Download Pulsed laser testing for Single-event transient

Pulsed laser testing for simulating Single-event transient induced
by heavy ions
Motivations to use lasers:
1. Accessibility and cost of ion beam facility: Particle accelerator is needed for ion beam
testing. It is difficult to be set up in a regular laboratory. It also doesn’t comply with
industrial demands for radiation hardness assurance.
2. Laser beam exhibits higher temporal and spatial resolution compared with heavy ions. It
causes less damage to the material and is therefore more repetitive.
What can we learn from pulsed laser
testing:
Example of transient pulses induced by
ion beam, laser and simulation:
1. Single transistor level study (Current
research direction) :
Study the transient voltage and current
produced; Understand the charge generation,
transport and collection mechanism;
Understand the impact of defects on the
charge transport …
2. Circuit level study:
Identify the most sensitive (vulnerable) node in
an IC and determine the device failure cross
section
Figure courtesy of Pease et al.
Ion microbeam testing
Motivation: For space and defense applications. ( In cosmic rays, ~89% are protons, ~9%
are alpha particles, 1% are the nuclei of heavier elements)
What can we learn from ion beam testing:
1.Displacement damage induced by heavy ions;
2.Transient charge collection induced by heavy ions;
3.For ICs, we can learn various device failure cross sections (Single Event upset, single
event latchup, single event burnout…) as a function of particle energy or LET (linear
energy transfer: energy deposition per unit distance)
Laser testing Vs. Ion beam testing
Buchner et al. NRL laser setup
Image: Michigan Ion beam laboratory