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MODERN WP5 June Meetings Test structures and demonstrators Project Review Meeting Crolles, June 22-23, 2009 23/05/2017 1 Contact List WP5 Manager T5.1 Task leader Task participants T5.2 Task leader Task participants (timing analysis) (substrate noise) T5.3 Task leader Task participants Loris Vendrame NMX [email protected] +39 039 603 6818 Ehrenfried Seebacher Alexander Steinmair Peter Söser Aurelie Bajolet Loris Vendrame AMS AMS TUGI ST-F2 NMX [email protected] [email protected] [email protected] [email protected] [email protected] +43 3136 500 5487 +43 3136 500 5617 [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] [email protected] +43 5 1777 6779 Edit BEIGNE Francesc Moll Marc Renaudin Boris Ljevar Sergei Kapora Philippe Bonnot Arnaud Grasset Peter Söser IFXA LETI UPC TMPO NXP NXP THL THL TUGI Ronald Gull Jan ter Maten Philippe Bonnot Arnaud Grasset Angelo Ciccazzo SNPS NXP THL THL ST-I [email protected] [email protected] [email protected] [email protected] [email protected] +41 44 567 1512 Project Review Meeting Crolles, June 22-23, 2009 +33 4 38 92 23 60 +39 039 603 6818 +34 934016846 +33 4 76 61 10 00 +33 1 69 41 60 59 +33 1 69 41 60 55 +33 1 69 41 60 59 +33 1 69 41 60 55 +39 0957 403179 23/05/2017 2 WP2 Task Leaders WP5 NMX [email protected] T5.1 AMS [email protected] T5.2 IFXA [email protected] T5.3 SNPS [email protected] Project Review Meeting Crolles, June 22-23, 2009 23/05/2017 3 WP5 T5.1 Purpose and links • Test structures for PV analysis: design, implementation and characterization • Links: – AMS and TUGI is working in close relationship in WP5 T5.1 and T5.2. – In T5.1 PV will be analyzed with PCM test structures concentrating on analog/HV design requirements. – Tools which are developed in WP2 concerning PV and reliability for HV LDMOS transistors will be benchmarked in WP5 T5.2. This work will be done in cooperation of AMS,TUGI and TUW. – NMX and STF are in touch for matching test structures for possible cooperation – NMX is working together UNET sharing the results within T2.3 • . Project Review Meeting Crolles, June 22-23, 2009 23/05/2017 4 WP5 T5.1 Review • • Company/Contributor: AMS/TUGI Status/plan – # review of the present test structures and split in categories like reliability parameter, design parameter etc. – # check the requirements for analog design • • • • • • • • • Specifications: – Process Control Monitor structures including additional analog parameter test structures – Technology: HV CMOS: concentrating on MOS and LDMOS transistors -o-o-oCompany/Contributor: STF Status/plan – the review of the matching structures is ongoing among them Kelvin structures versus traditional structures, impact of WPE... – It should be ready for M12 delivery Specifications: – Technology: mainly 45nm -o–o–oCompany/Contributor: NMX Status/plan: – available test structures (focus on logic devices for analogue NVM circuits) are under investigation; results are bring back into T2.3 and analized in cooperation with UNET Specifications: – Technology: different NVM technologies nodes (for logic devices gate oxide in 30 to 300A range) Issues Interaction need with other: Project Review Meeting Crolles, June 22-23, 2009 23/05/2017 5 WP5 T5.2 Purpose and links • Demonstrator: design, implementation and characterization • Links: – TUGI: Tools which are developed in WP2 concerning PV and reliability for HV LDMOS transistors will be benchmarked in WP5 T5.2. This work will be done in cooperation of AMS,TUGI and TUW. – IFAT is working on demonstrators and test structures to verify developed monitor and control concepts to compensate for degradation/aging effects and degradation/aging induced process variations in analog, mixed-signal and RF circuits. The work is closely linked to Task 3.3. Demonstrators will be fabricated at foundries. – TIEMPO link with WP4 results. 65 or 45nm silicon (TBD) – LETI with WP3 and T4.1 and T4.2 ; 32nm silicon – NXP link within WP3 – UPC involved in WP3 and WP4 – THALES involved in T4.3 and ISD • . Project Review Meeting Crolles, June 22-23, 2009 23/05/2017 6 • • • WP5 T5.2 Review Company/Contributor: TUGI (AMS) AMS, TUGI and TUW is working in close relationship. Demonstrator design is related to the developed tools in WP2 where AMS and TUW work on variability and reliability simulation of LDMOS transistors. The demonstrator will verify the developed Silicon and TCAD based SPICE parameter sets which describe degradation effects and variability. Demonstrator production will be done at AMS fabrication. Specifications: – demonstrator test structures for PV aware and lifetime-critical circuits – Technology: HV CMOS o-o-o- • • Company/Contributor: IFAT General target for IFAT: development and verification of monitor and control strategies to compensate for degradation/aging effects and degradation/aging induced process variations in analog, mixed-signal and RF circuits. Concept and design aspects are covered in Task 3.3 whereas implementation • Specifications: – Technology: 65nm and/or 32nm and/or 28nm low-power CMOS at foundries l Project Review Meeting Crolles, June 22-23, 2009 23/05/2017 7 • • • WP5 T5.2 Review Company/Contributor: TIEMPO Tiempo work in WP5 starts in the second year of the project. However, all the work planned during this first year in WP4 and which is a prerequisite for the second year WP5 work is on schedule. TIEMPO will be using its innovative asynchronous design technology to fabricate a prototype test vehicle of a significant complexity, for example a microcontroller based system, in order to demonstrate the variability tolerance and low noise/electromagnetic emission level that can be achieved Specifications – The targeted technology so far is 65nm or 45 nm. • Company/Contributor: LETI • From a « power aware » scheme to an « adaptive variation aware » proposal for optimal PPY trade-off.: • Specification: Technology is 32nm Project Review Meeting Crolles, June 22-23, 2009 23/05/2017 8 WP5 T5.2 Review • Company/Contributor: NXP • Status/Plans: – timing analysis (T3.2 to be confirmed) – substrate noise (T3.4 to be confirmed) • • – -o–o–oCompany/Contributor: UPC Status/plan: adaptive voltage scaling / regular design – -o–o–o- Project Review Meeting Crolles, June 22-23, 2009 23/05/2017 9 • WP5 T5.2 Review Company/Contributor: THALES – a) The specific work to be done in WP5 for our side is to check by simulation the multiprocessing execution models in order to demonstrate the solutions developed in WP4. Programming tools are also considered. – b) The list of tools and models concerning the architecture level that we address includes mainly the model of a fault-tolerant multiprocessing architecture. Models of faults will be required to permit to take into consideration the technology. Technology characteristics are therefore expected to build these models. Project Review Meeting Crolles, June 22-23, 2009 23/05/2017 10 WP5 T5.3 Purpose and links • Software demonstrator and tool prototype • Links: – THALES activities related to T4.3 and T4.5, cooperation mainly within T4.3 (ISD) Platform to be choose within WP4 – SYNOPSYS links to T2.2 activities – STI links to WP2 activities – NXP links to WP3 activities (T3.1) Project Review Meeting Crolles, June 22-23, 2009 23/05/2017 11 • WP5 T5.3 Review Company/Contributor: THALES – a) The specific work to be done in WP5 for our side is to check by simulation the multiprocessing execution models in order to demonstrate the solutions developed in WP4, including programming tools. – b) Tools will be developed to take into account reliability requirements in the design space exploration on the multiprocessing platform. – c) The objective of the demonstration platform is to enhance the reliability of processing solution used for critical systems. These systems indeed require predictable behaviors and performance guarantees. The process variations will cause some malfunctions (degraded performances, out-of-service element, etc) in processing nodes and in communication network. The platform definition aims at improving the reliability in spite of these malfunctions. Project Review Meeting Crolles, June 22-23, 2009 23/05/2017 12 WP5 T5.3 Review • Company/Contributor: NXP • Status/Plans: – MOR [parameterized Model Order Reduction (MOR) methods that preserve accuracy and stability (passivity) for large linear R, RC, RCL systems and the effectiveness to reduce problem sizes of large Multiple Input Multiple Output (MIMO) systems] • • • • – -o–o–oCompany/Contributor: STI Status/plan: prototype PDK – -o–o–oCompany/Contributor: SYNOPSYS Status/plan: will provide prototype implementation of the new methods to the partners focusing on the physical modeling of PV effects in the device modeling tool (geometrical variation model) M24 Project Review Meeting Crolles, June 22-23, 2009 23/05/2017 13 WP5 ISSUES • WP5 is strictly related to WP2/3/4 strengthening links with WPs possible deliverable overlapping, proposal: – in WP5 just description and result ‘list’ – spec in WP1, major results and analysis within related WPs • Some Silicon issues: UPC, IMEP, LIRM founded for 45nm CMP silicon but IMEP/LIRM not in WP5 need of coordination among WPs (no change request [possible different funding for demonstrators], some national reviewers pointed out that that major companies should have demonstrators) Project Review Meeting Crolles, June 22-23, 2009 23/05/2017 14 WP5 analysis • Silicon con’t: -some cluster of ‘self-consistent’ cooperative work and silicon also from companies: • • • • AMS / TUG / TUW NMX / UNET STF / NMX IFXA (foundries) • First deliverables on M12 Project Review Meeting Crolles, June 22-23, 2009 23/05/2017 15