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Course Information Course title Semester Department Instructor Administrative Curriculum Number Teaching Curriculum Number Materials Applications and Analyses in High-Tech Industry 100-2 Institute of Applied Mechanics Jian-Zhang Chen 543EM5240 AM7058 Class Credits 3 Full/Half Yr. Half Yr. Required/Elective Elective Time Remarks Ceiba Web Server Fri567 The upper limit of the number of students: http://ceiba.ntu.edu.tw/1002MaterialAnalysis Table of Core Capabilities and Curriculum Planning Course Syllabus Material analysis tools are essential in the research and development of many devices, such as MEMS, LEDs, solar cells, displays, biomedical products, engineering materials, electronic devices, etc. It is important to understand the functions and limitations of each material analysis tool in order to develop good devices. Therefore, in this course, we will emphasize on the material analysis tools, including microstructure analysis, surface analysis, and chemical analysis. The content will cover SEM, TEM, X-ray diffraction, wavelength dispersion spectroscopy Course Description (WDS), energy dispersion spectroscopy (EDS), photoluminescence (PL), electroluminescence (EL), X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), X-ray fluorescence (XRF), secondary ion mass spectroscopy (SIMS), AFM, atomic absorption spectrometry, optical emission spectrometry, fourier transform infrared spectrometer (FTIR), Raman spectroscopy, thermogravimetric analysis (TGA), differential thermal analysis (DTA), calorimetry (DSC), microthermal analysis, etc. differential scanning Students will need to select one topic to study extensively and deeply. Presentations and discussions will be given in classes. We will discuss the applications of analysis tools in research. In this course, students will learn materials analysis tools, and their Course Objective applications to material engineering. The target is to help students build up insights for material application, to train students using the materials R&D to improve the competitiveness in material development. General physics, Course Requirement General chemistry, Engineering Mathematics Office Hours ☆ Scanning Electron Microscopy and X-ray Microanalysis, R. E. Lee, PrenticeHall, 1993. ☆ Elements of X-ray Diffraction, B. D. Cullity, Addison Wesley. ☆ Principles of instrumental analysis, by D. A. Skoog, F. J. Holler, S. R. Crouch, Belmont, CA: Thomson Brooks/Cole, 2007. Instrumental Methods of Analysis, H. H. Willard, L. L. Merritt Jr, J. A. References Dean, F. A. Settle Jr., Wadsworth. Surface analysis techniques and applications, edt by W. Neagle, D. R. Randell, Cambridge, Royal Society of Chemistry, 1990. An introduction to surface analysis by XPS and AES, by J. F. Watts and J. Wolstenholme, New York: J. Wiley, 2003. 材料分析,汪建民 Designated reading No. Grading Item % 1. Final project report 30% 2. Oral presentation and discussion 50% Explanations for the conditions 3. In-class participation and discussion Progress Week Date Topic Week 1 Introduction Week 2 Materials Fundamentals: Introduction Week 3 Materials Fundamentals: Introduction Week 4 Elementary Quantum Physics Week 5 Elementary Quantum Physics Week 6 Materials analysis: Microstructure analysis Week 7 Materials analysis: Microstructure analysis Week 8 Materials analysis: Microstructure analysis Week 9 Materials analysis: Microstructure analysis Week 10 Materials analysis: Surface analysis Week 11 Materials analysis: Surface analysis Week 12 Materials analysis: Surface analysis Week 13 Materials analysis: Surface analysis Week 14 Materials analysis: Surface analysis Week 15 Materials analysis: Chemical analysis Week 16 Materials analysis: Chemical analysis Week 17 Materials analysis: Chemical analysis Week 18 Materials analysis: Chemical analysis 20%