nm
--
16. Measurement of dioptric
power and axis of
cylindrical lenses
Dioptrometer
25 Diopter/0 to 180 Yes
axis .25 Diopter
--
17. Low/High Temp. Test
Low/High Temp.
chamber(KashiNath
Hyderabad)
space(1m x 1m x 1m)
-60C to 100C
+/-3C
Yes
Testing spec.
JSS-55555
IS-10236
Mil-STD 810E.
One port hole
dia 70mm
4
18. Low/High Temp. Test
Low/High Temp.
chamber(Kasco-Pune)
space(1m x 1m x 1m)
-60C to 100C
+/-3C
Yes
Testing spec.
JSS-55555
IS-10236
Mil-STD
810E.
One port hole
dia 105mm
19. Dry Heat High Temp. Test
High Temp. Test
chamber(Labman)
space(1.2mx1.2mx1.2m)
Ambient to 100C
+/-2C
Yes
Testing spec.
JSS-55555
IS-10236
Mil-STD
810E.
One port hole
dia 50mm
20. Damp Heat Test
chamber(Vijay Luxmi)
Damp Heat Test
10C to 100C
+/-2C
JSS-55555
W/space(1.2mx1.2mx1.2m) RH 95% +/-5%
Yes
Testing spec.
Damp Heat Test
chamber gallon Comp
(London) W/space
(80cmx70cmx70cm)
Yes
21. Damp Heat Test
Ambient to 100C
+/-2C
RH 95% +/-5%
IS-10236
Mil-STD
810E.
One port hole
dia 50mm
Testing spec.
JSS-55555
IS-10236
Mil-STD
810E.
One port hole
dia 50mm
5
22. Damp Heat Test
chamber W/space
Damp Heat Test
+/-2C
(80cmx60cmx70cm)
10C to 100C
JSS-55555
RH 95% +/-5%
Yes
Testing spec.
23. Storage Test
Storage Test
chamber (KascoPune) W/space
(90cmx90cmx120cm)
15C to 80C
+/-2C
RH 95% +/-5%
Yes
Testing spec.
JSS-55555
IS-10236
Mil-STD
810E.
One port hole
dia 100mm
24. Dust Test
Dust Test chamber
Make deal, Calcutta
W/Space(1mx1mx1m)
Ambient to 100C
+/-3C RH<30%
25gm dust +/-5gm
should be collected
in 5min.
Yes
Testing spec.
JSS-55555
IS-10236
Mil-STD
810E.
One port hole
dia 100mm
25. Salt Spray Test
Salt spray Test chamber
Labman, Calcutta
W/Space(110cmx60cm)
Ambient to 50C
+/-2C High humidity nature of
corrosion Saline.
Yes
Testing spec.
JSS-55555
IS-10236
MIL-STD
810E.
One port hole
dia 100mm
IS-10236
Mil-STD
810E.
One port hole
dia 50mm
6
26. Bump Test
Bump Test machine
Vijay Luxmi
Bangalore w/space
(60cm x 60cm)
Max. test load
Yes
113kg Height of fall
adjustable 2.5cm max
frequency 2 to 4 Bumps
per second Peak acc.
40g +/- 4g
Testing spec.
JSS-55555
IS-10236
MIL-STD
810E
One port hole
dia 100mm
27. Drop Test
Drop test Machine
make(Budh Singh
and Sons,Roorkee)
w/space(86cmx61cm)
Max test load
50 kg Max drop
height 150cm Peak
acc. 100g +/-4g
Testing spec.
JSS-55555
IS-10236
MIL-STD
810E
Yes
One port hole
dia 100mm
28. Shock Test
Shock Test Machine
Avco-USA w/space
40cmx40cm
Max load test
90 kg Peak acc.
15g to 1500g
1500g Pulse
duration .5mile
sec to 18 mile
sec. Pulse profile
half sine wave &
Terminal peak
saw tooth.
Yes
Testing spec.
JSS-55555
IS-10236
MIL-STD
810E
One port hole
dia 100mm
29. Vibration Test system
Sinusoidal Random
Sine-on-Random
Vibration Test system
(SDPL Roorkee)
Max acc. 65g Bare Yes
table load capacity
100kg at 30mmp top.
Displacement Frequency
5 to 2000Hz Power
output 2000kgf with
sliptable mount
platform area 30cm dia.
Testing spec.
JSS-55555
IS-10236
MIL-STD
810E.
One port hole
dia 100mm
7
30. Combined Vibration test
with Low/High Temp.
Vibration test system
from SDPL,Roorkee
and chamber Kasco,
Pune.
Range and accuracy Yes
of vibration machine
Please see Sr No.29
Chamber test space
(1mx1mx1m) Temp.
-40C to 100C
+/-2C
Testing spec.
JSS-55555
IS-10236
MIL-STD
810E
One port hole
dia 100mm
2. CABS (CENTRE AIR BORNE SYSTEMS), BANGALORE
COMPENDIUM OF TEST EQUIPMENT/TESTING FACILITIES
Sl Test Facilities/
No. Parameter
1.
Lightning
Test Facility
Test Equipment/
Machine
i) Impulse
Voltage
Generator
Range/
Accuracy
4000 kV  3%
Energy = 126 kJ
Rise Time = 1.2 us
( 10%)
Fall Time = 50us
( 10%)
Availability at station
Remarks
CABS, Bangalore
Used for testing
lightning attachment
points
ii) Current
Generator ‘A’
200 kA  10%
Action Integral
= 2 x 106 A2 S 
20%
Duration =  500
us
CABS, Bangalore
ii, iii, iv & v
used for testing
Direct effects of
lightning
iii) Current
2 kA  10%
Generator ‘B’
Max. Charge
Transferred = 10 C
 10%
CABS, Bangalore
iv) Current
Generator ‘C’
CABS, Bangalore
200 – 800 A 
20%
Max. Charge
Transferred = 200
Used for testing
Indirect effects of
lightning
9
v) Current
Generator ‘D’
vi) Current
Generator ‘E’
2
HVDC Test
Facility
1200 kV HVDC
Generator
C  20%
CABS, Bangalore
100 kA  10%
Action Integral
= 0.25 x 106 A2 S
CABS, Bangalore
50 kA  10%
Rate of Rise = 30
kA/us
1000 kV  3%
25 mA
Ripple =  5%
CABS, Bangalore
For withstand
voltage test of
insulating systems
10
Sl Test Facilities/
No. Parameter
3.
Global
Positioning
System (GPS)
Test Facility
Test
Equipment/
Machine
STR 4760; L1;
C/A Code; 12channel GPS
Satellite Signal
Simulator with
built-in
trajectory
generators for
Space vehicles,
aircraft, ships
& ground
vehicles.
Range/
Accuracy
Availability at station
Remarks
No. of Sat. Channels : 12
CABS, Bangalore
Used for
testing GPS
/ DGPS
equipment.
Output Frequency : 1575.42 MHz  158
Hz
Signal level : -160 dBW 20 dB
Signal Level Resolution : 0.1 dB
Can be used
for testing as
development
support.
Velocity range : 120.000 m/sec
Acceleration Range : 3600 m/sec2
System outputs Jerk Range: 5000 m/sec3
RF signals as
per GPS ICD- Pseudorange error :  0.1 m (RMS)
200 B
Pseudorange Rate Error :  0.1 m/sec
(RMS)
Acceleration Error :  0.005 m/sec2
(RMS)
Jerk Error :  0.02 m/sec3 (RMS)
Can be used
for dynamic
testing of
System level
GPS / DGPS
equipment
performance.
11
4.
Commun-ications
Test Facility
Fast
Installation
Tester
(Marconi
46882-262N)
- Forward &
Reverse
Power
- VSWR
Accuracy
- Voltmeter
- Resistance
Meter
- Identification
of Antenna
Shorts
- Auto Detect
of
Pulse
Transmission
70MHz to 1000MHz (Range)
0.1dB (Accuracy)
0.1 (Accuracy)
30mV (Accuracy)
0.1 (Accuracy)
CABS, Bangalore
Handheld
Oscilloscope
(Tektronix
THS730A)
Radiocommunication
Service
Monitor
(Rohde & Schwarz
CMS 54)
0-200MHz (Range)
5mV/Div (Accuracy)
--Do--
0.4 MHz to 1 GHz (Range)
0.4dB (Accuracy)
--Do--
12
5.
Microwave
Test Facility
Vector Network Analyzer
HP8720ES (Agilent)
Spectrum Analyzer HP8563E
(Agilent)
Pulsed/CW Microwave Counter
HP5361B (Agilent)
High Frequency probe HP85024A
(Agilent)
Microwave Power meter EPM441
(Agilent)
Microwave Power Sensor HP8481A
(Agilent)
Peak Power Meter/ Digital Sampling
Analyser 4500 (Boonton)
Synthesized Signal Generator
HP83731B
(Agilent)
Hand Held High Performance Power
Density meter. Model No 50 (Raham)
50 MHz to 20 GHz
Accuracy :
Amp : 0.1 dB at –40dB
Phase : 1 at –40 dB
30 Hz to 26.5GHz
Accuracy :
Sweep : 1%
Amplitude : 1dB
Freq :  1*10-8 * Final Frq
10Hz to 26.5GHz
Accuracy : 1 LSD
300 kHz to 3GHz
 1dB for 300kHz to 1GHz
Accuracy :
-2 to 3dB > 1GHz
100 KHz to 110GHz
Power range :
-70dBm to 44dBm
Accuracy :  0.02dB(log)
10MHz to 18GHz
Power range:
–30 dBm to 20dBm
Accuracy :
-4% to 2% 10 to 20dBm
Negligible: -30 to +10dBm
30 MHz to 40GHz
Power Range :
-40dB to 20dB(pulse)
-50dB to 20dB(CW)
Accuracy : 0.065 at 0dBm
1GHz to 20GHz
Accuracy :  1 dB
CABS, Bangalore
0.2MHz to 26 GHz
Freq Sensitivity :  2dB
Accuracy :
 0.5 dB
CABS, Bangalore
CABS, Bangalore
CABS, Bangalore
CABS, Bangalore
CABS, Bangalore
CABS, Bangalore
CABS, Bangalore
13
3. MTRDC, BANGALORE
PROFORMA
Compendium of Test Equipment/Testing Facilities
Sl
N
o
1.
Test Facilities/
Parameters
Test Equipment/Machine
Range/
Accuracy
Availability at Station
Precision
Machining
Facilities
1. Schaublin CNC Lathe
2. Centreless grinding machine
3. Precision honing machine
4. ACCUCUT Precision ceramic
grinding and slicing machine
5. Precision Praga milling machine
5 microns
2 microns
Available
1 microns
10 to 20 microns
25 microns
2.
3.
Precision
Measurement
facilities
1. XYZ non-contact measuring
microscope
2. 3-D Co-ordinate measuring
instrument
accuracy 10 microns
Materials
Laboratory
1. Vacuum & electron beam
evaporation system
for coating of lossy materials, thin
films on microwave tube components
2. RF/DC sputtering system
- for sputter coating of thin films of
materials such as Tantalum,
Zirconium, Titanium etc. on
microwave tube components.
15" dia chamber ;
<5x10-6 torr vacuum
Available
accuracy 50 microns
3 target sputtering ;
target dia 4"
Available
Remarks
14
4.
High
temperature
sintering
and brazing
stations
1. CENTORR high vacuum high
temperature furnace
2. Vertical retort furnace
3. Horizontal muffle furnace
4. RF brazing station
5. Leak Detector
(Hindi make)
6. Leak Detector(Varian)
5.
6.
Laser Welding
machine
Electron Tube
testing facilities
1. For precision laser welding of
microwave tube sub-assemblies
1. Electron beam analyzer system
2. UHV processing station
(For evacuation of microwave tubes)
3. a) Low power magnetreater/
charges model no. 595
b) High power magnetreater / charges
model no. 9034
Size: 6"x6"x6"
Temperature 25000C, Atmosphere:
Vacuum (10-6 Torr), Dry and wet
hydrogen
Diameter 6 inches, temperature:
11000C, atmosphere: Dry
hydrogen
Diameter 6 inches, temperature:
11000C, Atmosphere: Dry and wet
hydrogen
Temperature: 10000C, atmosphere:
Dry hydrogen
10-8 Torr
10-9 Torr
spot size: 50 microns
For testing of electron guns
designed and developed, before
integration into the microwave
tube
10-8 Torr vacuum or better. Baking
facility available upto 4000C
Available
Available
Available
12KJ/6KJ
18KJ/12KJ
7.
HVPS-1
(High Voltage
Power Supply)
Beam voltage (cathode)
Beam current (cathode)
Heater voltage
Heater current
Anode voltage
Anode current
15kV (max)
2A (peak)
15Vdc/ac rms
5A (max)
2kV dc
1mA
Available
15
Bias voltage
Pulse top voltage
8.
HVPS -2
Collector voltage
Beam voltage (cathode)
Beam current (cathode)
Heater voltage
Heater current
Anode voltage
Anode current
Bias voltage
Pulse top voltage
9.
HVPS-3
Collector voltage
Beam voltage (cathode)
Beam current (cathode)
Heater voltage
Heater current
Anode voltage
Anode current
Bias voltage
Pulse top voltage
10.
Microwave
testing facility
Collector voltage
1. Spectrum analyzer
2. Microwave pulsed freq. counter
3. Microwave freq. counter
-50V tp -2950V dc
0 to +2000 V dc
-12 kV
32kV (max)
3.5A (peak)
15Vdc/ac rms
5A (max)
2kV dc
1mA
-50V tp -2950V dc
0 to +2000 V dc
-18 kV
Available
50kV (max)
20A (peak)
26Vdc/ac rms
15A (max)
1kV dc
1mA
-50V tp -2950V dc
0 to +2000 V dc
-45 kV
Available
100 Hz-2.5GHz in the low freq.
band 2 GHz-22 GHz in the pre
selected microwave band
Available
100 Hz-26.5 GHz
10 Hz-26.5GHz
Synthesized sweeper: 0.0120.3GHz S-parameter test set:
45MHz-26.5GHz +20dBm Max,
40 VDC max
16
4. Vector network analyzer
5. Scalar network analyzer
6. Noise generator
7. Precision LCR meter
8. Peak power analyzer
10 MHz-60GHz
Freq. 2 GHz-18 GHz ; O/P power:
-20dBm
75 KHz- 30MHz
upto 26.5 GHz