Download MINI- P11 P12 P21

Mini-Burst Generators Set P1
MINIBURST GENERATORS
P11 P12
P21
Generation of Burst/ESD equivalent pulse fields of extremely
high field strength!
Application to electronic units
Precise locating of weak points in burst immunity
For noise immunity tests during the development
Precondition for reducing complex installations of shielding and filtering by
corrective measures in the layout and fitting area
Side
6
Mini-Burst Generators Set P1
Technical data
Pulser
P 21
Electric
P 11
Magnetic
P 12
Clip-on probe
Magnetic
Field strenth
ap. 100 kV/m
approx 1 mT
approx 1mT
Pulse rise time
adjustable
1 ns - 10 ns
Pulse frequency
single impuls or 5 kHz
Dimension
118x24x13 mm
Weight
30 g
Battery
1,5 Volt Micro
Switch
5 kHz / Single pulse
Battery check
Start
Switch
Polarity
Fields of application:
Weak points in the geometrical structure of the layout
Field source
Sensitivity of signal lines
Layout of signal conducting paths
Pulse width
/Steepness
Configuration of the GND system
Configuration of the auxiliary power system
Generates magnetic und electric pulse
field separately
For the solution of noise immunity problems, it is
essential to know the type of the weak point. E- and
B-fields must be applied separately to enable a
selection. The E-pulser generates an electric and
the B-pulser a magnetic pulse field.
New strategy
Incompatibilities
discovered
during
reviews
for
conformance with standards according to EN 1000-4-4
(burst) generally can only be eliminated with a greater
expense of filters and shielding material. A new, costsaving way is the application of field sources. It becomes
possible to locate the weak point responsible for the
incompatibility with special probes (field sources). Such a
weak point can consist of one individual conducting path
in a complete device. Why equip the entire device with
expensive shielding and filtering just for one conducting
path? It is sufficient to detect the critical conducting path
section and eliminate the weak point with a targeted
layout change. This method reduces development and
production costs.
Robustness of components, inputs, outputs, Vcc
Design and assignment of connectors
Ribbon cables
Serial connections
Function principle:
At the tip of the probe, a local pulse field of extremely high field strength and steepness is generated.
This pulse field corresponds to the field which
occurs at burst- and ESD-processes distributed
across electronic units. It is possible to locate weak
points in noise immunity with the locally emitted
pulse field.
Aim:
Weak points are mostly limited to a small area of the
unit surface. The aim of the application of MINI burst
generators is to detect the weak points with small,
locally acting field sources and locate them precisely
in the component and layout area. Expensive
screening and filtering measures can be replaced by
almost cost-free corrective measures introduced in
the unit.
Side
7
Set P1
Contents:
B-Field source
P 11
B- Field source
P 12
E- Field source
Instructions
Case
P 21
Clip-on ammeter /
Sensitivity tester
(175x140x32) mm
The three MINI-burst generators are also available separately.
MINI- B URST G ENERATORS
Application
Description
Design
B-Pulser P 11
The magnetic field source generates a
very fine B-field beam which is emitted from the tip of the
probe (
1 mm). It is suitable for localizing spread and
point-shaped weak points. The surface of printed circuit
boards and components is scanned with the field beam. Due
to the small diameter and the sharp focussing of the beam, a
high resolution is possible. Critical conducting path sections,
components and component connections can be localized.
B-Pulser P 12
The magnetic field source generates a
very fine B-field beam which is emitted from the tip of the
probe (
1 mm). It is suitable for localizing spread and
point-shaped weak points. The surface of printed circuit
boards and components is scanned with the field beam. Due
to the small diameter and the sharp focussing of the beam, a
high resolution is possible. Critical conducting path sections,
components and component connections can be localized.
E-Pulser P 21
The E-field source has a narrow,
linear-shaped probe head and is designed for detecting
weak points in the conducting path and component area of
units. It is suitable for E-field injection on conducting paths,
wires, pins and components; especially on individual SMD
components such as resistors and capacitors. For the E-field
injection, the probe is placed with its linear-shaped head
upon individual conducting paths, SMD- or wired
components. Individual plug-in contacts and individual cores
of ribbon cables can also be examined.
LANGER
EMV-Technik GmbH
Nöthnitzer Hang 31
DE-01728 Bannewitz
Fon: +49(0)351/430093-0 / Fax: -22
[email protected] / www.langer-emv.de
Side
8
Field Source Sets H1 / H2 / H3
FIELD SOURCE SET
E and B field sources to track weak points in noise immunity
TECHNICAL DATA:
Energizing voltage: Burst acc. EN 61000-4-4
max. voltage:
4,5 kV
Plug type connector: SHV or Fischer S 103 A
(Please state the plug type in your order!)
Features:
The noise immunity imperfections detected at standard tests may be exactly
located and eliminated
Generation of pulsating electrical and magnetic fields
Application for modules, components, conductors and ICs
Suited for the connection to a burst generator according to EN 61000-4-4
Convenient handling by pencil shape, light plug-type cable with snap-action
coupling
Side
9
Set H1
Contents:
B- field source BS 02 (h)
B- field source BS 04 DB(h)
E- field source ES 02 (h)
High-voltage cable - with SHV or Fischer
plug connector available.
Please state the plug type in your order!
Instruction
Case: 338x260x57 mm
FUNCTION PRINZIPLE: At noise immunity tests for the CE certificate interference voltage is applied to the test sample and
interference current is fed via an artificial mains network or coupling tongs. The interference currents and voltages distribute
across cables, design elements and plug-type connectors up to the electronic modules. There, they generate electrical and
magnetic pulsating fields. The pulsating fields acting on the module surfaces are responsible for the incompatibility of
devices.
OBJECTIV: Imperfections are often limited to a small range of the module surface. The application target is to detect the
imperfections with small, locally acting field sources and to accurately locate them in the component and layout range.
Almost cost-free correction measures integrated in the module may be substituted for expensive shielding and filter
measures.
APPLICATION: The E/B-field probes are field sources for the connection to common burst generators. Because of their
shape and size (length approximately 150 mm) the probes can be easily handled like a pencil. A highly flexible cable
(diameter 2.8 mm, included in the probe kit) that is connected to the appropriate probe via a voltage-proof miniature plug
ensures an easy directing of the probe.
F IELD S OURCE S ET H 1
Application
Description
Design
BS 02 This magnetic field source generates a B-field
bundle with a diameter > 5 cm. It is suited for both device
and module tests. According to the probe size large shell
surfaces and internal areas, bonding system, modules
with conductor structure, and ICs can be pulsed and thus
magnetic sensitive imperfections can be tracked.
BS 04 DB This field source generates a B-field bundle
within a range of millimeter s (diameter > 3 mm). The
surface of printed circuit boards is scanned with the field
beam emerged at the front of the probe. This allows the
elimination of magnetic imperfections in the layout and
insertion range. Critical sections of conductors,
components and component connections can be located.
ES 02 With its tip, the E-field probe can be used for the
localization of electric-field-sensitive small imperfections
(conductors, quartzes, pull-up resistors, ICs). The
surface of the field source is intended for large-surface
excitation of shell surfaces and interior spaces, bonding
system and modules with conductor structures and ICs
(e.g. bus systems, LC displays).
Side
10
Set H2
Contents:
B-field source
B-field source
B-field source
E-field source
E-field source
E-field source
BS 02 (h)
BS 04 DB (h)
BS 05 DB (h)
ES 00 (h)
ES 02 (h)
ES 05 D (h)
High-voltage cable - with SHV or Fischer
plug connector available.
Please state the plug type in your order!
Instruction
Case: 338x260x57 mm
F IELD S OURCE S ET H 2
Application
Description
Design
BS 02, BS 04 DB, ES 02
These field sources are
included in the kit H1 and described there.
BS 05 DB The magnetic field source generates a very fine
B-field beam (diameter >1 mm) emerging from the probe
tip. Thereby it is suited for the localization of point
imperfections. The surface of printed circuit boards and
components is scanned with the field beam. The small
diameter and the high degree of focusing allows a high
resolution.
Locate the imperfection coarsely with the probe BS 02 or
BS 04 DB before using the field source BS 05 DB.
ES 00 Large-surface electrical excitation is possible with
this field source (1.5 dm2). Electrically sensitive
imperfections often extent two-dimensionally across 10 up
to 15 cm of a module (LCD display, bus systems). These
imperfections do not react on small field sources. Largesurface field sources such as the ES 00 are required to
detect such imperfections. The probe can also be used for
the excitation of shells.
ES 05 D The E-field source has a narrow lentiform probe
head and is intended for imperfection tracking in the
conductor and component range. It is especially suited for
the E-field excitation of conductors, wires, pins and
components, especially for individual SMD components
such as resistors and capacitors. For purpose of E-field
excitation, the probe is placed onto individual conductors,
SMD or wired components. Also individual plug contacts or
individual conductors of flat band cables can be tested.
Side
11
Set H3
Contents:
B-field source
B-field source
B-field source
B-field source
B-field source
E-field source
E-field source
E-field source
E-field source
BS 02
BS 04 DK
BS 05 DB
BS 04 DB
BS 05 DU
ES 00
ES 01
ES 02
ES 05 D
(h)
(h)
(h)
(h)
(h)
(h)
(h)
(h)
(h)
High-voltage cable - with SHV or Fischer
plug connector available.
Please state the plug type in your order!
Instruction
Case: 338x260x57 mm
F IELD S OURCE S ET H 3
Application
Description
Design
BS 02, BS 04 DB, BS 05 DB, ES 00, ES 02 , ES 05 D
These field sources are included in the kits H1/H2 and
described there
BS 04 DK The magnetic field source BS 04 DK works like
current coupling tongs. The field source is placed onto cables,
wires, individual components and individual broad conductors
for purpose of disturbance current feeding. By doing so, the
probe generates a local circular pulsating field that surrounds
the tested object and generates a disturbance current flow by
induction. In contrast to the standard test at which the
interference current flows through the whole test piece the
probe selectively drives the current through the selected
current path. With this field source, interference current paths,
sensitive lines and components can be assessed.
BS 05 DU
The magnetic field probe, type BS 05 DU,
generates a tiny circular pulsating magnetic field (millimeter
range). It can be placed onto individual conductors, IC-pins,
SMD components, thin wires (flat band cable) as mini coupling
tongs for selective interference current and voltage excitation.
A module (test piece) has often a large number of insensitive
and some few sensitive signal connections (conductors, ICpins). The sensitive ones can be quickly detected by the probe
and may be protected by appropriate layout changes.
ES 01 With this field source, large-surface electric couplings
are possible. The probe is suited for the pulsing of sensitive
areas in the range between 5 and 10 cm and can be ranked
between field source ES 02 and ES 00 (see belonging
description). For this application, the source ES 02 might be
too small and the ES 00 too large.
LANGER
EMV-Technik GmbH
Nöthnitzer Hang 31
DE-01728 Bannewitz
Fon: +49(0)351/430093-0 / Fax: -22
[email protected] / www.langer-emv.de
Side
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