Survey
* Your assessment is very important for improving the workof artificial intelligence, which forms the content of this project
* Your assessment is very important for improving the workof artificial intelligence, which forms the content of this project
Advisor : Walter Varhue PhD. Student: Kofi Adu Asante School of Engineering (Electrical Engineering) University of Vermont, February 8, 2012 Demonstrate that a buried Yttria Stabilized Zirconia (YSZ) insulator shows a significant increase in photocurrent compared to an epi Si –Si reference cell. Solar cell is a photovoltaic device designed to convert sunlight into electrical power . Success in PV technology requires advances in efficiency and cost reduction Light breaks silicon bonds and creates “free” electrons and holes “missing electrons” Holes are positive charges Built-in field separates electrons and holes n-type P+ eP+ B- P+ B- B- E-field h p-type Solution: Light trapping ThinFilm PV One way to improve the efficiency of solar cells is to make light bounce around inside them, increasing the chances that it will be absorbed. > Requirement: media with a different refractive index Thin film reduces the amount of materials used in PV cells, which cuts cell Randomly roughened surface increase the path length enhancement by 50 times. Crystalline SiGe and Si films are grown directly on a previously deposited heteroepitaxial layer of YSZ. YSZ Properties: Refractive index = 1.8-2.1 Bandgap= 5.8eV Acts as a perfect Lambertian Surface High temperature epi growth (above 1000oC) by CVD has been employed in the industry Because high temperature can not be used in many cases. New solutions are needed. Plasma enhances precursor gas decomposition and reactions Keeps wafers at lower temperatures compared to thermal CVD processes Low temperature growth of a epitaxial Si film on Si substrate with an insulator layer The insulator layer, yttria-stabilized zirconia (YSZ), is deposited via a reactive sputtering process in an electron cyclotron resonance (ECR) reactor. YSZ is relatively small lattice mismatch of about 5% with Si. Epitaxial SiGe and Si films were grown directly on a previously deposited heteroepitaxial layer of YSZ. YSZ Properties: Refractive index = 1.8-2.1 Bandgap= 5.8eV Acts as a perfect Lambertian Surface Dark Light PV properties 1. Open circuit Voltage 2. Short circuit voltage 3. Fill factor 4. Efficiency