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FDS6994S October 2006 FDS6994S Dual Notebook Power Supply N-Channel PowerTrench SyncFet™ General Description Features The FDS6994S is designed to replace two single SO-8 MOSFETs and Schottky diode in synchronous DC:DC power supplies that provide various peripheral voltages for notebook computers and other battery powered electronic devices. FDS6994S contains two unique 30V, N-channel, logic level, PowerTrench MOSFETs designed to maximize power conversion efficiency. • Q2: Optimized to minimize conduction losses Includes SyncFET Schottky body diode 8.2A, 30V RDS(on) = 15 mΩ @ VGS = 10V RDS(on) = 17.5 mΩ @ VGS = 4.5V • The high-side switch (Q1) is designed with specific emphasis on reducing switching losses while the lowside switch (Q2) is optimized to reduce conduction losses. Q2 also includes an integrated Schottky diode using Fairchild’s monolithic SyncFET technology. Q1: Optimized for low switching losses Low gate charge (85.5 nC typical) 6.9A, 30V RDS(on) = 21 mΩ @ VGS = 10V RDS(on) = 26 mΩ @ VGS = 4.5V D1 D1 4 5 D2 Q1 6 D2 3 2 7 SO-8 S2 G2 S1 G1 Absolute Maximum Ratings Symbol 8 Drain-Source Voltage Gate-Source Voltage ID Drain Current Q2 - Continuous - Pulsed Power Dissipation for Dual Operation Power Dissipation for Single Operation PD (Note 1a) Q1 Units 30 30 ±16 8.2 30 ±16 6.9 20 V V A 2 1.6 1 0.9 -55 to +150 °C (Note 1a) 78 °C/W (Note 1) 40 °C/W (Note 1a) (Note 1b) (Note 1c) TJ, TSTG 1 TA = 25°C unless otherwise noted Parameter VDSS VGSS Q2 Operating and Storage Junction Temperature Range W Thermal Characteristics RθJA Thermal Resistance, Junction-to-Ambient RθJC Thermal Resistance, Junction-to-Case Package Marking and Ordering Information Device Marking Device Reel Size Tape width Quantity FDS6994S FDS6994S 13” 12mm 2500 units 2006 Fairchild Semiconductor Corporation FDS6994S Rev C2(W) Symbol Parameter TA = 25°C unless otherwise noted Test Conditions Type Min Typ Max Units Off Characteristics BVDSS ∆BVDSS ∆TJ IDSS IGSS Drain-Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate-Body Leakage On Characteristics VGS = ±16 V, VDS = 0 V Q2 Q1 Q2 Q1 Q2 Q1 All 30 30 V 23 24 mV/°C 500 1 ±100 µA nA (Note 2) VGS(th) Gate Threshold Voltage ∆VGS(th) ∆TJ Gate Threshold Voltage Temperature Coefficient Static Drain-Source On-Resistance RDS(on) VGS = 0 V, ID = 1 mA VGS = 0 V, ID = 250 uA ID = 1 mA, Referenced to 25°C ID = 250 µA, Referenced to 25°C VDS = 24 V, VGS = 0 V ID(on) On-State Drain Current gFS Forward Transconductance VDS = VGS, ID = 1 mA VDS = VGS, ID = 250 µA ID = 1 mA, Referenced to 25°C ID = 250 uA, Referenced to 25°C VGS = 10 V, ID = 8.2A VGS = 10 V, ID = 8.2 A, TJ = 125°C VGS = 4.5 V, ID = 7.6 A VGS = 10 V, ID = 6.9 A VGS = 10 V, ID = 6.9 A, TJ = 125°C VGS = 4.5 V, ID = 6.2 A VGS = 10 V, VDS = 5 V VDS = 10 V, ID = 8.2 A VDS = 10 V, ID = 6.9 A Q2 Q1 Q2 Q1 Q2 1 1 Q1 Q2 Q1 Q2 Q1 1.5 1.9 –2 –5 10 15 11 16 24 19 3 3 V mV/°C 15 24 17.5 21 33.5 26 30 20 42 41 mΩ A S Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance RG Gate Resistance VDS = 15 V, VGS = 0 V, f = 1.0 MHz VGS = 15 mV, f = 1.0 MHz Q2 Q1 Q2 Q1 Q2 Q1 Q2 Q1 2815 800 540 205 210 90 2.844444.9 2.6 4.6 pF pF pF Ω FDS6994S Rev C2(W) FDS6994S Electrical Characteristics Electrical Characteristics Symbol Parameter Switching Characteristics td(on) Turn-On Delay Time tr Turn-On Rise Time td(off) Turn-Off Delay Time tf Turn-Off Fall Time Qg Total Gate Charge Qgs Gate-Source Charge Qgd (continued) TA = 25°C unless otherwise noted Test Conditions Type Min Typ Max Units (Note 2) VDD = 15 V, ID = 1 A, VGS = 10V, RGEN = 6 Ω Q2: VDS = 15 V, ID = 7.9 A, VGS = 5 V Q1: VDS = 15 V, ID = 6.5 A, VGS = 5 V Gate-Drain Charge Q2 Q1 Q2 Q1 Q2 Q1 Q2 Q1 Q2 Q1 Q2 Q1 Q2 Q1 11 11 8 7 50 27 17 4 25 8 6 3 7 3 20 20 16 14 80 43 31 8 35 12 ns ns ns ns nC nC nC Drain–Source Diode Characteristics and Maximum Ratings IS Maximum Continuous Drain-Source Diode Forward Current tRR Reverse Recovery Time QRR Reverse Recovery Charge tRR Reverse Recovery Time IF = 8.2 A, diF/dt = 300 A/µs (Note 3) IF = 6.9 A, diF/dt = 100 A/µs (Note 3) QRR Reverse Recovery Charge VSD Drain-Source Diode Forward VGS = 0 V, IS = 2.3 A Voltage VGS = 0 V, IS = 1.3 A (Note 2) (Note 2) Q2 Q1 Q2 2.3 1.3 A 25 ns 19 nC ns Q2 23 Q2 Q1 10 0.4 0.53 nC 7 1.2 V Notes: 1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design. a) 78°C/W when mounted on a 2 0.5in pad of 2 oz copper b) 125°C/W when mounted on a 2 0.02 in pad of 2 oz copper c) 135°C/W when mounted on a minimum pad. Scale 1 : 1 on letter size paper 2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0% 3. See “SyncFET Schottky body diode characteristics” below. FDS6994S Rev C2(W) FDS6994S Typical Characteristics for Q2 1.6 30 3.5V 4.5V RDS(ON), NORMALIZED DRAIN-SOURCE ON-RESISTANCE ID, DRAIN CURRENT (A) VGS = 10V 3.0V 20 2.5V 10 0 0 0.5 1 1.5 1.4 VGS = 3.0V 3.5V 1.2 4.0V 4.5V 6.0V 10V 1 0.8 2 0 10 VDS, DRAIN-SOURCE VOLTAGE (V) Figure 1. On-Region Characteristics. 0.035 ID = 4.1A ID = 8.2A VGS = 10V RDS(ON), ON-RESISTANCE (OHM) RDS(ON), NORMALIZED DRAIN-SOURCE ON-RESISTANCE 30 Figure 2. On-Resistance Variation with Drain Current and Gate Voltage. 1.4 1.2 1 0.8 0.6 -50 -25 0 25 50 75 100 0.03 0.025 0.02 TA = 125oC 0.015 TA = 25oC 0.01 0.005 125 0 2 o TJ, JUNCTION TEMPERATURE ( C) 4 6 8 10 VGS, GATE TO SOURCE VOLTAGE (V) Figure 3. On-Resistance Variation with Temperature. Figure 4. On-Resistance Variation with Gate-to-Source Voltage. 30 10 IS, REVERSE DRAIN CURRENT (A) VDS = 5V 25 ID, DRAIN CURRENT (A) 20 ID, DRAIN CURRENT (A) 20 15 TA = 125oC 10 25oC 5 -55oC VGS = 0V TA = 125oC 1 25oC 0.1 -55oC 0.01 0.001 0 1 1.5 2 2.5 VGS, GATE TO SOURCE VOLTAGE (V) Figure 5. Transfer Characteristics. 3 0 0.1 0.2 0.3 0.4 0.5 0.6 VSD, BODY DIODE FORWARD VOLTAGE (V) Figure 6. Body Diode Forward Voltage Variation with Source Current and Temperature. FDS6994S Rev C2(W) FDS6994S Typical Characteristics for Q2 4000 VDS = 10V ID =8.2A f = 1MHz VGS = 0 V 15V 8 CAPACITANCE (pF) VGS, GATE-SOURCE VOLTAGE (V) 10 20V 6 4 3000 Ciss 2000 1000 Coss 2 Crss 0 0 0 10 20 30 40 50 0 5 Qg, GATE CHARGE (nC) Figure 7. Gate Charge Characteristics. 15 20 25 30 Figure 8. Capacitance Characteristics. 50 P(pk), PEAK TRANSIENT POWER (W) 100 RDS(ON) LIMIT 100µs 1ms 10ms 100ms 10 1s 1 10s DC VGS = 10V SINGLE PULSE RθJA = 135oC/W 0.1 TA = 25oC 0.1 1 10 SINGLE PULSE RθJA = 135°C/W TA = 25°C 40 30 20 10 0 0.001 0.01 100 0.01 0.1 1 10 100 1000 t1, TIME (sec) VDS, DRAIN-SOURCE VOLTAGE (V) Figure 9. Maximum Safe Operating Area. r(t), NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE ID, DRAIN CURRENT (A) 10 VDS, DRAIN TO SOURCE VOLTAGE (V) Figure 10. Single Pulse Maximum Power Dissipation. 1 D = 0.5 RθJA(t) = r(t) * RθJA RθJA = 135 °C/W 0.2 0.1 0.1 0.05 P(pk) 0.02 t1 0.01 t2 0.01 TJ - TA = P * RθJA(t) Duty Cycle, D = t1 / t2 SINGLE PULSE 0.001 0.0001 0.001 0.01 0.1 1 10 100 1000 t1, TIME (sec) Figure 11. Transient Thermal Response Curve. Thermal characterization performed using the conditions described in Note 1c. Transient thermal response will change depending on the circuit board design. FDS6994S Rev C2(W) FDS6994S Typical Characteristics for Q1 2.2 20 ID, DRAIN CURRENT (A) VGS = 10V RDS(ON), NORMALIZED DRAIN-SOURCE ON-RESISTANCE 4.5V 3.5V 15 10 3.0V 5 0 2 1.8 VGS = 3.5V 1.6 1.4 4.0V 4.5V 1.2 6.0V 10V 1 0.8 0 0.5 1 1.5 2 0 5 VDS, DRAIN TO SOURCE VOLTAGE (V) Figure 11. On-Region Characteristics. 20 0.075 ID = 6.9A VGS = 10V RDS(ON), ON-RESISTANCE (OHM) RDS(ON), NORMALIZED DRAIN-SOURCE ON-RESISTANCE 15 Figure 12. On-Resistance Variation with Drain Current and Gate Voltage. 1.6 1.4 1.2 1 0.8 0.6 -50 ID = 3.5A 0.05 TA = 125oC 0.025 TA = 25oC 0 -25 0 25 50 75 100 125 150 2 4 o 6 8 10 VGS, GATE TO SOURCE VOLTAGE (V) TJ, JUNCTION TEMPERATURE ( C) Figure 13. On-Resistance Variation with Temperature. Figure 14. On-Resistance Variation with Gate-to-Source Voltage. 20 IS, REVERSE DRAIN CURRENT (A) 100 VDS = 5V ID, DRAIN CURRENT (A) 10 ID, DRAIN CURRENT (A) 15 25oC 10 TA = 125oC -55oC 5 0 VGS = 0V 10 TA = 125oC 1 25oC 0.1 -55°C 0.01 0.001 0.0001 1.5 2 2.5 3 3.5 VGS, GATE TO SOURCE VOLTAGE (V) Figure 15. Transfer Characteristics. 4 0 0.2 0.4 0.6 0.8 1 1.2 VSD, BODY DIODE FORWARD VOLTAGE (V) Figure 16. Body Diode Forward Voltage Variation with Source Current and Temperature. FDS6994S Rev C2(W) FDS6994S Typical Characteristics Q1 1200 VDS = 10V ID = 6.9A 15V 4 f = 1 MHz VGS = 0 V 1000 CAPACITANCE (pF) VGS, GATE-SOURCE VOLTAGE (V) 5 20V 3 2 800 Ciss 600 400 Coss 1 200 Crss 0 0 2 4 6 8 0 10 0 5 Qg, GATE CHARGE (nC) Figure 17. Gate Charge Characteristics. 20 25 30 50 P(pk), PEAK TRANSIENT POWER (W) 100µs 10 RDS(ON) LIMIT 1ms 10ms 100ms 1s 10s 1 DC VGS = 10V SINGLE PULSE RθJA = 135oC/W 0.1 TA = 25oC 0.01 0.01 0.1 1 10 SINGLE PULSE RθJA = 135°C/W TA = 25°C 40 30 20 10 0 0.001 100 0.01 0.1 1 10 100 1000 t1, TIME (sec) VDS, DRAIN-SOURCE VOLTAGE (V) Figure 19. Maximum Safe Operating Area. r(t), NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE 15 Figure 18. Capacitance Characteristics. 100 ID, DRAIN CURRENT (A) 10 VDS, DRAIN TO SOURCE VOLTAGE (V) Figure 20. Single Pulse Maximum Power Dissipation. 1 D = 0.5 RθJA(t) = r(t) * RθJA 0.2 0.1 RθJA = 135oC/W 0.1 0.05 P(pk) 0.02 0.01 t1 t2 0.01 TJ - TA = P * RθJA(t) Duty Cycle, D = t1 / t2 SINGLE PULSE 0.001 0.0001 0.001 0.01 0.1 1 10 100 1000 t1, TIME (sec) Figure 21. Transient Thermal Response Curve. Thermal characterization performed using the conditions described in Note 1c. Transient thermal response will change depending on the circuit board design. FDS6994S Rev C2(W) FDS6994S Typical Characteristics (continued) This section copied from FDS6984S datasheet SyncFET Schottky Body Diode Characteristics Schottky barrier diodes exhibit significant leakage at high temperature and high reverse voltage. This will increase the power in the device. 3A/DIV IDSS, REVERSE LEAKAGE CURRENT (A) Fairchild’s SyncFET process embeds a Schottky diode in parallel with PowerTrench MOSFET. This diode exhibits similar characteristics to a discrete external Schottky diode in parallel with a MOSFET. Figure 22 shows the reverse recovery characteristic of the FDS6994S. 0.1 125oC 0.01 0.001 o 25 C 0.0001 0.00001 0 10 20 30 VDS, REVERSE VOLTAGE (V) Figure 24. SyncFET body diode reverse leakage versus drain-source voltage and temperature. 10nS/DIV Figure 22. FDS6994S SyncFET body diode reverse recovery characteristic. 3A/DIV For comparison purposes, Figure 23 shows the reverse recovery characteristics of the body diode of an equivalent size MOSFET produced without SyncFET (FDS6690A). 0V 10nS/DIV Figure 23. Non-SyncFET (FDS6690A) body diode reverse recovery characteristic. FDS6994S Rev C2(W) TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. FACT Quiet Series™ GlobalOptoisolator™ GTO™ HiSeC™ I2C™ i-Lo™ ImpliedDisconnect™ IntelliMAX™ ISOPLANAR™ LittleFET™ MICROCOUPLER™ MicroFET™ MicroPak™ MICROWIRE™ MSX™ MSXPro™ Across the board. Around the world.™ The Power Franchise® Programmable Active Droop™ ACEx™ ActiveArray™ Bottomless™ Build it Now™ CoolFET™ CROSSVOLT™ DOME™ EcoSPARK™ E2CMOS™ EnSigna™ FACT™ FAST® FASTr™ FPS™ FRFET™ OCX™ OCXPro™ OPTOLOGIC® OPTOPLANAR™ PACMAN™ POP™ Power247™ PowerEdge™ PowerSaver™ PowerTrench® QFET® QS™ QT Optoelectronics™ Quiet Series™ RapidConfigure™ RapidConnect™ μSerDes™ ScalarPump™ SILENT SWITCHER® SMART START™ SPM™ Stealth™ SuperFET™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TCM™ TinyBoost™ TinyBuck™ TinyPWM™ TinyPower™ TinyLogic® TINYOPTO™ TruTranslation™ UHC™ UniFET™ UltraFET® VCX™ Wire™ DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user. 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary First Production This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only. Rev. I20