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Mini-Burst Generators Set P1 MINIBURST GENERATORS P11 P12 P21 Generation of Burst/ESD equivalent pulse fields of extremely high field strength! Application to electronic units Precise locating of weak points in burst immunity For noise immunity tests during the development Precondition for reducing complex installations of shielding and filtering by corrective measures in the layout and fitting area Side 6 Mini-Burst Generators Set P1 Technical data Pulser P 21 Electric P 11 Magnetic P 12 Clip-on probe Magnetic Field strenth ap. 100 kV/m approx 1 mT approx 1mT Pulse rise time adjustable 1 ns - 10 ns Pulse frequency single impuls or 5 kHz Dimension 118x24x13 mm Weight 30 g Battery 1,5 Volt Micro Switch 5 kHz / Single pulse Battery check Start Switch Polarity Fields of application: Weak points in the geometrical structure of the layout Field source Sensitivity of signal lines Layout of signal conducting paths Pulse width /Steepness Configuration of the GND system Configuration of the auxiliary power system Generates magnetic und electric pulse field separately For the solution of noise immunity problems, it is essential to know the type of the weak point. E- and B-fields must be applied separately to enable a selection. The E-pulser generates an electric and the B-pulser a magnetic pulse field. New strategy Incompatibilities discovered during reviews for conformance with standards according to EN 1000-4-4 (burst) generally can only be eliminated with a greater expense of filters and shielding material. A new, costsaving way is the application of field sources. It becomes possible to locate the weak point responsible for the incompatibility with special probes (field sources). Such a weak point can consist of one individual conducting path in a complete device. Why equip the entire device with expensive shielding and filtering just for one conducting path? It is sufficient to detect the critical conducting path section and eliminate the weak point with a targeted layout change. This method reduces development and production costs. Robustness of components, inputs, outputs, Vcc Design and assignment of connectors Ribbon cables Serial connections Function principle: At the tip of the probe, a local pulse field of extremely high field strength and steepness is generated. This pulse field corresponds to the field which occurs at burst- and ESD-processes distributed across electronic units. It is possible to locate weak points in noise immunity with the locally emitted pulse field. Aim: Weak points are mostly limited to a small area of the unit surface. The aim of the application of MINI burst generators is to detect the weak points with small, locally acting field sources and locate them precisely in the component and layout area. Expensive screening and filtering measures can be replaced by almost cost-free corrective measures introduced in the unit. Side 7 Set P1 Contents: B-Field source P 11 B- Field source P 12 E- Field source Instructions Case P 21 Clip-on ammeter / Sensitivity tester (175x140x32) mm The three MINI-burst generators are also available separately. MINI- B URST G ENERATORS Application Description Design B-Pulser P 11 The magnetic field source generates a very fine B-field beam which is emitted from the tip of the probe ( 1 mm). It is suitable for localizing spread and point-shaped weak points. The surface of printed circuit boards and components is scanned with the field beam. Due to the small diameter and the sharp focussing of the beam, a high resolution is possible. Critical conducting path sections, components and component connections can be localized. B-Pulser P 12 The magnetic field source generates a very fine B-field beam which is emitted from the tip of the probe ( 1 mm). It is suitable for localizing spread and point-shaped weak points. The surface of printed circuit boards and components is scanned with the field beam. Due to the small diameter and the sharp focussing of the beam, a high resolution is possible. Critical conducting path sections, components and component connections can be localized. E-Pulser P 21 The E-field source has a narrow, linear-shaped probe head and is designed for detecting weak points in the conducting path and component area of units. It is suitable for E-field injection on conducting paths, wires, pins and components; especially on individual SMD components such as resistors and capacitors. For the E-field injection, the probe is placed with its linear-shaped head upon individual conducting paths, SMD- or wired components. Individual plug-in contacts and individual cores of ribbon cables can also be examined. LANGER EMV-Technik GmbH Nöthnitzer Hang 31 DE-01728 Bannewitz Fon: +49(0)351/430093-0 / Fax: -22 [email protected] / www.langer-emv.de Side 8 Field Source Sets H1 / H2 / H3 FIELD SOURCE SET E and B field sources to track weak points in noise immunity TECHNICAL DATA: Energizing voltage: Burst acc. EN 61000-4-4 max. voltage: 4,5 kV Plug type connector: SHV or Fischer S 103 A (Please state the plug type in your order!) Features: The noise immunity imperfections detected at standard tests may be exactly located and eliminated Generation of pulsating electrical and magnetic fields Application for modules, components, conductors and ICs Suited for the connection to a burst generator according to EN 61000-4-4 Convenient handling by pencil shape, light plug-type cable with snap-action coupling Side 9 Set H1 Contents: B- field source BS 02 (h) B- field source BS 04 DB(h) E- field source ES 02 (h) High-voltage cable - with SHV or Fischer plug connector available. Please state the plug type in your order! Instruction Case: 338x260x57 mm FUNCTION PRINZIPLE: At noise immunity tests for the CE certificate interference voltage is applied to the test sample and interference current is fed via an artificial mains network or coupling tongs. The interference currents and voltages distribute across cables, design elements and plug-type connectors up to the electronic modules. There, they generate electrical and magnetic pulsating fields. The pulsating fields acting on the module surfaces are responsible for the incompatibility of devices. OBJECTIV: Imperfections are often limited to a small range of the module surface. The application target is to detect the imperfections with small, locally acting field sources and to accurately locate them in the component and layout range. Almost cost-free correction measures integrated in the module may be substituted for expensive shielding and filter measures. APPLICATION: The E/B-field probes are field sources for the connection to common burst generators. Because of their shape and size (length approximately 150 mm) the probes can be easily handled like a pencil. A highly flexible cable (diameter 2.8 mm, included in the probe kit) that is connected to the appropriate probe via a voltage-proof miniature plug ensures an easy directing of the probe. F IELD S OURCE S ET H 1 Application Description Design BS 02 This magnetic field source generates a B-field bundle with a diameter > 5 cm. It is suited for both device and module tests. According to the probe size large shell surfaces and internal areas, bonding system, modules with conductor structure, and ICs can be pulsed and thus magnetic sensitive imperfections can be tracked. BS 04 DB This field source generates a B-field bundle within a range of millimeter s (diameter > 3 mm). The surface of printed circuit boards is scanned with the field beam emerged at the front of the probe. This allows the elimination of magnetic imperfections in the layout and insertion range. Critical sections of conductors, components and component connections can be located. ES 02 With its tip, the E-field probe can be used for the localization of electric-field-sensitive small imperfections (conductors, quartzes, pull-up resistors, ICs). The surface of the field source is intended for large-surface excitation of shell surfaces and interior spaces, bonding system and modules with conductor structures and ICs (e.g. bus systems, LC displays). Side 10 Set H2 Contents: B-field source B-field source B-field source E-field source E-field source E-field source BS 02 (h) BS 04 DB (h) BS 05 DB (h) ES 00 (h) ES 02 (h) ES 05 D (h) High-voltage cable - with SHV or Fischer plug connector available. Please state the plug type in your order! Instruction Case: 338x260x57 mm F IELD S OURCE S ET H 2 Application Description Design BS 02, BS 04 DB, ES 02 These field sources are included in the kit H1 and described there. BS 05 DB The magnetic field source generates a very fine B-field beam (diameter >1 mm) emerging from the probe tip. Thereby it is suited for the localization of point imperfections. The surface of printed circuit boards and components is scanned with the field beam. The small diameter and the high degree of focusing allows a high resolution. Locate the imperfection coarsely with the probe BS 02 or BS 04 DB before using the field source BS 05 DB. ES 00 Large-surface electrical excitation is possible with this field source (1.5 dm2). Electrically sensitive imperfections often extent two-dimensionally across 10 up to 15 cm of a module (LCD display, bus systems). These imperfections do not react on small field sources. Largesurface field sources such as the ES 00 are required to detect such imperfections. The probe can also be used for the excitation of shells. ES 05 D The E-field source has a narrow lentiform probe head and is intended for imperfection tracking in the conductor and component range. It is especially suited for the E-field excitation of conductors, wires, pins and components, especially for individual SMD components such as resistors and capacitors. For purpose of E-field excitation, the probe is placed onto individual conductors, SMD or wired components. Also individual plug contacts or individual conductors of flat band cables can be tested. Side 11 Set H3 Contents: B-field source B-field source B-field source B-field source B-field source E-field source E-field source E-field source E-field source BS 02 BS 04 DK BS 05 DB BS 04 DB BS 05 DU ES 00 ES 01 ES 02 ES 05 D (h) (h) (h) (h) (h) (h) (h) (h) (h) High-voltage cable - with SHV or Fischer plug connector available. Please state the plug type in your order! Instruction Case: 338x260x57 mm F IELD S OURCE S ET H 3 Application Description Design BS 02, BS 04 DB, BS 05 DB, ES 00, ES 02 , ES 05 D These field sources are included in the kits H1/H2 and described there BS 04 DK The magnetic field source BS 04 DK works like current coupling tongs. The field source is placed onto cables, wires, individual components and individual broad conductors for purpose of disturbance current feeding. By doing so, the probe generates a local circular pulsating field that surrounds the tested object and generates a disturbance current flow by induction. In contrast to the standard test at which the interference current flows through the whole test piece the probe selectively drives the current through the selected current path. With this field source, interference current paths, sensitive lines and components can be assessed. BS 05 DU The magnetic field probe, type BS 05 DU, generates a tiny circular pulsating magnetic field (millimeter range). It can be placed onto individual conductors, IC-pins, SMD components, thin wires (flat band cable) as mini coupling tongs for selective interference current and voltage excitation. A module (test piece) has often a large number of insensitive and some few sensitive signal connections (conductors, ICpins). The sensitive ones can be quickly detected by the probe and may be protected by appropriate layout changes. ES 01 With this field source, large-surface electric couplings are possible. The probe is suited for the pulsing of sensitive areas in the range between 5 and 10 cm and can be ranked between field source ES 02 and ES 00 (see belonging description). For this application, the source ES 02 might be too small and the ES 00 too large. LANGER EMV-Technik GmbH Nöthnitzer Hang 31 DE-01728 Bannewitz Fon: +49(0)351/430093-0 / Fax: -22 [email protected] / www.langer-emv.de Side 12