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TPS74901EVM-210 (Rev. B
TPS74901EVM-210 (Rev. B

... Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its hardware prod ...
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Keithley 2280S
Keithley 2280S

... View and Control Every Parameter of the Supply for Maximum Performance The bright, 4.3-inch TFT display shows voltage and current readings, the source settings and many additional settings in large, easy-to-read characters. The icon-based main menu provides all the functions users can control and pr ...
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TID - Freebird Semiconductor
TID - Freebird Semiconductor

... Freebird evaluated the radiation performance of the FBG10N05X 100 Volts 5 Ampere Enhancement Gallium Nitride power switching HEMT FET at VPTRad according to the test plan FBS-P-603-16-008. This report covers the total dose (Gamma) characterization portion of the test plan for wafer lot C5A08H47.2 wa ...
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What Does It Mean when a Board Test Passes?

... simple test might measure the value of a single resistor. A complex test might test thousands of connections among many devices. A typical board test is made up of many simple and complex tests, the collection of which is intended to test as many potential defects as possible. This is called board t ...
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KEW3021/3022/3023 Instruction Manual

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ELECTRONIC TRASFORMER FOR LED LAMPS 12V ºC

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Sydney Industry Electrical Safety Network Minutes of Meeting – 19

... the change in role of WorkCover that has been in progress for the last ten years. The focus is on working collaboratively with industries to provide a safer work place. PRESENTATIONS Technical presentation Allan Edwards, Safe Electrical Technology described some of the different earthing systems and ...
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... evaluate the possibility of an electric shock. Since most Leakage and Functional tests are performed at varying voltage values nominal outlet power is insufficient. Additionally, most electrical compliance analyzers do not contain a built in power source. These obstacles can make automated testing d ...
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Pulse Testing for Nanoscale Devices

... voltage of the transistor increases due to the built-in voltage in the gate capacitor; therefore, the drain current decreases. Pulse testing can be one of two different types: voltage or current pulsing. Voltage pulsing produces much narrower pulse widths than current pulsing. This makes it more sui ...
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... light weight (16.5 lbs). It features a high contrast LCD screen which can be seen in bright or ambient light and comes equipped with specially designed leads which provide the necessary flexibility needed in cold weather conditions. APPLICATIONS The proper operation of a transformer relies almost en ...
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How is the LVS Similar to Multiple Dimension Measuring Devices?

... A.2. Other Devices Designed to Make Multiple Measurement Automatically to Determine a Volume. – Insofar as they are clearly applicable, the provisions of this code apply also to devices designed to make multiple measurements automatically to determine a volume for other applications as defined by Se ...
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... Experiment No. 6 Standard Test Method for SAND EQUIVALENT VALUE OF SOILS AND FINE AGGREGATE (ASTM D 2419-79) Purpose: This test method is intended to serve as a rapid field-correlation test. The purpose of this test method is to indicate, under standard conditions, the relative proportions of clay-l ...
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... on the surfaces shaded from direct sunlight. During the measurements, the insulators were placed about 60 m away from the truck. To get a better view of the growth, which mainly were located on the upper side of the sheds, the insulators had to be turned up-side-down, tilting away from the point of ...
Design Objective 108-115096
Design Objective 108-115096

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Automatic test equipment



Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.
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