The ISP1105 Universal Serial Bus
... Serial Bus Specification Rev. 2.0. It can transmit and receive serial data at both full-speed (12 Mbit/s) and low-speed (1.5 Mbit/s) data rates. The ISP1105 can be used as a USB device transceiver or a USB host transceiver. It allows USB application-specific ICs (ASICs) and programmable logic device ...
... Serial Bus Specification Rev. 2.0. It can transmit and receive serial data at both full-speed (12 Mbit/s) and low-speed (1.5 Mbit/s) data rates. The ISP1105 can be used as a USB device transceiver or a USB host transceiver. It allows USB application-specific ICs (ASICs) and programmable logic device ...
PCB test - locate faulty devices on bus systems without removal from
... In microprocessor-based circuitry devices such as RAMs, ROMs and ports often transfer data via buses, groups of signal and control lines. The devices share the buses and the microprocessor prevents bus conflicts by controlling which devices are writing or reading data. However, to fault locators usi ...
... In microprocessor-based circuitry devices such as RAMs, ROMs and ports often transfer data via buses, groups of signal and control lines. The devices share the buses and the microprocessor prevents bus conflicts by controlling which devices are writing or reading data. However, to fault locators usi ...
Leakage Reactance Interface
... the leakage reactance measurement on transformers of any size and various winding configurations. The three-phase Leakage Reactance measurement can be compared to the short-circuit impedance nameplate value obtained at the factory. Individual phases can also be tested. The M4110 Leakage Reactance In ...
... the leakage reactance measurement on transformers of any size and various winding configurations. The three-phase Leakage Reactance measurement can be compared to the short-circuit impedance nameplate value obtained at the factory. Individual phases can also be tested. The M4110 Leakage Reactance In ...
Study Guide
... Be able to draw the amount of Newtons used on a spring scale. Know which pulley system gives the greatest advantage of mechanical effort. Know how much effort is needed to lift a load in all of the pulley systems. Know how much distance is needed to lift a load in all of the pulley systems. ...
... Be able to draw the amount of Newtons used on a spring scale. Know which pulley system gives the greatest advantage of mechanical effort. Know how much effort is needed to lift a load in all of the pulley systems. Know how much distance is needed to lift a load in all of the pulley systems. ...
draft rules of procedure iecee xxx this new rules of procedure have
... High voltage probe Verification of temperature rise Load resistors, Temperature acquisition unit, Current/voltage source Short-circuit withstand strength Short-circuit withstand testing up to 10kA (testing with OCPDs) Measuring devices for voltage, current, cos φ, time, I²t-values ...
... High voltage probe Verification of temperature rise Load resistors, Temperature acquisition unit, Current/voltage source Short-circuit withstand strength Short-circuit withstand testing up to 10kA (testing with OCPDs) Measuring devices for voltage, current, cos φ, time, I²t-values ...
draft rules of procedure iecee xxx this new rules of procedure have
... Power-frequency withstand voltage AC High-voltage source (0 - min. 3,5 kV), Voltmeter (min. 3,5 kV) Impulse withstand voltage Impulse voltage generator (1,2/50 μs), Oscilloscope, High voltage probe Verification of temperature rise Load resistors, Temperature acquisition unit, Current/voltage source ...
... Power-frequency withstand voltage AC High-voltage source (0 - min. 3,5 kV), Voltmeter (min. 3,5 kV) Impulse withstand voltage Impulse voltage generator (1,2/50 μs), Oscilloscope, High voltage probe Verification of temperature rise Load resistors, Temperature acquisition unit, Current/voltage source ...
Four Point Probe I-V Electrical Measurements Using the Zyvex Test
... and accuracy for deep sub-micron characterization. Tests are easily and quickly configured and run from the Keithley Interactive Test Environment (KITE). KITE is an application program designed and developed specifically for characterizing semiconductor devices and materials. Source and measurement ...
... and accuracy for deep sub-micron characterization. Tests are easily and quickly configured and run from the Keithley Interactive Test Environment (KITE). KITE is an application program designed and developed specifically for characterizing semiconductor devices and materials. Source and measurement ...
Hand-cranked Megohmmeter Model 1210N
... self-contained, hand-cranked True Megohmmeter ®. This practical and dependable instrument is designed for a broad range of plant and field service applications, such as acceptance testing and preventive maintenance of wiring, cables, switchgear and motors. The easy hand-cranked operation provides a ...
... self-contained, hand-cranked True Megohmmeter ®. This practical and dependable instrument is designed for a broad range of plant and field service applications, such as acceptance testing and preventive maintenance of wiring, cables, switchgear and motors. The easy hand-cranked operation provides a ...
Follow up to “Pirates of Silicon Valley”
... It’s the second most abundant element in the earth’s crust, surpassed only by oxygen. Sand and almost all rocks contain silicon combined with oxygen, forming silica. Silicon is the basic material used to make computer chips, transistors, silicon diodes and other electronic circuits and switching dev ...
... It’s the second most abundant element in the earth’s crust, surpassed only by oxygen. Sand and almost all rocks contain silicon combined with oxygen, forming silica. Silicon is the basic material used to make computer chips, transistors, silicon diodes and other electronic circuits and switching dev ...
EPCOS Film Capacitors - Power Factor Correction
... Transmitter for external systems (transfer of measured values via interface to factory master control system for monitoring etc.) Additional three-phase measuring device as an accessory to the PF controller BR6000 ...
... Transmitter for external systems (transfer of measured values via interface to factory master control system for monitoring etc.) Additional three-phase measuring device as an accessory to the PF controller BR6000 ...
Supplement for Statistics 260 P-Values 1
... ) against Ho in favour of Ha , and report the estimated value ...
... ) against Ho in favour of Ha , and report the estimated value ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.