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THS452x Very Low Power, Negative Rail Input
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... 5 Device Comparison Table These fully differential amplifiers feature accurate output common-mode control that allows for dc-coupling when driving analog-to-digital converters (ADCs). This control, coupled with an input common-mode range below the negative rail as well as rail-to-rail output, allows ...
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... If required, the fault flag can be used as part of a circuit to drive an external P-FET to disconnect the input supply from the system in the event of a fault. The A8513 provides protection against output short and overvoltage, open or shorted diode, open or shorted LED pin, shorted boost switch or ...
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... A fraction of a millivolt between the input terminals will swing the output over its full range. ...
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... method for regulating output current while maintaining high system efficiency. The LM3429 uses a Predictive Offtime (PRO) control architecture that allows the regulator to be operated using minimal external control loop compensation, while providing an inherent cycle-by-cycle current limit. The adju ...
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... rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. ...
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... connections are spaced 0.1 inch apart which is the standard spacing for many semiconductor chips. These are clustered in groups of five common terminals to allow multiple connections. The exception is the common strip which may have dozens of connection points. These are called buses and are designe ...
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... direction. Larger capacitance values (over 1 µF) are often realized via aluminum electrolytics. These are also polarized. Failure to insert these in the proper direction may result in unpredictable results, including the capacitor exploding. While they do not perform as well as film types in terms ...
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Test probe



A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to a device under test (DUT). They range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.
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