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Theoretical Study of Phase Interrogated Surface Plasmon Resonance Fiber Optic Sensors with Metallic and Oxide Layers H. Moayyed, I. T. Leite, L. Coelho, J. L. Santos, D. Viegas  Abstract— This work reports the theoretical investigation of optical fiber surface plasmon resonance (SPR) sensors incorporating an internal metallic layer (Ag) covered with an oxide layer. This research is supported by the application of an effective analytical model combining geometrical optics with the transfer-matrix theory for stratified optical media. Different oxide materials (TiO2, SiO2, and Al2O3) are considered aiming to achieve increased/enhanced sensitivity to refractive index variations of the external medium, particularly when addressing phase interrogation. It is shown that the combination of a 50 nm thickness silver inner layer with a dielectric titanium oxide layer of a specific thickness enables high performance phase sensitivity reading and is compatible with tailoring the sensor working region to the third telecommunication wavelength window around 1550 nm. Index Terms— Surface plasmon resonance, fiber-optic sensors, phase interrogation, metallic-oxide coupled layers. I. INTRODUCTION T resonant interaction of light with free electrons in metals originates loss bands in the light spectrum with a central wavelength that depends on the properties of the metal as well as of the surrounding medium, particularly its refractive index. This dependence is the principle of optical sensing based in plasmonics where, similarly to sensing structures based on fiber Bragg gratings (FBG) and distributed feedback (DFB) fiber lasers, the measurand information is encoded on the wavelength position of a spectral signature, with all the benefits which result from this characteristic [1]. HE This work is part-funded by National Funds through the FCT – Fundação para a Ciência e a Tecnologia (Portuguese Foundation for Science and Technology) within project PTDC/FIS/119027/2010 (Plasmonics Based Fibre Optic Sensing with Enhanced Performance). L. Coelho acknowledges the support from FCT grant SFRH/BD/78149/2011. This work is also part-funded by the ERDF – European Regional Development Fund through the COMPETE Programme (operational programme for competitiveness) and by National Funds through the FCT within project «FCOMP - 01-0124-FEDER022701». H. Moayyed, I. T. Leite, L. Coelho and J. L. Santos are with INESC TEC (coordinated by INESC Porto), Rua Campo Alegre 687, 4169-007, Porto, Portugal and also with the Department of Physics and Astronomy, Faculdade de Ciências da Universidade do Porto, Rua Campo Alegre 687, 4169-007 Porto, Portugal; D. Viegas is with INL - International Iberian Nanotechnology Laboratory, Av. Mestre José Veiga - 4715-310 Braga, Portugal (e-mail: [email protected]; [email protected]; [email protected]; [email protected], [email protected]). Plasmonics based optical sensors were first developed supported in bulk optics elements (prisms) and the measurand information obtained by monitoring the angle of the incident light on an interface (where a metal thin film is deposited) that resulted into a minimum reflected light. With the introduction of the optical fiber as a platform for plasmonic optical sensors, the angular interrogation became inappropriate and was replaced by spectral interrogation, either directly through the determination of the central wavelength of the loss band, or by monitoring the optical power at specific wavelengths on the two sides of the spectral loss band, therefore recovering the advantages of wavelength encoded sensor operation [2]. When dealing with Plasmonics and sensing two types of surface plasmon resonances (SPRs) need to be considered: i) propagating surface plasmon-polaritons (SPPs) and (ii) nonpropagating localized SPRs (LSPRs), in both cases involving evanescently confined electromagnetic fields [3]. For the situation of SPPs, the plasmons propagates tens to hundreds micrometers along the metal surface with an associated electric field that decays exponentially from the surface (normal to the dielectric-metal interface). A variation in the refractive index of the medium above the metal shifts the plasmon resonance condition. For the case of LSPRs, it is involved plasmons resonantly excited in metal nanoparticles and around nanoholes or nanowells in thin metal films. The spectral position and the magnitude of the LSPR depend on the size, shape and composition of these structures, as well as of the surrounding environment. Independently of the consideration of one or another type of resonance in a specific SPR sensor design, its performance has benefited tremendously from the remarkable progresses Plasmonic has undergone in the past 10 years. Surely, the subject is not new, with its origin traced to the pioneering works of Sommerfeld in 1899 [4] and Wood in 1902 [5], the first sensing application of the SPR technique being reported in 1983 oriented to gas detection [6]. Along all this period the interest of the scientific community on this subject has been diverse, but its intrinsic fundamental relevance and the recognition of its high technological potential were always without dispute. Eventually, the reason for such constancy is routed to the Plasmonic core physical phenomenon, which is an interaction process between electromagnetic radiation and conduction electrons at metallic interfaces or in small metallic 2 nanostructures. This coupling between photons and electrons implies the relevant length scale is no more the light wavelength but a much smaller effective value, essentially determined by the electron dynamics in the metal, with the light energy carried as a package of electron oscillations. These hybrid electromagnetic modes (surface plasmon resonances or simply plasmons) have properties that enable two unique characteristics: i) the concentrated optical field in the metal surface means that if light is first coupled to a plasmon any further interaction (for example with adjacent molecules or with a non-linear material) will be much more effective; ii) the concentrated optical field permits to confine light to sub-wavelength spaces, well below the usual diffraction limit. These remarkable characteristics turn plasmonics so relevant, particularly in a period where the advances of the Nanosciences and Nanotechnologies permit to engineer material structures (metamaterials) with tailored and enhanced Plasmonic characteristics, enabling their high performance application in several optical domains and, in particular, in sensing [7]. All this environment has been inducing a burst of R&D activity in surface plasmonic resonance oriented for sensing, looking for highly sensitive and selective detection of several physical, chemical, and biochemical parameters [8,9]. Indeed, ever since the introduction of various optical methods in the excitation of the SPR at a metal-dielectric interface, it has been widely recognized that such effect can be utilized to achieve sensing or monitoring of various interfacial phenomena with ultrahigh sensitivity. These include, for example, chemical and biological sensing [10,11], filmthickness sensing [12], temperature sensing [13] and angular measurement [14]. It has been demonstrated that the SPR technique applied to chemical and biological sensing can achieve resolutions down to 10-7 refractive index units (RIUs), values not accessible to other optical sensing technologies [15]. Up to a few years ago, the large majority of sensing SPR structures relied in classical sensing heads based on a prism coupling system in Kretschmann’s configuration. Even so, soon has been recognized the obvious advantages of using the optical fiber as the SPR sensing platform, starting by the fact that propagation in these waveguides in most of the cases is supported by the effect of total internal reflection, also central in plasmonic phenomena. Therefore, it has been observed a trend towards the consideration of the optical fiber as the privileged platform for SPR sensing [2]. Consequently, most of the recent developments in this field involve the combination of the optical fiber with nanostructures whose manufacturing became possible with the advances of the Nanosciencies/Nanotechnologies. It is the case of SPR layouts involving the combination of metal and oxide layers on the optical fiber surface, enabling the tailoring of the sensor performance, most notably its sensitivity and wavelength operation region [16]. In this work we investigate the characteristics of optical fiber based SPR sensors incorporating the double layer structure proposed in [16], i.e an internal metallic (silver) layer covered by an oxide layer, focusing now on phase interrogation. We start in section 2 by further developing some general points on SPR sensor interrogation, then in section 3 we move to the identification of the general sensor layout and presentation of the study approach based on the application of an effective analytical model combining geometrical optics with the transfer-matrix theory for stratified optical media, section 4 presents the main results obtained from this analysis and section 5 delivers final remarks. II. SPECTRAL AND PHASE INTERROGATION NDEPENDENTLY of the specific structure of SPR sensors, it is advantageous to consider their interrogation in the spectral domain to benefit from wavelength encoded operation. This can be done directly by monitoring the deep of the SPR loss band, which requires a spectral analyzer or a tunable laser to scan a wavelength range that contains the extreme of the SPR signature. An indirect approach relies on reading the optical power that propagates through the sensor in two wavelengths, one in each side of the loss band. This can be achieved using two lasers, or by illuminating the sensor with broadband light and the spectral interrogation lines be defined by two FBGs [17]. Previous calibration permits to obtain from these two readings a parameter only dependent on the spectral position of the SPR loss band and highly sensitive to its displacement. I The resolution of a SPR sensing head depends not only on its intrinsic sensitivity to the measurand, but also on the performance of the interrogation technique considered. To benefit from the wavelength encoded characteristics of these sensors, the interrogation approach above indicated or variants shall be adopted. However, when higher/fine resolutions are on demand this approach can be complemented by the consideration of an additional interrogation technique which shows better performance. Ultimately, the most favorable one would be phase reading, associated with the fact that light propagates through the sensor at two distinct locations of the SPR spectral loss band will experience different phase delays. Therefore, phase interrogation can be achieved by illuminating the sensor with a laser line with emission in the region of the SPR loss band where the slope of phase variation with the measurand induced band spectral shift has its maximum value. Considering that only the TM polarization component can couple to surface-plasmons and give rise to SPR, the TE wave will accumulate a SPR immune phase delay when propagating through the sensor structure, therefore providing a reference level to the sensing effective TM wave. A possible classification for this interrogation approach is based on the way of generating these waves. When using a polarizer to obtain, from a single optical source, the TE and TM components which are made to interfere on the photodetector, the process is known as polarimetric interrogation. In the case 3 where the TE and TM waves are provided by two distinct light sources with slightly different optical frequencies and are made to interfere resulting into a beat signal with frequency low enough to be resolved by the photodetection and amplification electronics, we are dealing with heterodyne interrogation. Finally, if the reference wave propagates along a different spatial path and brought to interfere with the TM light on the photodetector, the approach is usually known as interference interrogation (though all the three processes rely on interference phenomena). Phase interrogation has not been widely explored in the context of SPR sensors. Surely, it is more complex to implement, requiring more know-how on optical components, modulation instruments and signal processing techniques, but eventually the main reason is the circumstance that most of the R&D community which has been working until recently in SPR sensing had a biochemical background, therefore with a tendency to use in their research spectroscopic equipments. This is becoming to change since plasmonics is now moving to fields other than sensing, such as imaging and data storage, bringing to the subject researchers with diverse backgrounds. A consequence of this dynamics is an improvement of the resolution values obtained for each of the three described phase reading approaches. Indeed, for the case of heterodyne interrogation, a value of 2.8×10-9 RIU was reported in 2008 [18], which seems to be the highest refractive index resolution achieved so far; when considering polarimetric interrogation, under optimized conditions, it was obtained a resolution of 3.7×10-8 RIU [19]; for interferometric interrogation, a resolution down to 2.2×10-7 RIU was reported in 2011 [20]. Most of this research was performed with classical sensing heads based on a prism coupling system in a Kretschmann configuration. The SPR induced phase change would be greatly amplified if the light undergoes multiple attenuated total reflections, as happens when the sensing platform is an optical fiber. This advantage is attenuated due to the propagation characteristics of the fiber. In the case of a multimode optical fiber, each guided mode generates its own resonance dip at a specific wavelength, different from the other propagating modes, resulting in a broadening of the full SPR profile, factor that decreases the phase sensitivity (as well as the sensitivity expectable from the application of different interrogation approaches). On the other hand, if in the sensing head a standard single-mode fiber is considered, its small numerical aperture limits the incidence angles from approximately 86.5 to 89.5 degrees (in the simplified picture of geometrical optics), which are far from the critical angle, meaning a reduced phase shift occurs in each reflection. increase of the interaction area, which by itself increases the intrinsic sensitivity of the sensor, and not on the tailoring of the guidance mechanisms of the fiber to increase also its intrinsic sensitivity from this side. Eventually, a compromise needs to be found between these two mechanisms, a topic that certainly will be the target of future R&D activity. A possible path would be to consider for the sensing head a special fiber with material and geometric characteristics compatible with few modes light propagation associated to incident angles closer to the critical angle, providing a large interaction area of the optical field with the measurand in a region where it can have ready access, coupled to input/output standard single mode fibers, if necessary with a coupling transition region to reduce the connection loss. Desirably, the sensor shall operate in reflection not only because in such configuration the illumination fiber is additionally the return fiber, but also in view of the light double-pass in the sensing head, which further increases its intrinsic sensitivity. Another approach compatible with actual fiber-optic technology is based on the combination of long period gratings (LPG) and plasmonic resonance. The LPG couples light that propagates in the fiber core to a cladding mode with a certain oscillation angle, typical of multimode operation, which interacts in each reflection at the cladding-metal interface in a condition of plasmonic resonance. An effective configuration consists in considering TM light and operation in reflection, so the radiation propagates twice through the sensing region, with the LPG coupling light to the cladding and recoupling back to the core. In this way accumulates a phase difference between this light and the fraction that always propagated in the core which provides the reference beam of the interferometric layout. The recovery of the interferometric phase shall allow obtaining the component introduced by the plasmonic resonance, therefore with information on the refractive index of the surrounding medium. An approach of this type is quite promising considering it is fully compatible with single-mode fiber-optic technology while not compromising the performance of SPR measurement since, in the sensing region, the light is allowed to propagate with oscillation angles close to the critical angle where the phase shift introduced by the SPR phenomenon is maximum, i.e. in a situation of maximum sensitivity. The theoretical analysis of such structure has been performed [21] but further developments need to be undertaken to assess its main characteristics for sensing, particularly in what concerns the experimental investigation component. III. SENSOR LAYOUT AND ANALYSIS This feature indicates the need to consider a different type of sensing head in fiber-optic SPR sensing systems when the target is to achieve very high resolutions. Indeed, up to now no development effort has been done towards optical fibers well suited to SPR sensing, as opposed to the large endeavors done along the years to optimize the prism approach. Even in the recent appearance of microstructured optical fibers in SPR sensing, the focus was on the improvement of the access conditions of the measurand to the optical field and in the T HE structure of the sensing head under analysis is schematically illustrated in Fig. 1. The sensing region is an uncladded fiber coated with a metallic layer followed by a layer of oxide material. The length of the sensing region is assumed to be L, ρ0 the radius of the core and θ0 the angle of incidence of the optical 4 √ (for TM waves), (3b) where εk and μk are the dielectric constant and relative magnetic permeability, respectively. The reflectance Rs,p of the multilayer structure for each polarization state is obtained as: | Figure 1. Schematic illustration of the SPR sensing head under analysis. The cladding of the optical fiber has been removed in the sensing region, and replaced by a metallic film covered with an oxide overlayer. | , where rs and rp are the Fresnel reflection coefficients which are calculated directly from the transfer-matrix elements in (1) and the parameters η of the incidence and transmission media: ray with respect to the normal to the core-cladding interface. A geometric ray methodology combined with the transfer-matrix formalism for stratified optical media is applied here, following the approach of Gupta and co-workers [16, 22, 23]. In order to evaluate the optical response of the sensing structure, we used the multilayer transfer-matrix theory applied to a four-layer system comprised of: (i) fiber-core, (ii) inner-metal, (iii) outer-metal, and (iv) probe-medium [23, 24]. This methodology is applied to compute the propagation of the radiation through the layer system using the Maxwell’s equations subject to boundary conditions between two adjacent layers. From the basis of this formalism the electromagnetic quantities, the tangential components of the electric and magnetic field vectors (E and H, respectively) at the first and final boundaries, are related by [25]: [ ] [ ][ ], (1) (4) . (5) The normalized transmitted power through the sensing region of the fiber is given by: [26] ∫ ⁄ [ ] ∫ . ⁄ (6) As shown in (4), Rp is the reflectivity of the multilayer structure and θcr = sin-1(n1/n0) is the critical angle for the light confinement inside the fiber (n0 and n1 are respectively the refractive indices of the core and the cladding of the fiber). Nref ( ) is the number of reflections the optical ray with θ0 undergoes in the sensing region, and is given by re . tan (7) Moreover, where (U,V) = (Ey,Hz) for the TE modes or (U,V) = (Hy,-Ez) for the TM modes, and [mij] is the transfer matrix of the multilayer structure comprised of N interfaces: [ ] ∏ [ ], (2a) with δk being the phase in the kth layer (k = 0 and k = N are the first and final semi-infinite media, respectively), given by: √ , (2b) where dk, nk and θk are respectively the thickness, refractive index and propagation angle (with respect to the normal to the direction of stratification) of the kth layer, λ is the free-space wavelength of the light propagating in the system, and nonmagnetic media are assumed (i.e. µk = 1). The parameter ηk in (2a) is defined as a function of the polarization state as: sin ( cos cos is the intensity distribution between the continuum of guided modes. In order to access the performance of phase interrogation of SPR based sensors supported by fiber structures, it is convenient to express the amplitude reflection coefficients rs and rp in the polar form as: | | | | and (for TE waves), (3a) . (9) Then the phase di erence variation δϕp,s resulting from a single reflection at a given incident angle between the p and the s polarization components is: , (10) and the total phase difference variation considering all the reflections inside the sensing region is given by: re √ (8) ) . (11) At this stage, it is useful to define the sensitivity of the sensing structure to the refractive index ns of the surrounding medium, which can be regarded as the basic parameter quantifying the performance of the sensor. A change in the refractive index ns = (εs)1/2 of the surrounding dielectric produces a significant 5 variation in the propagation constant of the surface plasmon, resulting in the modification of the SPR coupling condition. This can be observed as a change in one or more of the properties of the light transmitted through the sensing structure. The sensitivity can be defined as: set for the analysis that provided the results delivered in the following. (12) where δξ is the change in a given property of light (e.g. intensity, resonance wavelength or phase) due to a variation of δns in the refractive index of the surrounding medium. We will be particularly concerned with the case of phase interrogation, where the property of light of interest is the phase difference Δ p,s between the p and s polarization components. In this case, the phase sensitivity to refractive index variations is then defined as Sn,ϕ = δΔϕp,sp,s/δns. IV. RESULTS AND DISCUSSION THE analysis detailed in the previous section was applied to the study of the characteristics of a fiber optic SPR metal/oxide double-layer sensing structure for measurement of surrounding medium refractive index variations. A multimode silica fiber with 100 µm core diameter and numerical aperture of 0.24 was considered. In the sensing region the uncladded length was assumed to be L = 1cm. The choice of the metal for the internal layer was determined by the best performance achieved concerning the phase sensitivity of the double layer structure. Silver was found to be the most adequate metal, with the shape of the SPR resonance versus thickness of the silver layer (without the presence of the external oxide layer) shown in Fig. 2. Figure 2. Resonance of a fiber optic SPR structure with a single silver layer (thickness in nanometers; refractive index of the external medium: 1.33). When the silver layer was combined with an outer layer of oxide, the thickness of 50 nm for the silver layer was the one that provided the best sensor performance, so this value was Figure 3. Spectral behavior of the double layer fiber optic SPR structure for different thicknesses of the oxide layer (TiO2, SiO2 and Al2O3 oxide materials are associated with (a), (b) and (c), respectively; refractive index of the external medium: 1.33). 6 Three different oxide materials were considered for the outer oxide layer, titanium dioxide (TiO2), silicon dioxide (SiO2) and aluminum oxide (Al2O3). It is known that the introduction of this layer modifies substantially the characteristics of the SPR resonance, most notably the spectral region where it appears [16]. This can be checked by the observation of Fig. 3 which shows the location and shape evolution of the resonance for different thicknesses of the oxide layer. The SPR sensing head is assumed to be surrounded by a non-dispersive external medium with refractive index of ns = 1.33. Figure 5 shows the normalized transmittance and the phase di erence Δϕp,s versus ns for layouts with TiO2 and Al2O3 layers of 15 nm and 30 nm, respectively, which enable to operate the sensor in the first telecommunications window (the data is shown for λ = 830 nm; from the data shown in Fig. 3-b, this wavelength is not accessible by considering a SiO2 layer). The inclusion of a TiO2 layer permits the largest displacement of the spectral response of the SPR resonance, turning possible to locate it within the 830, 1300 and 1550 nm telecommunication bands by adjusting the layer thickness within an interval technically feasible. This has also implications in the width of the resonance, which consistently becomes larger when it moves to longer wavelengths, as is shown in Fig. 4 which displays the spectral width of the resonance versus the thickness of the oxide layer. When addressing phase interrogation of the fiber optic based SPR sensing structure, a single oscillation angle of the light in the fiber, associated to a specific propagation mode, shall be considered (oscillation angle defined by the fiber axis and the light ray). The higher the numerical aperture of the fiber the larger this angle can be, meaning a smaller incident angle in the interface core-cladding of the fiber. In the fiber length where SPR occurs this condition favors the introduction of a larger phase di erence Δϕp,s between the TM and TE polarizations of the light in the reflection process, increasing the sensitivity to variations of the refractive index of the surrounding medium, ns. Therefore, it is advantageous to consider an incident angle in the core-metallic layer interface just near the critical angle in the cladded fiber, which is θc ≈ 80.5° for a fiber with numerical aperture of 0.24. As such the phase interrogation analysis was performed assuming θ = 80.5°. Figure 5. Normalized transmittance and phase difference (between p and s polarizations) as function of the refractive index of the surrounding medium for an inner silver layer of 50 nm combined with a TiO2 layer of 15 nm (a) and a Al2O3 layer of 30 nm (b). The interrogation wavelength is 830 nm. Figure 4. Evolution of the spectral width of the SPR resonance (full width at the power level 6 dB above the minimum) as function of the thickness of the oxide layer. The refractive index of the external medium is considered to be 1.33. The analysis of this data shows that the maximum of the refractive index phase sensitivity, S ,ϕ = δ(Δϕp,s)/δ s, occurs for ns = 1.330 and for the case of the Titanium Dioxide layer reaching a value of 3.2×106 degrees/RIU, while for the situation of Aluminum Oxide layer the value is 3.0×106 degrees/RIU for ns = 1.328. In both cases the condition of maximum phase sensitivity is on the SPR resonance, where the transmitted optical power is rather low. This means almost no light to detect, therefore decreasing substantially the signal-to-noise ratio. As such, a compromise is needed so that the phase sensitivity is degraded to a certain extent while the signal-noise-ratio in the detection process increases, therefore reaching a situation of maximum resolution in the measurement of ns. For the sensing head to operate in the second (1300 nm) and 7 third (1550 nm) telecommunications spectral windows, the observation of Fig. 3 indicates the need to consider an external layer of TiO2 with thicknesses of 40 and 55 nm, respectively. The normalized transmittance and Δϕp,s versus ns are shown in Fig. 6. noise ratio to a point that such high sensitivity does not have impact in the final phase reading resolution. Therefore, shall be considered to operate in a wavelength where there is enough transmitted optical power, which means in principle it can be located in either side of the SPR transmittance curve. To investigate this aspect, it was analyzed the achievable phase sensitivity for different levels of transmittance in both sides of the SPR resonance, for the case being selected the situation associated with Fig. 6-a, i.e. relative to an operating wavelength of 1300 nm. The results obtained are shown in Figure 7. Figure 7. Phase sensitivity versus normalized transmittance for a fiber optic SPR structure with an inner silver layer of 50 nm combined with a TiO2 layer of 40 nm (interrogation wavelengths of 1300 nm). Figure 6. Normalized transmittance and phase difference (between p and s polarizations) as function of the refractive index of the surrounding medium for an inner silver layer of 50 nm combined with a TiO2 layer of 40 nm (a) and a TiO2 layer of 55 nm (b), associated to interrogation wavelengths of 1300 nm and 1550 nm, respectively. From these results it turns out the maximum phase sensitivity has de value of 5.6×105 degrees/RIU (at ns = 1.334) and 3.3×105 degrees/RIU (at ns = 1.332) when the interrogation wavelengths are 1300 and 1550 nm, respectively. When considering SPR sensors supported by optical fiber platforms it is advantageous to operate within these telecommunications windows, particularly the one in the 1550 nm region, due to a wide availability of high performance optical fiber technology at a relatively low cost, allowing the design and implementation of sensing structures with rather good characteristics. As mentioned before, maximum phase sensitivity occurs in a region close to the dip of the SPR resonance, therefore with low level of optical power, which will degrade the signal- With the wavelength fixed, to access different transmittance levels means different refractive index of the surrounding medium. As expected from the observation of Fig. 3-a, due to the asymmetry of the SPR resonance, its left side provide limited freedom to the choice of the operating pair (transmittance,sensitivity), indicating the preference to work out in the right side of the resonance. Optical sensors based in the SPR phenomenon are inherently highly sensitive to variations of the external medium refractive index, permitting therefore to detect very small changes of this measurand, for example variations induced by biochemical processes. Therefore it is in the context of biochemical sensing that these devices are rather appellative, pointing out the relevance of optimizing their performance in the situation where the external medium is water. Consequently, for each type of the oxide layer it was determined the appropriate thickness in order to attain maximum sensitivity at the refractive index of water evaluated at the sensor operating wavelength. Figure 8 shows the maximum phase sensitivity obtained when the operation wavelengths are 630 nm (a) and 830 nm (b). The most immediate outcome of the analysis of this data is that for the case of operation at 630 nm it is possible to find the required thickness for all oxide materials considered (TiO2, SiO2 and Al2O3). However, when moving to 830 nm, the layer 8 of SiO2 leaves to be an option, as the results shown in Fig. 3b) already indicated. Figure 9. Same as Fig. 8 but now with interrogation wavelengths of 1300 nm (a) and 1550 nm(b). Figure 8. Thickness of the oxide layer required to operate with maximum sensitivity to changes of the refractive index of water, determined by the intersection of the horizontal line (that defines in the y-axis the water refractive index at the wavelength of operation) with the curves associated with different materials for the oxide layer. The interrogation wavelength is 630 nm (a) and 830 nm(b). Figure 9 gives similar results but now considering as operating wavelengths 1300 nm (a) and 1550 nm (b). Again, the titanium dioxide option for the external layer permits to address operation at both wavelengths, eventually being feasible to consider a layer of aluminum oxide for 1300 nm interrogation, associated with a tackiness width of ~86 nm, which is still technically feasible. V. FINAL REMARKS The analysis presented here permitted to identify the main characteristics of SPR fiber optic sensing structures with a double layer of metal/oxide, particularly when phase interrogation is under concern. Two of these characteristics are particularly relevant, one the possibility to tune the sensor sensitivity to variations of the refractive index of the surrounding medium, the other the amenability to tune the measurement operation to a specific wavelength region, most notably the one around 1550 nm to benefit from the large portfolio of high performance fiber optic components available at these wavelengths. It was found the inclusion of an internal silver layer of 50 nm thickness permits the better performance for any of the three different oxide materials considered for the external layer (TiO2, SiO2, and Al2O3). Also, the results obtained shows the better flexibility is provided by the inclusion of a layer of titanium dioxide, approach that is compatible with tuning the sensor operation to a large wavelength window that includes operationally important wavelengths (630, 830, 1300 and 1550 nm). 9 For this fiber optic based plasmonic structure to be operative as a sensing device one of its characteristics, that show dependence to the refractive index of the surrounding medium, shall be selected and adequate approaches developed to read its variations with the better performance possible. The main features of this process, known as sensor interrogation, were outlined in the first part of this work, with particular focus when the characteristic selected is the phase di erence, Δϕp,s, between the light with TM and TE polarizations that propagates through the sensing head. This choice oriented most of the theoretical research performed and the main results obtained and presented here. [2] The experimental validation of this study can be done by application of techniques developed along the years for the interrogation of polarimetric fiber sensing interferometers illuminated by monochromatic light [27]. Following these approaches, laser light is injected into the multimode fiber at an angle such that is excited the selected core mode. At the input of the sensing head, a fiber polarizer element shall be included in order to have light in the TE and TM polarizations, recombined at the output of the measurement region by means of a second polarizer. This will generate an interferometric signal with a phase proportional to the optical path difference accumulated by the propagation of the TE and TM polarizations, therefore including the phase variations of the light in the TM polarization induced by changes of the surrounding refractive index. [8] To recover the phase of this signal, a robust and sensitive technique involves to add to the interferometric phase a sinewave component, which can be generated by sinewave modulation of the wavelength of the laser light. After photodetection and incorporation of signal processing, which includes a feedback loop to the laser source to tune the DC value of the light wavelength, the information on the quasistatic phase of the polarimetric sensing interferometer, and therefore on the refractive index of the external medium, can be obtained from the feedback signal [28]. This approach is compatible with a DC phase resolution of the order of 1 mrad, which means from the results presented here refractive index measurement resolutions of the order 10-7 RIU shall be possible. In conclusion, a theoretical investigation of optical fiber surface plasmon resonance sensors incorporating an internal metallic layer (Ag) covered with an oxide layer was reported. Different oxide materials (TiO2, SiO2, and Al2O3) were considered and the main characteristics of these structures for refractive index sensing determined. Globally, the results presented in this work permit to guide system design in order to achieve optimized performance when phase reading of SPR sensors is under concern. [3] [4] [5] [6] [7] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] REFERENCES [1] S. Enoch, N. Bonod, Plasmonics: From Basics to Advanced Topics. Springer, 2012. [28] A. K. Sharma, R. Jha, B. D. Gupta, Fiber-optic sensors based on surface plasmon resonance: A comprehensive review. Sensors Journal, 7, 11181129, 2007. S. A. Maier, Plasmonics: Fundamentals and Applications, Springer 2007. A. Sommerfeld, Uber die Fortpflanzung Electrodynamischer Wellen Langs Eines Drahtes, Annalen der Physik und Chemie 67, 233-290, 1899. R. W. Wood, On a Remarkable Case of Uneven Distribution of Light in a Diffraction Grating Spectrum, Proceedings Physical Society London, 18, 269-275, 1902. B. Liedberg, C. Nylander, I. Lunström, Surface Plasmon Resonance for Gas detection and Biosensing, Sensors and Actuators, 4, 299–304, 1983. Editorial, Surface plasmon resurrection. Nature Photonics, 6, 707-794, 2012. R. C. Jorgenson, S. S. Yee, A fiber-optic chemical sensor based on surface plasmon resonance, Sensors and Actuators B, 12, 213-220, April, 1993. H. A. Atwater, The promise of plasmonics, Scientific American, 296, 56-63, 2007. J. Homola, S. S. Yee, G. Gauglitz, Surface plasmon resonance sensors: A Review, Sensors and Actuators B, 54, 3-15, 1999. J. Homola, Present and future of surface plasmon resonance biosensors, Analytical and Bioanalytical Chemistry 377, 528-539, 2003. H. Suzuki, M. Sugimoto, Y. Matsui, J. Kondoh, Effects of gold film thickness on spectrum profile and sensitivity of a multimode-opticalfiber SPR sensor, Sensors and Actuators B, 132, 26-33, 2008. S. K. Ozdemir, G. Turhan-Sayan, Temperature effects on surface plasmon resonance: Design considerations for an optical temperature sensor, Journal of Lightwave Technology 21, 805-814, 2003. H. R. Gwon, S. H. Lee, Spectral and angular responses of surface plasmon resonance based on the Kretschmann pri m co figu io , Materials Transactions, 51, 1150-1155, 2010. R. Naraoka, K. Kajikawa, Phase detection of surface plasmon resonance using rotating analyzer method, Sensors and Actuators B, 107, 952-956, 2005. P. Bhatia, B. D. Gupta, Surface-plasmon-resonance-based fiber-optic refractive index sensor: sensitivity enhancement, Applied Optics, 50, 2032-2036, 2011. N. Díaz-Herrera, D. Viegas, P. Jorge, F. M. Araújo J.L. Santos, M.C. Navarrete. A. González-Cano, Fiber-optic SPR sensor with a FBG interrogation scheme for readout enhancement, Sensors and. Actuators B, 144(1), 226-231, 2010. Y. C. Li, C., Y. F. Chang, L. C. Su, C. Chou. Differential-phase surface plasmon resonance biosensor, Analytical Chemistry, 80, 5590-5595, 2008. H. P. Chiang, J. L. Lin, Z. W. Chen. High sensitivity surface plasmon resonance sensor based on phase interrogation at optimal wavelengths. Applied Physics Letters 88: 141105, 2006. S. P Ng, C. M. L. Wu, S. Y. Wu, H. P. Ho. White-light spectral interferometry for surface plasmon resonance sensing applications. Optics Express 19, 4521-4527, 2011 Y. J. He, Y. L. Lo, J. F. Huang. Optical-fiber surface-plasmonresonance sensor employing long-period fiber gratings in multiplexing. Journal of Optical Society of America, 23, 801-811, 2006. B. D. Gupta, C. D. Singh. Evanescent-absorption coefficient for diffuse source illumination: uniform- and tapered-fiber sensors. Applied Optics, 33, 2737-2742, 1994. A. K. Sharma, B. D. Gupta. On the performance of different bimetallic combinations in surface plasmon resonance based fiber optic sensors, Journal Applied Physics 101, 093111, 2007. M. Kanso, S. Cuenot and G. Louarn, “Sensitivity o optical iber sensor based on sur ace plasmon resonance: Modeling and experiments,” Plasmonics, vol. 3, pp. 49-57, 2008. M. Born and E. Wolf, Principles of Optics, seventh (expanded) edition, Cambridge University Press, 1999. A. Ankiewicz, C. Pask and A. W. Snyder, “Slowly varying optical ibers,” J. Opt. Soc. Am., vol. 72, pp. 198-203, 1982. B. Culshaw, “Inter erometric optical ibre sensors,” Journal o Optical Sensors, vol. 1, pp. 237-252, 1986. C. Jauregui, F. M. Araujo, L. A. Ferreira, J. L. Santos and M. LópezHiguera, “Interrogation o low-finesse Fabry-Pérot cavities based on modulation of the transfer function of a wavelength division multiplexer,” J. Lightwave Technol., vol. 19, pp. 673-681, 2001.