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323
323

... • Upon completion of the course the student is expected to have the following skills:understand the principles of geometrical optics • apply geometrical optics to optical instruments • mathematically describe optical waves • perform superpositions of two or more waves in the context of interference ...
Optical Computers (Erin Raphael, 2006)
Optical Computers (Erin Raphael, 2006)

... Change the direction of propagation for the transmitted wave. Allow information to be used in other parts of the computer. Non-linear optical properties of materials are used to redirect the propagation of one light using another control light. ...
Gaurav Chetna Josan - Department of Electrical Engineering
Gaurav Chetna Josan - Department of Electrical Engineering

... shortest events ever made by Man Ex: Sending infrared light into a crystal yielded this display of green light ...
Opto-acoustic Imaging
Opto-acoustic Imaging

... mirrors. This is also called angular scanning. The following figure shows a scheme for an x-y scan over a surface using two separate deflecting mirrors. Such a setup is mechanically simpler than using one mirror incorporating two axes of rotation. However, the second mirror must be large enough to a ...
Post-print of: J. Mater. Chem. , 2010, 20, 6408
Post-print of: J. Mater. Chem. , 2010, 20, 6408

... .19 Highly uniform and reflecting Bragg mirrors can also be realized using glancing angle physical vapour deposition (GAPVD or GLAD according to the most commonly utilized acronyms), a technique used for the fabrication of thin films with a porous columnar nanostructure , as it was shown in the semi ...
In Situ Imaging of Cold Atomic Gases
In Situ Imaging of Cold Atomic Gases

... complex, vector fields within these traps makes direct imaging difficult. Several novel techniques have been developed and implemented within the past two decades to image dense atomic clouds, not only in situ, but also non-destructively. In this letter we present two of these methods (dark-ground i ...
Monomolecular Layers and Light
Monomolecular Layers and Light

... nti by which our evanescent wave exists. Lastly, Equation 4 is the mathematical equation for the evanescent wave that shows the amplitude of the electric field, E0t, decreasing exponentially as a function of the distance through the interface it travels. This shows that an evanescent wave only exist ...
Compiled questions (docx 32 kB)
Compiled questions (docx 32 kB)

... scanning microscope the dependence is linear. Nonlinear microscopy methods might have linear or quadratic dependence. Which dependence on concentration you would expect in following nonlinear methods: (a) SHG, (b) SFM, (c) TPFE, (d) CARS, (e) heterodyne CARS, (f) SRS. 2. In all microscopy methods wh ...
Measure the Distance Between Tracks of CD and DVD
Measure the Distance Between Tracks of CD and DVD

... hole 15mm in diameter is used to centre it on the CD player's surface. A CD is built from a plastic (polycarbonate) substrate and a fine, reflective metallic film (24-carat gold or a silver alloy). The reflective layer is then covered with an anti-UV acrylic finish, creating a protective surface for ...
2004 - thephysicsteacher.ie
2004 - thephysicsteacher.ie

... Optical fibres are made of very transparent glass or plastic. The fibres contain at least two layers. Guiding light in an optical fibre depends on how light travels through different media. Light waves are bent, or refracted, as they pass between materials of different refractive index. The amount o ...
Tristate and Gate Using Photonic Crystal
Tristate and Gate Using Photonic Crystal

... different overlapping light beams also to cross-phase modulation. Note that the effective refractive index increase caused by some intense beam for other beams is twice as large as that according to the equation shown above, assuming that both beams are in the same polarization state[4]. The wavegui ...
plumbum thiogallate optical properties
plumbum thiogallate optical properties

... Phase distortions are stipulated by fluctuations of the refractive index дn of the wafer. In order to quantitavely determine the value of fluctuations дn on the basis of phase distortions in the fringe pattern on the screen it is necessary to model representations of дn distribution. For example, in ...
Optical Fiber Communication
Optical Fiber Communication

... In 1964 critical theoretical suggestion by, Charles K. Kao and Charles Hockam : ...
Nonlinear Optics
Nonlinear Optics

... Optical polarization of dielectric crystals – mostly due to outer loosely bound valence electrons displaced by the optical electric field. Separation of charges gives rise to a dipole moment P(t)=-Nex(t) Polarization = dipole moment per unit volume Polarization is alternating with the same freque ...
Fibre Optics Material Choice?
Fibre Optics Material Choice?

... In 1964 critical theoretical suggestion by, Charles K. Kao and Charles Hockam : ...
1064nm PMFM
1064nm PMFM

... The 1064 nm Polarization Maintaining Faraday Mirror is a passive device that provides 90 degree rotation regarding to the polarization state of the input light. The PMFM offers excellent performance including the lowest possible insertion loss and enviromental stability. It is used in amplifiers, fi ...
1333.PDF
1333.PDF

... pulse can allow recording of time dependent species concentrations, and therefore kinetics. Two types of femtosecond (fs) time-resolved interferometry are used. Both utilize a MachZehnder interferometer with the sample in one arm and a time delay in the reference arm. For spectral interferometry (sp ...
POLARIZATION OF LIGHT
POLARIZATION OF LIGHT

... Consequently, two coherent plane-polarized light waves whose planes of oscillations are mutually perpendicular produce an elliptically polarized light wave when superposed on each other. At a phase difference of zero or π, the ellipse degenerates into a straitght line, and plane-polarized light is ...
Chapter 8
Chapter 8

... Polarization by scattering: If the incident light is unpolarized, then 1) The scattered light in the forward direction is unpolarized. 2) The scattered light at 90º is linearly polarized. 3) The scattered light in other directions are partially polarized. ...
Electromagnetic forces and torques in nanoparticles irradiated by
Electromagnetic forces and torques in nanoparticles irradiated by

... can be controlled by using the right polarization and wavelength for the external light. We use a multipole formalism to calculate both torques and forces, which can be applied to complex geometries involving more than one particle, as illustrated below for forces acting on metallic spheres in the p ...
Diffraction
Diffraction

... through LIGO's L-shaped detector they will decrease the distance between the test masses in one arm of the L, while increasing it in the other. These changes are minute: just 10-16 centimeters, or one-hundredmillionth the diameter of a hydrogen atom over the 4 kilometer length of the arm. Such tiny ...
Optical Properties of Colloids
Optical Properties of Colloids

...  The sample scatters electrons out of the field of view, and the final image can be made visible on a fluorescent screen.  The amount of scattering depends on the thickness and on the atomic number of the atoms forming the specimen, so that organic materials are relatively electron-transparent, wh ...
375_Lo.pdf
375_Lo.pdf

... phase retardation are correctly chosen. It should be noticed that the dynamic range in measuring the apparent phase retardation is restricted in the range of 0~90°. Thus, the measured apparent phase retardation is needed to be verified and modified by the above reason and the further discussion is i ...
Light Rays
Light Rays

... The total internal reflection can occur when the incident light in medium has a high (n). that means the light travels from a dense medium to a thinner one ( here from glass to air). ...
Dynamic measurements using a Fizeau
Dynamic measurements using a Fizeau

... Dynamic metrology based on instantaneous single-frame exposure time requires a higher energy light source to reach comparable camera signal-to-noise levels as phase-scanning techniques, where interferograms are sampled over longer exposure times and multiple frames. The higher optical power require ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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