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185 2006 IEEE Electrical Performance of Electronic Packaging Accurate System Voltage and Timing Margin Simulation in CDR Based High Speed Designs Frank Lambrecht, Qi Lin, Sam Chang, DanOh, Chuck Yuan, and Vladimir Stojanovic Rambus Inc. 4438 El Camino Real, Los Altos, CA 94022 Phone: (650)-947-5326, FAX: (650)-947-5001, frankli rambus.com Abstract-Accurate variations required is analysis for timing and voltage margin at a target system high production volume of high techniques signaling advanced systems. speed such bit This in error rate across turn transmitter as requires a process, voltage, statistical equalization and and simulation receiver temperature framework to feedback. decision links, one must also carefully model the clock-data recovery circuits system voltage and timing margin. In this paper, we first present a stochastic simulation We then compare the simulation results based on methodology for modeling circuits. quadrature sampling based timing recovery lab model. Finally, we correlate the simulation measurements to validate the proposed approach. telecommunication Furthermore, (CDR) impact networking serial on modeling simple method, results to I. INTRODUCTION T prediction successfully prediction advanced circuit of rate components completely voltage becoming is timing speeds. example, For Within this complex including requires the these closed. increasingly figure receiver processing Due the to see the resultant architecture effects oltage Marginh at Different ODR that requires -0 Fig. channel links at overall 150 statistical includes signal multi-gigahertz signaling inter-symbol interference, eye adaptive integrity with where the and without decision analysis to bit the eye error diagram at the equalization more The including rate considering feedback include rates. data architecture is shown receiver [1]. behavioral This circuit system performance. Erro| Vs Voltage Margin at Differn t OD ROffset s Pr obabiIity of r RO f E -2 100 ~~~~~~~~~~~ 2100 large speed of the 1 we modeling than was needed in the past in order to accurately predict Probabiity of Eror vs.g for high consideration a statistical eye diagram is shown in Figure ni receiver important complete ~~~~~~~~~~~~~~1501~~~00 22 0 100 1E 1-5 0 Received I eye with and without RX behavioral model post processing -10 Traditionally, the circuit effects have been taken into account in channel voltage and timing budget as a separate budget item. Simplified driver models simulated with passive network models have been used to characterize the channel performance. Such an approach is no longer acceptable for analysis of high-speed designs. As a result, accurate of system speed links requires that we include increasingly more detailed edct yst simulation m p rfrma high ce models of these ase and architectural blocks capture the voltage to onthesim fully effects. abThese timinglatonto eas details rem nt include discrete resolution such as quantization from transmitter equalization, decision feedback and feed forward equalization and modeling of the algorithms used to determine coefficients. We need to model the effects of recovered clock sample point variation and other sources of circuit based variation inperformance. Typical clock recovery circuits are to responsive various contributors to edge timing movement which include data variations, inter-symbol interference characteristics of the channel, and random noise events on the channel. In addition, filtering is typically applied to the phase update decision. These recovered effects clocking must be considered within a broader framework for analysis of I/O an subsystem. of Examples such simulation toolsets are described in [2-5]. For the simulations presented here we use the Rambus developed LinkLab LinkLab's CDR modeling methodology in the next section. We then signal integrity simulation toolset. We introduce the show that simplified assumptions about clock timing for recovered clock systems do not accurately predict system performance based on the simulation to lab measurement correlation. IO orrla10n coefficients pattern 1-4244-0668-41061$20.00 ©2006 IEEE17 171 186 II. MODELING METHODOLOGY The LinkLab toolset statistically simulates high speed links in the time domain. A basic flowchart for such a simulation methodology is shown in Fig. 2 below. The transmitter model captures the driver including equalizer covering different equalization algorithms and quantization error as well as power constraints. The channel block integrates all the passive circuit components including motherboard trace and device models such as Ri/Ci, package and connectors. The determination of ISI probability density function can be obtained as in [6], when generalized to the data pattern set under consideration. After passing receiver linear equalizer, the signal is processed by analog decision feedback equalizer (DFE). It selects from the various schemes of DFE based on the circuit design under consideration. The last step is to feed the statistical description of the received waveform into the CDR with the random and deterministic jitter components. Additional effects are also modeled including transmit and receive PLL phase variations due to noise effects and imperfect reference clock, termination thermal noise and other variation sources. The system voltage/timing margin calculation computes the bathtubs of bit error rate (BER) vs time and voltage offsets as well as a statistical eye diagram. Input Pulse | Tx Equalizer Channel SParameters TX Jitter -N ISI Probability Density Function DFE[1 System Voltage/Timing Margin |Crosstalk and RX Jitter Fig. 2 Simulation flowchart Within the flowchart of Fig. 2 we will be focusing on impact of accurate CDR behavioral modeling. Recovered clock phase is most impacted by the timing and voltage noise distorted waveforms input to the phase recovery circuit. The major contributors to timing and voltage noise can be broken in three sets: i) due to channel, package, and parasitic inter-symbol interference, ii) effective receiver referenced voltage noise distribution from transmitter and receiver jitter from thermal, power supply and reference clock noise sources, and iii) recovered clock sample point distribution. To these we also add the behavioral effects of transmit and receive signal processing circuits which include both corrective and additional noise sources. Total received signal error can be described by Eq. (1), where xjISI, xjitTx,XjitRx represent interference, and receiver voltage noise from transmitter and receiver jitter, respectively. As seen in Fig. 3, data pulses are labeled as bk, edge jitter values asSk, channel pulse response samples asPk, and channel impulse response samples as hk. Indexes sbS and sbE mark the beginning and end of the channel pulse/impulse response. X + 7i Xk = sE Xk X xJ.ItTx k k bk = + xitRX bk-n p, n=-sbS sbE > Z kn b n=-sbS Ek-n+l (hn-I X(n sbE k (1it) bE E n= -sbS ;(a) kn (hn - hn lgY Tn)kX £k n- I bk T-1 (k+l)T >(b) b T + k + I)T TX ~ ~ ~ ~ bT bkkk Fig. 3 Jittered pulse decomposition. A symbol transmitted with jitter is converted to symbol's widths (b) are equaltoEkTX a symbol with k+]TX. no jitter (a), plus a noise term where the noise- and We apply superposition principles to add the effects of residual ISI in generating an effective statistical eye description. From these resultant distributions as sampled by the clock recovery circuits we are able to generate stochastic descriptions of the received clock timing. This is shown in Fig 4. This variation in receiver timing is then used to condition the incoming data eye distributions to result in final bit error rate and margin predictions. 172 .HS CL=a3ble.~ PSahdoretCMVA->l m, P-UP n 0.8X- p-dn p-no-valid transitions p-earlIy' 0.4 0 \ _, p-late % I p-hold 0.20 -Pholdi 9~ s _J '- -28 Pdnli Accumulate-resz filter, length 4 0.6- 187 50 100 150 200 250 Phase count Fig. 4 (left) The raw input probabilities (p-early, p-late, p-no-valid transition) are converted by a filter to state transition probabilities (p-up, p-dn, phold) for each possible phase position; (right) First-order Markov chain phase-state model. Each state represents a different phase position, and the arcs are the probability of transition, given that position. This simulation framework can be extended to include additional design features for modeling and optimization. As in [7] where we model the impact of low power design techniques on the bit error rate of high speed links through delay variation modeling and do sample trade-offs for a 15 Gbps link over 8" of FR4. These methods enable tradeoffs in speed, equalization approach, and power to be made while predicting the bit error rate of the link. III. RESULTS AND DISCUSSION For the simulation and lab correlation in this paper we use 4-tap differential transmit equalization and receiver architecture shown in Figure 5. A random data pattern was simulated, where each bit is assumed to be independent of the previous bit. For the lab analysis we used a 2 31 PRBS data patterns. Given the limited time history of residual ISI for a passive link, this is a valid comparison. as t PLL f Eqtializer Driverl Phs oto A i 4hase Detector Fig. 5 I/O architecture The 30" backplane channel used in this analysis is shown in Fig. 6. The backplane and paddle card designs are manufactured in a 14 layer FR4 PCB. The backplane trace used was located on an upper layer leaving approximately a 100 mil via stub on this net. On the paddle card a 60 mil via stub remained on the net. The connector pinset chosen used the longest length (GH on HMZD connector). This length and transfer characteristic is typical for a long backplane serial link application, where the channel has -18dB insertion loss at 2.5 GHz. For this channel to operate at 5 Gbps, one must use advanced signaling to recover the data at the receiver. I Hi=-L16 Short SMVA _=r Cable~ ~ ~ ~ ~ ~~~~~~~~~Cbl PaddleCard [dB] (Vi ctim=n blue, FEXT=- green, retd) NEXT= 1O _20 - 1 L=3" 9 ---20 -T T 2 3 4 Connector HMZD Connector 0 .GF 1 4 5 Fig. 6 Typical high speed backplane channel and its transfer function Lab and LinkLab simulation results are shown in Fig. 7 below. In addition to the 30" backplane channel an additional result is shown for a shorter 16" backplane trace. This (+/- mV) voltage margin is defined to be at the bit error rate of 10A-15. This can 173 188 also be thought of as the positive or negative differential offset that can be applied to the receiver required to increase the bit error rate to the 10- 15 level. 250 16"- Sim 200 30"- Sim 16"- Lab 30"- Lab - 150 E 100 50 2.9 3.4 3.9 4.4 Data Rate (Gbs) 4.9 5.4 5.9 Fig. 7 Lab vs. simulation comparison Fig. 8 shows the system voltage margin result with additional simulation results using a receiver model which samples data in quadrature rather than using the more complete CDR behavioral model. As can be seen in this plot, the difference between including and not including the CDR model has an effect of (+/-) 5-19 mV or 10-38 mV peak-peak for these speeds and channel. We can see that this difference is not constant across frequency and also varies with channel choice, a simplified single offset term would lead to overly pessimistic simulation results for most channels. 160 0 Quadrature- 140 . . BER Vs additional ItN offset, 4A4 Gbps With CDR Model ~~~~~Lab Data 120 E -m 80 w 0With CDR ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ 20 Lab Data 3 3.5 4 4.5 Data Rate (Gbps) 5 5.5-5 -50 0 50 100 150 additional voftd offset [mVJ Quadrature Timing Model, and Lab Data -100 Fig. 8 (left) Margin Results vs Data Rate using Stochastic CDR model, using Simplified Voltage Bathtub plot for same 3 data sets at 4.4Gbps frequency point. (right) Sample As we have seen, the signal integrity analysis of high speed links is becoming more challenging. Additional complexity in the behavioral modeling of JO circuits is required. Within this new framework is a strong interdependence between channel and circuit design. This paper describes a general approach to such simulations and describes behavioral simulation of a clock data recovery block. We show the accuracy benefits of such modeling for a sample long backplane channel at speeds of 3.4 -5.4 Gbps. RiEFERENCES [1] [2] [3] [4] [5] [6] [7] J. 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Yang "Power Centric Design of High-Speed I/Os" 43rd Design Automation Conference, 2006.Paper 50.4 ~Symposium 174