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www.BDTIC.com/FAIRCHILD 2N7002MTF N-Channel Small Signal MOSFET FEATURES BVDSS = 60 V ! Lower RDS(on) RDS(on) = 5.0 Ω ! Improved Inductive Ruggedness ! Fast Switching Times ID = 200 mA ! Lower Input Capacitance ! Extended Safe Operating Area SOT-23 ! Improved High Temperature Reliability Product Summary Part Number 1.Gate 2. Source 3. Drain BVDSS RDS(on) 60V 5.0Ω ID BDTIC 2N7002 115mA Absolute Maximum Ratings Symbol VDSS ID Characteristic Value 60 Drain-to-Source Voltage Continuous Drain Current (TC=25℃) 115 Continuous Drain Current (TC=100℃) 73 Units V mA IDM Drain Current-Pulsed 800 mA VGS Gate-to-Source Voltage ±20 V Total Power Dissipation (TC=25℃) 0.2 W Linear Derating Factor 1.6 mW/℃ - 55 to +150 ℃ PD TJ , TSTG ① Operating Junction and Storage Temperature Range Thermal Resistance Symbol Characteristic Typ. Max. Units RθJA Junction-to-Ambient -- 625 ℃/W Rev. C1 www.BDTIC.com/FAIRCHILD N-Channel Small Signal MOSFET 2N7002MTF Electrical Characteristics (TC=25℃ unless otherwise specified) Symbol Characteristic Min. Typ. Max. Units Test Condition BVDSS Drain-Source Breakdown Voltage 60 - - V VGS = 0V, ID = 250µA VGS(th) Gate Threshold Voltage 1.2 - 2.5 V VDS = VGS, ID = 250µA - - 100 Gate-Source Leakage, Forward IGSS Gate-Source Leakage, Reverse IDSS Drain-to-Source Leakage Current ID(ON) On-State Drain-Source Current Static Drain-Source nA VGS = 20V VGS = -20V - - -100 - - 1.0 - - 500 0.5 - - A VDS = 10V, VGS = 10V - - 5.0 Ω VGS = 10V, ID = 0.5A 0.08 - - S VDS = 15V, ID = 0.2A µA VGS = 40V VGS = 40V, TC = 125℃ BDTIC RDS(on) On-State Resistance ② gfs Forward Transconductance ② Ciss Input Capacitance - - 50 Coss Output Capacitance - - 25 Crss Reverse Transfer Capacitance - - 5 td(on) Turn-On Delay Time - - 20 Rise Time - - - Turn-Off Delay Time - - 20 Fall Time - - - tr td(off) tf pF VDS = 25V, VGS = 0V, f = 1.0MHz VDD = 30V, ID = 0.2A ns RG = 25Ω ②③ Source-Drain Diode Ratings and Characteristics Symbol Characteristic Min. Typ. Max. Units - - 115 mA IS Continuous Source Current ISD Pulse Source Current ① - - 800 mA VSD Diode Forward Voltage ② - - 1.5 V Notes ; ① Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature ② Pulse Test : Pulse Width = 250μs, Duty Cycle ≤ 2% ③ Essentially Independent of Operating Temperature Test Condition Integral reverse pn-diode In the MOSFET TA = 25 ℃, IS = 115mA VGS = 0V www.BDTIC.com/FAIRCHILD N-Channel Small Signal MOSFET 2N7002MTF BDTIC www.BDTIC.com/FAIRCHILD 2N7002MTF N-Channel Small Signal MOSFET BDTIC www.BDTIC.com/FAIRCHILD TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. ACEx™ FAST ActiveArray™ FASTr™ Bottomless™ FPS™ CoolFET™ FRFET™ CROSSVOLT™ GlobalOptoisolator™ DOME™ GTO™ EcoSPARK™ HiSeC™ E2CMOS™ I2C™ EnSigna™ i-Lo™ FACT™ ImpliedDisconnect™ FACT Quiet Series™ ISOPLANAR™ LittleFET™ MICROCOUPLER™ MicroFET™ MicroPak™ MICROWIRE™ MSX™ MSXPro™ OCX™ OCXPro™ OPTOLOGIC Across the board. Around the world.™ OPTOPLANAR™ PACMAN™ The Power Franchise POP™ Programmable Active Droop™ Power247™ PowerSaver™ PowerTrench QFET QS™ QT Optoelectronics™ Quiet Series™ RapidConfigure™ RapidConnect™ µSerDes™ SILENT SWITCHER SMART START™ SPM™ Stealth™ SuperFET™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TinyLogic TINYOPTO™ TruTranslation™ UHC™ UltraFET VCX™ BDTIC DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component is any component of a life 1. Life support devices or systems are devices or support device or system whose failure to perform can systems which, (a) are intended for surgical implant into be reasonably expected to cause the failure of the life the body, or (b) support or sustain life, or (c) whose support device or system, or to affect its safety or failure to perform when properly used in accordance with instructions for use provided in the labeling, can be effectiveness. reasonably expected to result in significant injury to the user. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary First Production This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only. Rev. I11