Download Course Information Course title Materials Applications and Analyses

Course Information
Course title
Semester
Department
Instructor
Administrative Curriculum
Number
Teaching Curriculum Number
Materials Applications and Analyses in High-Tech Industry
100-2
Institute of Applied Mechanics
Jian-Zhang Chen
543EM5240
AM7058
Class
Credits
3
Full/Half Yr.
Half Yr.
Required/Elective
Elective
Time
Remarks
Ceiba Web Server
Fri567
The upper limit of the number of students:
http://ceiba.ntu.edu.tw/1002MaterialAnalysis
Table of Core Capabilities and
Curriculum Planning
Course Syllabus
Material analysis tools are essential in the research and development of
many devices, such as MEMS, LEDs, solar cells, displays, biomedical
products, engineering materials, electronic devices, etc. It is important to
understand the functions and limitations of each material analysis tool in
order to develop good devices. Therefore, in this course, we will
emphasize on the material analysis tools, including microstructure
analysis, surface analysis, and chemical analysis. The content will cover
SEM, TEM, X-ray diffraction, wavelength dispersion spectroscopy
Course Description
(WDS), energy dispersion spectroscopy (EDS), photoluminescence (PL),
electroluminescence (EL), X-ray photoelectron spectroscopy (XPS),
Auger
electron
spectroscopy
(AES),
X-ray
fluorescence
(XRF),
secondary ion mass spectroscopy (SIMS), AFM, atomic absorption
spectrometry, optical emission spectrometry, fourier transform infrared
spectrometer (FTIR), Raman spectroscopy, thermogravimetric analysis
(TGA),
differential
thermal
analysis
(DTA),
calorimetry (DSC), microthermal analysis, etc.
differential
scanning
Students will need to select one topic to study extensively and deeply.
Presentations and discussions will be given in classes. We will discuss
the applications of analysis tools in research.
In this course, students will learn materials analysis tools, and their
Course Objective
applications to material engineering. The target is to help students build up
insights for material application, to train students using the materials R&D to
improve the competitiveness in material development.
General physics,
Course Requirement
General chemistry,
Engineering Mathematics
Office Hours
☆ Scanning Electron Microscopy and X-ray Microanalysis, R. E. Lee,
PrenticeHall, 1993.
☆ Elements of X-ray Diffraction, B. D. Cullity, Addison Wesley.
☆ Principles of instrumental analysis, by D. A. Skoog, F. J. Holler, S.
R.
Crouch, Belmont, CA: Thomson Brooks/Cole, 2007.
Instrumental Methods of Analysis, H. H. Willard, L. L. Merritt Jr, J. A.
References
Dean,
F. A. Settle Jr., Wadsworth.
Surface analysis techniques and applications, edt by W. Neagle, D. R.
Randell,
Cambridge, Royal Society of Chemistry, 1990.
An introduction to surface analysis by XPS and AES, by J. F. Watts and
J.
Wolstenholme, New York: J. Wiley, 2003.
材料分析，汪建民
Designated reading
No.
Grading
Item
%
1. Final project report
30%
2.
Oral presentation and
discussion
50%
Explanations for the
conditions
3.
In-class participation and
discussion
Progress
Week
Date
Topic
Week 1
Introduction
Week 2
Materials Fundamentals: Introduction
Week 3
Materials Fundamentals: Introduction
Week 4
Elementary Quantum Physics
Week 5
Elementary Quantum Physics
Week 6
Materials analysis: Microstructure analysis
Week 7
Materials analysis: Microstructure analysis
Week 8
Materials analysis: Microstructure analysis
Week 9
Materials analysis: Microstructure analysis
Week 10
Materials analysis: Surface analysis
Week 11
Materials analysis: Surface analysis
Week 12
Materials analysis: Surface analysis
Week 13
Materials analysis: Surface analysis
Week 14
Materials analysis: Surface analysis
Week 15
Materials analysis: Chemical analysis
Week 16
Materials analysis: Chemical analysis
Week 17
Materials analysis: Chemical analysis
Week 18
Materials analysis: Chemical analysis
20%