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7 Results and analysis - Revistas UNAL
7 Results and analysis - Revistas UNAL

... consider the random behavior of generation dispatch and flat voltage profiles in the faulted bus bar and the bus bar of interest when this behavior is studied. In this paper, an extended fault positions technique and Monte Carlo Method to evaluate the voltage sags is proposed. Random faults, changes ...
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... Though all ICs are subject to static discharge damage, CMOS ICs can experience another kind of damaging event known as “latchup” or “SCR.” In this case, large currents can follow-through the part from the power supply, damaging transistors and interconnections. This occurs when currents are injected ...


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... resistor RL is very large (>100 kΩ) a capacitor (app. 10pF) between Output and GND pin could be useful if capacitive coupled noise occurs. The load at the output Q should have a large input resistance to reduce the current trough RL and the power consumption. The TLE 4917 has 3 ground pins. From a m ...
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Stray voltage



Stray voltage is the occurrence of electrical potential between two objects that ideally should not have any voltage difference between them. Small voltages often exist between two grounded objects in separate locations, due to normal current flow in the power system. Large voltages can appear on the enclosures of electrical equipment due to a fault in the electrical power system, such as a failure of insulation.
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