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Editorial Changes for 4773 1 2 3 4 5 FROM: Note 12 Related Information 3 describes the available fault current at given piece of equipment in a typical semiconductor facility to be considered during semiconductor equipment and semiconductor facility design. TO: Note 12 Related Information 3 describes the fault current available at equipment points of connection in a typical semiconductor facility. Justification: (If necessary) Note, therefore editorial by definition. FROM: Introduction R3-1.1 R3-1.1 While there are a number of product safety standards specifying short circuit current rating of the equipment or its industrial control panel to be included on the equipment nameplate, they offer no guidance in terms of reasonable target values towards which equipment designers should strive. As a result, end-users of the equipment are often faced with the challenge of installing equipment which has a lower short circuit current rating than the available fault current from the facilities. In an effort to address this challenge, the industry developed a set of descriptions of available fault current values that are likely to exist in a “typical” end-use facility. TO: Introduction R3-1.1 R3-1.1 While there are a number of product safety standards specifying short circuit current rating of the equipment or its industrial control panel to be included on the equipment nameplate, they offer no guidance in terms of reasonable target values towards which equipment designers should strive. As a result, end-users of the equipment are often faced with the challenge of the equipment SCCR and available fault current at the point of connection not being compatible. In an effort to address this challenge, the industry developed a set of descriptions of available fault current values that are likely to exist in a “typical” end-use facility. Justification: (If necessary) Related Information, therefore editorial by definition. FROM: Introduction R3-1.3, 1st paragraph R3-1.3 The following assumptions were used to establish the typical electrical distribution system in a semiconductor manufacturing facility, based on IEEE and ANSI Standards (e.g., IEEE Standard 551 for Calculating Short Circuit Currents in Industrial and Commercial Power Systems, IEEE Standard 141 for Electric Power Distribution for Industrial Plants, IEEE Standard 399 for Power System Analysis, ANSI C37.010 for Application Guide for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis), as implemented by commercially available software (e.g., EasyPower®). See Figure R3-1 for a graphical representation of this system showing its components and available fault currents. TO: Introduction R3-1.3, 1st paragraph R3-1.3 The following assumptions were used to establish the typical electrical distribution system in a semiconductor manufacturing facility, based on IEEE and ANSI Standards (e.g., IEEE Standard 551 for Calculating Short Circuit Currents in Industrial and Commercial Power Systems, IEEE Standard 141 for Electric Power Distribution for Industrial Plants, IEEE Standard 399 for Power System Analysis, ANSI C37.010 for Application Guide for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis), as implemented by commercially available software (i.e., EasyPower®). See Figure R3-1 for a graphical representation of this system showing its components and available fault currents. Justification: (If necessary) Related Information, therefore editorial by definition. FROM: Table R3-1 (Note: PDF version shows Table R1-1, error introduced as part of MS Word to PDF Conversion) Table R1-1 Available Fault Current for equipment with nominal voltages and maximum rated equipment full load current (FLA). TO: Table R3-1 Table R3-1 Typical Fault Current available at points of connection for equipment with nominal voltages and maximum rated equipment full load current (FLA). Justification: (If necessary) Related Information, therefore editorial by definition. FROM: Table R3-1, Footnote #1 #1Voltages expressed represent nominal U.S. voltages. The closest corresponding nominal voltage(s) could be used for non-U.S. power systems. TO: Table R3-1, Footnote #1 #1Nominal U.S. voltages. The closest corresponding nominal voltage(s) is recommended to be used for power systems with different nominal voltages. Justification: (If necessary) Related Information, therefore editorial by definition. FROM: Figure R3-1 6 TO: Figure R3-1 Justification: (If necessary) Related Information, therefore editorial by definition. FROM: Table R3-1 TO: Table R3-1 7 Note to SEMI Staff: Please make this editorial change to the first row of Table R3-1 as shown above. (i.e., the “Available Fault Current” heading should not extend over the “Max Rated Equipment…” heading) Justification: (If necessary) Related Information, therefore editorial by definition. Motion To approve the above editorial changes Motion Ed Karl (no company) / Eric Sklar (Safety Guru, LLC) by/2nd by Discussion Vote 13-0 Motion passed