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Transcript
iSIGHT Applications
in
Electronics Industry
iSIGHT Customers in Electronics
• Advanced Institute of
Technology and Science(J)
• Aisin
• Black & Decker
• Canon
• Delphi Packard Electric
• Denso
• Emerson Motor
• Fuji XEROX
• Fujitsu
• General Electric
• Hitachi
• Kyocera
• Matsushita/Panasonic
• Mitsubishi Electric
• Motorola
• NEC
• Ricoh
• Samsung
• Sanyo
• Sharp
• Sony
• Toshiba
• XEROX
etc.
Applications in Electronics Industry
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Heat Exchange Unit Optimization
Halogen-IR Lamp Design Space
Power Converter Weight Reduction
3D Coil and Magnetic Field for controlling Deflection Yoke of CRT
3D Coil and Magnetic Field for controlling Electron Beam Orbit of Flat TV
Rubber Switch Optimization
Latch Bracket Shape Optimization Plastic Injection Molding Optimization
Plastic Injection - Structure Analysis MDO
Semiconductor Circuit Design Optimization
LCD Circuit Design Optimization
Robust Design for coating materials of semiconductor
ECU Design & Controlling Optimization
Refrigerator Internal Flow for minimizing Electric Power Consumption
Air Conditioning System Optimization
Vacuum Cleaner Intake Mechanism for maximum Inhalation with minimum
Electric Power Consumption
No Exhaust Vacuum Cleaner
Laundry Machine Structure for minimizing Vibration and Noise
IH Rice Cooker Magnetic Field Optimization
Automation & Integration of EDA Process in
Semiconductor Design
Automation & Integration
Process
Simulation
Shape
Simulation
Mask
Layout
Functionality
Simulation
Logic
Synthesis
Device
Simulation
Latency Information
Logic
Simulation
IC Test
Parameter of
Device Characteristics
Circuit
Simulation
Failure
Information
Failure
Simulation
Failure
Dictionary
Device Design
IC Design
Failure
Analysis
Mask Layout
& Testing
Automation & Integration of EDA Process
in System Design
Automation/Integration/Optimization
Analog
Simulation
Digital
Simulation
PCB Positioning
& Wiring
Prototype
Test
Software
Design
Physical System
Test
Failure
Information
I/O Design
PCB Design
Failure
Analysis
System Design & Testing
Reliability
Testing
Hitachi Semiconductor Group:
Robust Design of MOS Devices:DOE based TCAD Simulation
Objective
Yield Improvement Time Reduction of New Devices
TCAD
Calibration
Requiring Robust Design of MOS
Robust Design
Issues
Requiring Multi Variables Optimization
DOE Process
Calibration of Device Simulator
Robust Design of MOS Devices
Prototyping
Error Factor
Compounding
Parametric
Optimization
Design Environment of MOS Devices
Design Cycle Reduction
Design Improvement
3 Month (Traditional Method)
Threshold Voltage (Vth) Deviation
--> 3 Weeks (Manual DOE/Taguchi Method)
--> 3 Days (Automated DOE and Optimization by iSIGHT)
±0.08 --> ±0.03
SN Ratio Improvement:
25.7db --> 34.6db
Hitachi Semiconductor Group:
Robust Design of MOS Devices:DOE based TCAD Simulation
Gate
Electrode
○
Source
Electrode
Drain
Electrode
○
○
N
N
Id
P
Si Board
MOS Device Concept(NMOS )
Model Parameter
(Process)
Process Flow
Process
Simulation
Model Parameter
(Device)
Impurities
Distribution
Device
Simulation
Process Device Simulation
Device
Characteristics
SAIT (Samsung Advanced Institute & Technology)
■ MEMS Switching Device Design
•
Problem Definition
– 4 D.V.s for the membrane geometry
– Must consider unwanted effects in manufacturing process
– Minimize the actuation voltage of switch and maximize the recovery force
– Highly non-linear property in relation between voltage and gap
Switch On
Switch Off
SAIT (Samsung Advanced Institute & Technology)
■ Process to Design
•
•
Maintask
– Input 4 geometric design variables to Ansys for modeling
– This model is provided for analysis of actuation voltage
Subtask
– From the geometry model and unwanted effects data, Abaqus and inhouse codes calculate the gap based on the voltage input and check the
membrane is contacted or not.
Due to the long running of Abaqus
the actuation voltage must be found under 10
iterations in subtask by applying an optimization
algorithm in a program.
Traditional gradient based optimization
algorithms do not work because it’s very highly
non-linear.
SAIT (Samsung Advanced Institute & Technology)
■ Simulation of problem
•
•
Made simple simulation model of the actuation voltage problem by using
Excel Interface
Hooke-Jeeves algorithm is good for this problem
SAIT (Samsung Advanced Institute & Technology)
■ RSM Model
•
•
•
Built RSM model by applying DOE in main task and finding the actuation
voltage in subtask
Tried to find minimized value
Tried to analyze uncertainties in manufacturing process by applying MCS for
the minima