Survey
* Your assessment is very important for improving the workof artificial intelligence, which forms the content of this project
* Your assessment is very important for improving the workof artificial intelligence, which forms the content of this project
Pulsed laser testing for simulating Single-event transient induced by heavy ions Motivations to use lasers: 1. Accessibility and cost of ion beam facility: Particle accelerator is needed for ion beam testing. It is difficult to be set up in a regular laboratory. It also doesn’t comply with industrial demands for radiation hardness assurance. 2. Laser beam exhibits higher temporal and spatial resolution compared with heavy ions. It causes less damage to the material and is therefore more repetitive. What can we learn from pulsed laser testing: Example of transient pulses induced by ion beam, laser and simulation: 1. Single transistor level study (Current research direction) : Study the transient voltage and current produced; Understand the charge generation, transport and collection mechanism; Understand the impact of defects on the charge transport … 2. Circuit level study: Identify the most sensitive (vulnerable) node in an IC and determine the device failure cross section Figure courtesy of Pease et al. Ion microbeam testing Motivation: For space and defense applications. ( In cosmic rays, ~89% are protons, ~9% are alpha particles, 1% are the nuclei of heavier elements) What can we learn from ion beam testing: 1.Displacement damage induced by heavy ions; 2.Transient charge collection induced by heavy ions; 3.For ICs, we can learn various device failure cross sections (Single Event upset, single event latchup, single event burnout…) as a function of particle energy or LET (linear energy transfer: energy deposition per unit distance) Laser testing Vs. Ion beam testing Buchner et al. NRL laser setup Image: Michigan Ion beam laboratory