ADM231L 数据手册DataSheet 下载
... Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure t ...
... Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure t ...
LTM8027 - 60V, 4A DC/DC uModule Regulator
... acceptable, and can yield improved dynamic response, if it is necessary. Again, it is incumbent upon the user to verify proper operation over the intended system’s line, load and environmental conditions. Ceramic capacitors are small, robust and have very low ESR. However, not all ceramic capacitors ...
... acceptable, and can yield improved dynamic response, if it is necessary. Again, it is incumbent upon the user to verify proper operation over the intended system’s line, load and environmental conditions. Ceramic capacitors are small, robust and have very low ESR. However, not all ceramic capacitors ...
LP5912 500-mA Low-Noise, Low-IQ LDO (Rev. D)
... All voltages are with respect to the device GND pin, unless otherwise stated. Minimum and maximum limits are ensured through test, design, or statistical correlation over the junction temperature (TJ) range of –40°C to +125°C, unless otherwise stated. Typical values represent the most likely paramet ...
... All voltages are with respect to the device GND pin, unless otherwise stated. Minimum and maximum limits are ensured through test, design, or statistical correlation over the junction temperature (TJ) range of –40°C to +125°C, unless otherwise stated. Typical values represent the most likely paramet ...
Design of Single-Switch Inverters for Variable Resistance
... switching for load variations of more than about a factor of two or three in resistance. In many applications – such as when the load resistance is well known, or the inverter is coupled to the load via an isolator – this load sensitivity is not problematic. In other applications, however, it would ...
... switching for load variations of more than about a factor of two or three in resistance. In many applications – such as when the load resistance is well known, or the inverter is coupled to the load via an isolator – this load sensitivity is not problematic. In other applications, however, it would ...
DS3906 Triple NV Low Step Size Variable Resistor Plus Memory General Description
... The DS3906 contains 16 bytes of User EEPROM plus 3 NV resistor registers. Refer to Table 1. Communication with the memory/registers is achieved through the I2Ccompatible serial interface and is described in subsequent sections. Each of the three resistors in the DS3906 has its own control register u ...
... The DS3906 contains 16 bytes of User EEPROM plus 3 NV resistor registers. Refer to Table 1. Communication with the memory/registers is achieved through the I2Ccompatible serial interface and is described in subsequent sections. Each of the three resistors in the DS3906 has its own control register u ...
LM3421/21Q1/21Q0 LM3423/23Q1/23Q0 N
... Adjustable high-side current sense voltage allows for tight regulation of the LED current with the highest efficiency possible. The LM3421 and LM3423 devices use predictive off-time (PRO) control, which is a combination of peak current-mode control and a predictive off-timer. This method of control ...
... Adjustable high-side current sense voltage allows for tight regulation of the LED current with the highest efficiency possible. The LM3421 and LM3423 devices use predictive off-time (PRO) control, which is a combination of peak current-mode control and a predictive off-timer. This method of control ...
1 - Mohawk Valley Community College
... a dual trace oscilloscope, a function generator and a quality DMM. Some exercises also make use of a distortion analyzer and a low distortion generator (generally, THD below 0.01%), although these portions may be bypassed. For components, a selection of standard value ¼ watt carbon film resistors ra ...
... a dual trace oscilloscope, a function generator and a quality DMM. Some exercises also make use of a distortion analyzer and a low distortion generator (generally, THD below 0.01%), although these portions may be bypassed. For components, a selection of standard value ¼ watt carbon film resistors ra ...
investigation of techniques for reducing unintentional
... intuitive knowledge and insights have allowed me to improve my research capabilities. I would also like to thank my Ph.D. dissertation committee, Dr. L. Wilson Pearson, Dr. Pingshan Wang, and Dr. Chanseok Park, for their helpful comments and guidance. Special thanks to Dr. Chalmers M. Butler of the ...
... intuitive knowledge and insights have allowed me to improve my research capabilities. I would also like to thank my Ph.D. dissertation committee, Dr. L. Wilson Pearson, Dr. Pingshan Wang, and Dr. Chanseok Park, for their helpful comments and guidance. Special thanks to Dr. Chalmers M. Butler of the ...
MAX4245/MAX4246/MAX4247 Ultra-Small, Rail-to-Rail I/O with Disable, Single-/Dual-Supply, Low-Power Op Amps General Description
... op amps offer rail-to-rail inputs and outputs, draw only 320µA of quiescent current, and operate from a single +2.5V to +5.5V supply. For additional power conservation, the MAX4245/MAX4247 offer a low-power shutdown mode that reduces supply current to 50nA, and puts the amplifiers’ outputs in a high ...
... op amps offer rail-to-rail inputs and outputs, draw only 320µA of quiescent current, and operate from a single +2.5V to +5.5V supply. For additional power conservation, the MAX4245/MAX4247 offer a low-power shutdown mode that reduces supply current to 50nA, and puts the amplifiers’ outputs in a high ...
Test probe
A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to a device under test (DUT). They range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.