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Transcript
Per Pin Parametric
Measurement Unit/Source Measure Unit
AD5520
FEATURES
GENERAL DESCRIPTION
Force/measure functions
FIMV, FVMI, FVMV, FIMI, FNMV
Force/measure voltage range ±11 V
4 user programmable force/measure current ranges
±4 μA, ±40 μA, ±400 μA, ±4 mA (external resistors)
2 user programmable extended current ranges
Up to 6 mA without external driver
Higher currents with external driver
Clamp circuitry and window comparators on board
Guard amplifier
64-lead LQFP package
The AD5520 is a single-channel, per pin parametric measurement unit (PPMU) for use in semiconductor automatic
test equipment. The part is also suited for use as a source
measurement unit for instrumentation applications. It
contains programmable modes to force a pin voltage and
measure the corresponding current, or force a current and
measure the voltage. The AD5520 can force/measure over a
±11 V range or user-programmable currents up to ±4 mA
with its on-board force amplifier. An external amplifier is
required for wider current ranges. The device provides a force
sense capability to ensure accuracy at the tester pin. A guard
output is also available to drive the shield of a force/sense pair.
The AD5520 is available in a 64-lead LQFP package.
APPLICATIONS
Automatic test equipment
Per pin PMU, shared pin PMU, device power supply
instrumentation
Source measure, parametric measurement,
precision measurement
www.BDTIC.com/ADI
COMPOUT1
COMPOUT2
COMPOUT0
COMPIN2
AD5520
COMPIN1
COMPIN0
FUNCTIONAL BLOCK DIAGRAM
AVEE AVCC
FOH
BW SELECT
FOH3
FOH2
FIN
FOH1
FOH0
MEASI5H
CLAMP
DETECT
MEASI4H
MEASI3H
MEASI2H
CLH
MEASI1H
CLL
MEASI0H
REFGND
G = 16
MEASIOUT
MEASIL
ISENSE
INST AMP
VSENSE
INST AMP
MEASOUT
GUARDIN
G=1
MEASVOUT
COMPARATOR
CPH
MEASVL
CPOH
AGND
QM5
03701-001
DGND
CS
DVDD
QM4
AC0
AC1
CLLDETECT
MOE
CLHDETECT
AM0
AM1
AM2
MSEL
FSEL
CPSEL
CPCK
STB
CPL
STANDBY
LOGICS
CPOL
GUARD
MEASVH
G=1
Figure 1.
Rev. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice.
No license is granted by implication or otherwise under any patent or patent rights of Analog
Devices.Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
© 2005 Analog Devices, Inc. All rights reserved.
AD5520
TABLE OF CONTENTS
Features .............................................................................................. 1
Force Control Amplifier............................................................ 15
Applications....................................................................................... 1
Comparator Function and Strobing ........................................ 15
General Description ......................................................................... 1
Clamp Function.......................................................................... 15
Functional Block Diagram .............................................................. 1
High Current Ranges ................................................................. 15
Specifications..................................................................................... 3
Circuit Operation ........................................................................... 16
Timing Characteristics..................................................................... 6
Force Voltage............................................................................... 16
Absolute Maximum Ratings............................................................ 7
Measure Current......................................................................... 16
ESD Caution.................................................................................. 7
Force Current.............................................................................. 17
Pin Configuration and Function Descriptions............................. 8
Measure Voltage ......................................................................... 17
Typical Performance Characteristics ........................................... 10
Short Circuit Protection ............................................................ 17
Theory of Operation ...................................................................... 13
Settling Time Considerations ....................................................... 18
Interface ........................................................................................... 14
PCB Layout and Power Supply Decoupling................................ 19
Standby Mode ............................................................................. 14
Typical Connection Circuit for the AD5520 .............................. 20
Force Voltage or Force Current ................................................ 14
Typical Application Circuit ........................................................... 21
Measured Parameter .................................................................. 14
Evaluation Board for the AD5520................................................ 22
Current Ranges ........................................................................... 14
Outline Dimensions ....................................................................... 24
RS Selection.................................................................................. 14
Ordering Guide .......................................................................... 24
www.BDTIC.com/ADI
REVISION HISTORY
9/05—Rev. A to Rev. B
Updated Format..................................................................Universal
Changes to Features.......................................................................... 1
Changes to Figure 1.......................................................................... 1
Changes to Specifications ................................................................ 3
Changes to Force Current Section................................................ 17
Changes to Figure 26 ..................................................................... 20
Updated Outline Dimensions ....................................................... 24
Changes to Ordering Guide .......................................................... 24
10/03—Rev. 0 to Rev. A
Changes to Specifications.................................................................3
Updated Ordering Guide .................................................................5
9/03—Revision 0: Initial Version
Rev. B | Page 2 of 24
AD5520
SPECIFICATIONS
AVCC = +15 V ± 5%, AVEE = −15 V ± 5%, DVDD = 5 V ± 10%, AGND = 0 V, REFGND = 0 V, DGND = 0 V. All specifications 0°C to 70°C,
unless otherwise noted.
Table 1.
Parameter
VOLTAGE FORCE MODE
Force Control Output Voltage Range
FOH Output Impedance
FOH0
FOH1
FOH2
FOH3
Input Offset Error
Input Offset Error Temperature Coefficient
Gain Error
Clamp Current Error 2
CURRENT MEASURE/FORCE
FOH0
FOH1
FOH2
FOH3
CURRENT MEASURE MODE
High Sense Input Range, VMEASIxH
Linearity 3
Input Bias Current
Input Bias Current Drift1
Output Offset Error
Min
Typ 1
Max
±11
70
2.5
3
500
60
±1
±10
±5
1
±1
±4
±40
±400
±4
Unit
Test Conditions/Comments
V
Ω
kΩ
kΩ
Ω
Ω
mV
μV/°C
%
% FS
RLOAD = 10 kΩ, CLOAD = 50 pF
μA
μA
μA
mA
±11
±0.01
±3
V
% FSR
nA
pA/°C
mV
mV
mV
mV
μV/°C
%
ppm/°C
mA
dB
of FIN
Suggested values; set with external sense resistors
MODE0, RS = 125 kΩ
MODE1, RS = 12.5 kΩ
MODE2, RS = 12.5 kΩ
MODE3, RS = 125 Ω
www.BDTIC.com/ADI
Output Offset Error Temperature Coefficient
Gain Error
Gain Error Temperature Coefficient 4
MEASIOUT Output Load Current
CMRR
CURRENT FORCE MODE
Input Offset Error
Gain Error
Clamp Voltage Error2
VOLTAGE MEASURE MODE
Differential Input Range
Low Sense Input Voltage Range
Linearity3
Input Offset Error
Input Offset Error Temperature Coefficient1
Gain Error
Gain Error Temperature Coefficient4
Input Bias Current
Input Bias Current Drift4
MEASVOUT Output Load Current
CMRR4
±1
50
±100
±100
±100
±100
±10
±0.1
30
±4
95
±0.35
±10
1
±1
mV
%
% FS
±11
V
mV
% FSR
mV
μV/°C
%
ppm/°C
nA
pA/°C
mA
dB
±100
±5
±15
±0.03
2
±1
50
±4
73
+0.005
±10
±0.15
±3
Rev. B | Page 3 of 24
+11 V > VFOL > −11 V
MODE0 (±4 μA)
MODE1 (±40 μA)
MODE2 (±400 μA)
MODE3 (±4 mA)
Gain of 16
@ DC
with MODE0, MODE1, MODE2, MODE3
of FIN
MEASVL
+11 V > VMEASVH to VMEASVL > −11 V
FIN = 0 V, measured @ MEASVOUT
Gain of 1
@ DC
AD5520
Parameter
AMPLIFIER SETTLING TIME4, 5
VSENSE Amp
ISENSE Amp
LOOP SETTLING4, 5
COMPIN2 = 100 pF
Min
Max
20
12
450
285
170
2
1.8
5.75
50
4.3
1.28
COMPIN1 = 1000 pF
COMPIN0 = 3000 pF
SLEW RATE4, 5
COMPARATOR
CPH, CPL Input Range
Input Offset
GUARD DRIVER
Output Voltage
Output Impedance
Output Offset Voltage
Load Current4
Output Settling Time4
ANALOG REFERENCE INPUTS
Force Control Input Range
Force Control Input Impedance
Clamp Control Input Range
Clamp Control Input Impedance
Comparator Threshold Input Range
Comparator Threshold Input Impedance
Input Capacitance4
LEAKAGE CURRENT
MEASIxx, MEASVx, MEASOUT Leakage
ANALOG MEASUREMENT OUTPUTS
Voltage Measure Output Impedance
Current Measure Output Impedance
Multiplexed Sense Output Impedance
Input Capacitance
MEASIxH, MEASVH, FOHx
LOGIC INPUTS
Input Current
Input Low Voltage, VINL
Input High Voltage, VIHL
Input Capacitance4
LOGIC OUTPUTS
Output Low Voltage, VOL4
Output High Voltage, VOH4
Typ 1
130
400
±4
0.5
Unit
Test Conditions/Comments
μs
μs
to 0.2%
to 0.2%
Settling to within 0.024% of 8 V step
MODE0
MODE1
MODE2, MODE3
MODE0
MODE1, MODE2, MODE3
MODE0, MODE1, MODE2, MODE3
COMPIN2 = 100 pF
COMPIN1 = 1000 pF
COMPIN0 = 3000 pF
600
390
240
2.5
2.4
8.7
μs
μs
μs
ms
ms
ms
mV/μs
mV/μs
mV/μs
±11
±7
V
mV
±11
V
Ω
mV
mA
μs
2
VCPH > VCPL
Capacitive load only
100 pF capacitive load
www.BDTIC.com/ADI
±11
V
MΩ
V
MΩ
V
MΩ
pF
1
±11
1
±11
1
3
±3
±20
VCLH > VCLL
nA
2
3
1
Ω
Ω
kΩ
8
pF
±1
0.8
μA
V
V
pF
All digital inputs together
0.4
V
V
ISINK = 2 mA
ISOURCE = 2 mA
2.0
3
2.4
Rev. B | Page 4 of 24
AD5520
Parameter
POWER REQUIREMENTS
AVCC
AVEE
Power Supply Rejection Ratio, PSRR1
FOH
MEASOUT
DC PSR
DVDD
IAVCC
IAVEE
IDVDD
Min
Typ 1
Max
Unit
Test Conditions/Comments
14.25
−14.25
15
−15
15.75
+15.75
V
V
for specific performance 6
100 kHz
500 kHz
1 MHz
100 kHz
500 kHz
12
12
0.5
dB
dB
dB
dB
dB
dB
V
mA
mA
mA
−25
−16
−15
−55
−10
90
5
Digital inputs at supply rails
1
Typical values are at 25°C and nominal supply, unless otherwise noted.
Full-scale = 11 V.
Full-scale range = 22 V.
4
Guaranteed by design and characterization, but not subject to production test.
5
Force control amplifier dominates slew rate and settling time.
6
Operational with ±12 V supplies, force/measure range is reduced to ±8.5 V.
2
3
www.BDTIC.com/ADI
Rev. B | Page 5 of 24
AD5520
TIMING CHARACTERISTICS
AVCC = +15 V ± 5%, AVEE = −15 V ± 5%, AGND = 0 V, REFGND = 0 V, DGND = 0 V. All specifications 0°C to 70°C, unless otherwise
noted. 1, 2
Table 2.
DVDD
Parameter
t1
t2
t3
t4
t5
t6
t7
t8
t9
t10
t11
t12
t13
Unit
ns min
ns min
ns min
ns min
ns min
ns min
ns min
ns min
ns min
μs min
ns min
ns min
ns min
Conditions/Comments
CS falling edge to STB falling edge setup time
STB pulse width
STB rising edge to CS rising edge setup time
Data setup time
CS falling edge to CPCK rising edge setup time
CPCK pulse width
CPCK to STB falling edge setup time
STB rising edge to QMx, CLxDETECT valid
STB rising edge to CPOH, CPOL valid
Comparator setup time, MODE2, MODE3 settling
Comparator hold time
Comparator output delay time
Comparator strobe pulse width
See Figure 2.
All input signals are specified with tr = tf = 1 ns (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2.
www.BDTIC.com/ADI
CS
t1
t2
t3
STB
t4
AMx, ACx, FSEL,
MSEL, CPSEL
t5
t6
t7
CPCK
t6
t9
QM4, QM5,
CLHDETECT,
CLLDETECT
03701-002
2
3.3 V
0
200
70
40
560
320
500
800
440
240
500
440
320
CPOL, CPOH
Figure 2. Timing Diagram
t11
MEASVOUT
OR MEASIOUT
CPCK
CPOH, CPOL
t13
t10
t12
Figure 3. Comparator Timing
Rev. B | Page 6 of 24
03701-003
1
5 V ± 10%
0
30
40
0
550
320
450
150
100
240
150
100
320
AD5520
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 3.
Parameter
AVCC to AVEE
AVCC to AGND
AVEE to AGND
DVDD
Digital Inputs to DGND
Analog Inputs to AGND
CLH to CLL
CPH to CPL
REFGND, DGND
Operating Temperature Range
Commercial (J Version)
Rating
34 V
−0.3 V, +17 V
+0.3 V, −17 V
−0.3 V to +6 V
−0.3 V to DVDD + 0.3 V
AVCC + 0.3 V to AVEE – 0.3 V
−0.3 V to +34 V
−0.3 V to +34 V
AVCC + 0.3 V to AVEE – 0.3 V
Storage Temperature Range
−65°C to +150°C
150°C
Maximum Junction Temperature,
(TJ max)
Package Power Dissipation
Thermal Impedance θJA
Lead Temperature
(Soldering 10 sec)
IR Reflow, Peak Temperature
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
0°C to 70°C
(TJ max – TA)/θJA
47.8°C /W
300°C
220°C
www.BDTIC.com/ADI
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. B | Page 7 of 24
AD5520
64 63 62 61 60 59 58
FOH
AVCC_B
COMPOUT0
COMPOUT1
COMPOUT2
COMPIN0
COMPIN1
COMPIN2
REFGND
MEASOUT
REFGND
MEASIOUT
MEASVOUT
FIN
CLH
CLL
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
57 56 55 54 53 52 51 50 49
CPH
1
CPL
2
48 AVEE_B
DVDD
3
46 MEASI4H
CPOH
4
45 FOH3
CPOL
5
44 MEASI3H
CPCK
6
DGND
7
CLHDETECT
8
CLLDETECT
9
PIN 1
47 MEASI5H
43 FOH2
AD5520
42 MEASI2H
TOP VIEW
(Not to Scale)
41 FOH1
40 MEASI1H
QM4 10
39 FOH0
QM5 11
38 MEASI0H
MOE 12
37 MEASIL
CS 13
36 MEASVH
STB 14
35 GUARD(NC)
AC0 15
34 MEASVL
AC1 16
33 AVCC_G
03701-004
GUARDIN
NC
GUARD
AVEE_G
AGND
AVCC
AVEE
CPSEL
MSEL
FSEL
STANDBY
AM0
AM1
AM2
DVDD
NC = NO CONNECT
DGND
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
Figure 4. Pin Configuration
www.BDTIC.com/ADI
Table 4. Pin Function Descriptions
Pin No.
1
2
3, 18
4
5
6
7, 17
8
9
10
Mnemonic
CPH
CPL
DVDD
CPOH
CPOL
CPCK
DGND
CLHDETECT
CLLDETECT
QM4
11
QM5
12
13
14
MOE
CS
STB
15
AC0
16
AC1
19
AM2
20
AM1
21
AM0
22
STANDBY
Description
Upper Comparator Threshold Voltage Input, CPH > CPL.
Lower Comparator Threshold Voltage Input, CPL < CPH.
Digital Supply Voltage.
Logic Output. When high, indicates MEASVOUT or MEASIOUT > CPH.
Logic Output. When high, indicates MEASVOUT or MEASIOUT < CPL.
Logic Input. Used to initiate comparator sampling and update CPOH and CPOL.
Digital Ground.
Logic Output. When high, indicates upper clamp active. See the Clamp Function section.
Logic Output. When high, indicates lower clamp active. See the Clamp Function section.
Logic Output. When high, indicates current range Mode 4 is enabled. May be used to drive external relay or
switch. See the High Current Ranges section.
Logic Output. When high, indicates current range Mode 5 is enabled. May be used to drive external relay or
switch. See the High Current Ranges section.
Active Low MEASOUT Enable.
Active Low Logic Input. The device is selected when this pin is low. See the Interface section.
Active Low Logic Input. Used in conjunction with CPCK and CS to configure the device for different
configurations. Rising edge of STB triggers sequence inputs. See the Interface section.
Logic Input. Used in conjunction with AC1 to select one of three external compensation capacitors.
See the Force Control Amplifier section.
Logic Input. Used in conjunction with AC0 to select one of three external compensation capacitors.
See the Force Control Amplifier section.
Logic Input. Used in conjunction with AM1 and AM0 to select one of six current ranges or to enable standby
mode. See the Current Ranges section.
Logic Input. Used in conjunction with AM2 and AM0 to select one of six current ranges or to enable standby
mode. See the Current Ranges section.
Logic Input. Used in conjunction with AM2 and AM1 to select one of six current ranges or to enable standby
mode. See the Current Ranges section.
Logic Input. When high, device is in standby mode of operation. See the Standby Mode section.
Rev. B | Page 8 of 24
AD5520
Pin No.
23
Mnemonic
FSEL
24
MSEL
25
CPSEL
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57, 59
58
60
61
62
63
64
AVEE
AVCC
AGND
AVEE_G
GUARD
NC
GUARDIN
AVCC_G
MEASVL
GUARD(NC)
MEASVH
MEASIL
MEASI0H
FOH0
MEASI1H
FOH1
MEASI2H
FOH2
MEASI3H
FOH3
MEASI4H
MEASI5H
AVEE_B
FOH
AVCC_B
COMPOUT0
COMPOUT1
COMPOUT2
COMPIN0
COMPIN1
COMPIN2
REFGND
MEASOUT
MEASIOUT
MEASVOUT
FIN
CLH
CLL
Description
Logic Input. Force mode select. Used to select between current or voltage force operation. See the
Force Voltage or Force Current section.
Logic Input. Measure mode select. Used to connect MEASOUT to either MEASIOUT when high or MEASVOUT
when low.
Logic Input. Comparator select. Used to compare CPL, CPH to MEASVOUT when low, or to MEASIOUT when
high. See the Comparator Function and Strobing section.
Most Negative Supply Voltage.
Most Positive Supply Voltage.
MEASx Input Ground.
Most Negative Supply Voltage.
Guard Output.
No Connect.
Guard Input.
Most Positive Supply Voltage.
DUT Voltage Sense Inputs (Low Sense).
No Connect.
DUT Voltage Sense Inputs (High Sense).
DUT Current Sense Inputs (Low Sense).
DUT Current Sense Inputs (High Sense).
Force Control Voltage Output.
DUT Current Sense Inputs (High Sense).
Force Control Voltage Output.
DUT Current Sense Inputs (High Sense).
Force Control Voltage Output.
DUT Current Sense Inputs (High Sense).
Force Control Voltage Output.
DUT Current Sense Inputs (High Sense).
DUT Current Sense Inputs (High Sense).
Most Negative Supply Voltage.
External Force Driver Control Voltage Output.
Most Positive Supply Voltage.
Compensation Capacitor 0 Output.
Compensation Capacitor 1 Output.
Compensation Capacitor 2 Output.
Compensation Capacitor 0 Input.
Compensation Capacitor 1 Input.
Compensation Capacitor 2 Input.
Analog Input/Output Reference Ground.
Multiplexed DUT Voltage/Current Sense Output. See the Measured Parameter section.
DUT Current Sense Output.
DUT Voltage Sense Output.
Force Control Voltage Input.
Upper Clamp Voltage Input CLH > CLL.
Lower Clamp Voltage CLL < CLH.
www.BDTIC.com/ADI
Rev. B | Page 9 of 24
AD5520
TYPICAL PERFORMANCE CHARACTERISTICS
0.0030
0.0030
VDD = +15V
VSS = –15V
MODE 3
0.0025
0.0020
IM LINEARITY (%)
0.0015
0.0010
0.0015
0.0010
0.0005
03701-005
0.0005
0.0020
0
0
10
20
30
40
50
TEMPERATURE (°C)
60
03701-008
VM LINEARITY (%)
0.0025
VDD = +15V
VSS = –15V
MODE 3
0
70
0
Figure 5. Voltage Sense Amplifier Linearity vs. Temperature
20
30
40
50
TEMPERATURE (°C)
60
70
Figure 8. Current Sense Linearity vs. Temperature
80
140
VDD = +15V
VSS = –15V
TA = 25°C
70
VDD = +15V
VSS = –15V
TA = 25°C
120
60
ISENSE CMRR
100
50
CMRR (dB)
80
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40
30
60
40
20
20
03701-006
10
0
1
10
100
1k
10k
FREQUENCY (Hz)
100k
03701-009
AMPLITUDE (dB)
10
0
1
1M
Figure 6. Voltage Sense Amplifier CMRR vs. Frequency
10
100
1k
10k
FREQUENCY (Hz)
100k
1M
Figure 9. Current Sense Amplifier CMRR vs. Frequency
10
5
0
CCOMP = 0.1nF
0
–5
AMPLITUDE (dB)
–20
CCOMP = 1.0nF
–30
CCOMP = 0.1nF
–10
–15
CCOMP = 1.0nF
–20
–25
–40
CCOMP = 3.3nF
VDD = +15V
VSS = –15V
TA = 25°C
–60
100
–30
1k
10k
FREQUENCY (Hz)
–35
–40
100
100k
Figure 7. Force Amplifier Bandwidth, Mode 0 (4 μA)
CCOMP = 3.3nF
VDD = +15V
VSS = –15V
TA = 25°C
03701-010
–50
03701-007
AMPLITUDE (dB)
–10
1k
10k
FREQUENCY (Hz)
Figure 10. Force Amplifier Bandwidth, Mode 1 (40 μA)
Rev. B | Page 10 of 24
100k
AD5520
0
0
VDD = +15V
VSS = –15V
TA = 25°C
–5
CCOMP = 0.1nF
–15
–20
CCOMP = 1.0nF
–25
–30
CCOMP = 3.3nF
–40
–45
100
1k
–15
–20
CCOMP = 1.0nF
–25
–30
CCOMP = 3.3nF
–35
03701-011
–35
CCOMP = 0.1nF
–10
AMPLITUDE (dB)
AMPLITUDE (dB)
–10
VDD = +15V
VSS = –15V
TA = 25°C
10k
FREQUENCY (Hz)
03701-014
–5
–40
–45
100
100k
Figure 11. Force Amplifier Bandwidth, Mode 2 (400 μA)
1k
10k
FREQUENCY (Hz)
100k
Figure 14. Force Amplifier Bandwidth, Mode 3 (4 mA)
5
30
VDD = +15V
VSS = –15V
TA = 25°C
0
ISENSE
20
–15
–20
–25
–30
10
0
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–10
03701-012
–20
–35
–40
1
10
100
1k
10k
100k
FREQUENCY (Hz)
1M
10M
VDD = +15V
VSS = –15V
TA = 25°C
–30
100
100M
Figure 12. Guard Amplifier Bandwidth
1k
10k
100k
FREQUENCY (Hz)
1M
10M
Figure 15. Voltage Sense and Current Sense Amplifier Bandwidths
20
10
VSENSE
03701-015
–10
AMPLITUDE (dB)
AMPLITUDE (dB)
–5
0
VDD = +15V
VSS = –15V
TA = 25°C
–5
VDD = +15V
VSS = –15V
TA = 25°C
AMPLITUDE (dB)
–10
–20
–30
–10
–15
–20
–40
–60
100k
1M
FREQUENCY (Hz)
–30
100k
10M
Figure 13. Current Sense Amplifier AC PSRR
03701-016
–25
–50
03701-013
AMPLITUDE (dB)
0
1M
FREQUENCY (Hz)
Figure 16. Force Amplifier AC PSRR, Mode 3, CCOMP = 100 pF
Rev. B | Page 11 of 24
10M
AD5520
20
10
16
VDD = +15V
VSS = –15V
TA = 25°C
14
VCC
12
10
–10
VOLTAGE (V)
–20
–30
8
6
4
–40
VDUT
2
03701-017
–50
–60
100k
1M
FREQUENCY (Hz)
03701-019
AMPLITUDE (dB)
0
0
–2
0
10M
5
Figure 17. Voltage Sense Amplifier AC PSRR
10
15
20
25
TIME (ms)
30
35
40
45
Figure 19. Power Up
700
9
COMPIN2 = 100pF
8
COMPIN1 = 1000pF
600
GUARD
7
VOLTAGE (V)
6
400
VSENSE
300
200
5
COMPIN2 = 3000pF
4
3
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2
FOH
ISENSE
0
10
100
1k
FREQUENCY (Hz)
10k
0
–1
100k
0
Figure 18. Noise Spectral Density
0.001
0.002
0.003
0.004 0.005
TIME (s)
0.006
Figure 20. Settling Time, Mode 2
Rev. B | Page 12 of 24
0.007
03701-020
1
100
03701-018
nV/√Hz
500
0.008
AD5520
THEORY OF OPERATION
The AD5520 is a single-channel per pin parametric measurement unit (PPMU) for use in semiconductor automatic test
equipment. It contains programmable modes to force a pin
voltage and measure the corresponding current (FVMI), force
current measure voltage (FIMV), force current measure current
(FIMI), force voltage measure voltage (FVMV), and force
nothing measure voltage (FNMV). The PPMU can force or
measure a voltage from −11 V to +11 V. It can force or measure
currents up to 6 mA using the internal amplifier, while the
addition of an external amplifier enables higher current ranges.
External resistors allow users to choose the optimum ranges for
their needs.
The AD5520 has an on-board window comparator that
provides two bits of useful information, DUT too low or too
high. Also provided on the chip is clamp circuitry that flags via
CLHDETECT and CLLDETECT if the voltage applied to FIN
or across the DUT exceeds the voltage applied to CLL and CLH.
On-chip is clamp circuitry that clamps the output of the force
amplifier if the voltage at MEASIOUT and MEASVOUT
exceeds CLL or CLH.
The device provides a force sense capability to ensure accuracy
at the tester pin. A guard output is also available to drive the
shield of a force/sense pair.
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Rev. B | Page 13 of 24
AD5520
INTERFACE
The AD5520 PPMU is controlled via a number of digital inputs,
which are discussed in detail in the following sections. All
inputs are TTL-compatible. CS is used to select the device while
STB (active low input) latches data available on the other digital
inputs and updates any required digital outputs. The rising edge
of STB triggers sequence inputs. The remaining digital inputs
control the function of the PMU. They also determine which
measure mode the PMU is in, the compensation capacitor used,
and the selected current range.
STANDBY MODE
The AD5520 can be placed into standby mode via the standby
logic input. In this mode, the force amplifier is disconnected
from the force input (FIN). In addition, the switch in series with
the force output pins (FOHx) is opened, and the current
measure amplifier is disconnected from the sense resistors. The
voltage measure amplifier is still connected across the DUT;
therefore, DUT voltage measurements may still be made while
in standby mode. Figure 21 shows the configuration of the
PMU while in standby mode.
Table 5. Standby Mode
Standby
Low
High
MEASURED PARAMETER
MEASOUT is a muxed output that tracks the sensed parameter.
MSEL (digital input) connects the MEASOUT to the output of
the current sense amplifier or the voltage sense amplifier,
depending on which is the measured parameter of interest.
The MEASOUT pin is connected back to an ADC to allow the
measured value to be converted to a digital code.
Table 7. MEASOUT Connected to Voltage or Current
MSEL
Low
High
Function
MEASOUT = DUT Voltage
MEASOUT = DUT Current
The MEASOUT pin can also be made high impedance through
the MOEB logic input.
Table 8. MOEB Allows MEASOUT to Go High Impedance
MOEB
Low
High
Function
Enable MEASOUT Output
Hi-Z MEASOUT Output
CURRENT RANGES
A number of current ranges are possible with the AD5520. The
AM0, AM1, and AM2 pins are digital inputs used to establish
full-scale current range of the PMU.
Function
Normal Force Mode
Standby Mode
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Table 9. Selection of Current Range
DAC
FIN
FOHx
G = 16
MEASIOUT
MEASIHx
MEASVH
MEASVL
DUT
03701-021
G=1
AM2
Low
Low
Low
Low
High
High
Low
High
Low
High
High
High
High
High
Function
Current Range MODE0 (4 μA)
Current Range MODE1 (40 μA)
Current Range MODE2 (400 μA)
Current Range MODE3 (4 mA)
Current Range MODE4
(External Buffer Mode)
Current Range MODE5
(External Buffer Mode)
Standby (Same as STANDBY = High)
Standby (Same as STANDBY = High)
RS SELECTION
Figure 21. PMU in Standby Mode
FORCE VOLTAGE OR FORCE CURRENT
FSEL is an input that determines whether the PPMU forces a
voltage or current.
Table 6. FSEL Function
FSEL
Low
High
AM1
Low
Low
High
High
Low
RS
MEASIL
MEASVOUT
AM0
Low
High
Low
High
Low
Function
Voltage Force and Current Clamp with MEASIOUT Voltage
Current Force and Voltage Clamp with MEASVOUT Voltage
The AD5520 is designed to ensure the voltage drop across each
of the RS resistors is less than ±500 mV when maximum current
is flowing through them. To support other current ranges, these
sense resistor values can be changed. The force amplifier can
drive a maximum of 6 mA. It is not recommended to increase
the maximum current above the nominal range.
The two external current ranges use an external buffer to drive
higher current. The example in Figure 26 uses 40 mA and
160 mA ranges. These ranges can be changed to suit user
requirements for a high current range.
Rev. B | Page 14 of 24
AD5520
FORCE CONTROL AMPLIFIER
CLAMP FUNCTION
The force control amplifier requires external capacitors
connected between the COMPOUTx and COMPINx pins.
For stability with large capacitance at the DUT, the largest
capacitance value (3000 pF) should be selected. The force
control amplifier should always contribute the dominant
pole in the control loop. Settling times increase with
larger capacitances. ACx inputs select which external
compensation capacitor is used.
Clamp circuitry, which is also included on-chip, clamps the
force amplifier’s output if the voltage or current applied to the
DUT exceeds the clamp levels, CLL and CLH. The clamp
circuitry also comes into play in the event of a short or open
circuit. When in force current range, the voltage clamps protect
the DUT from an open circuit. Likewise, when forcing a voltage
and a short circuit occurs, the current clamps protect the DUT.
The clamps also function to protect the DUT if a transient
voltage or current spike occurs when changing to a different
operating mode, or when programming the device to a different
current range.
Table 10. AC0, AC1 Compensation Capacitor Selection
AC0
Low
High
Low
AC1
Low
Low
High
Function
Select External Compensation Capacitor 0
Select External Compensation Capacitor 1
Select External Compensation Capacitor 2
The digital output flags, which indicate a clamp limit has been
hit, are CLHDETECT for the upper clamp, and CLLDETECT
output for the lower clamp.
COMPARATOR FUNCTION AND STROBING
Table 13. Clamp Detect Outputs
The AD5520 has an on-board window comparator that
provides two bits of useful information, DUT too low or
DUT too high. CPSEL is the digital input that controls
this function, selecting whether it should compare to the
voltage sense or the current sense amplifier.
CLHDETECT
Low
High
CLLDETECT
Low
High
Table 11. Comparator Function Select
CPSEL
Low
High
Function
Compare CPL, CPH to MEASVOUT
Compare CPL, CPH to MEASIOUT
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HIGH CURRENT RANGES
After CPSEL has selected which amplifier output is of interest,
logic input CPCK is used to initiate comparator sampling and
update the logic outputs CPOH and CPOL. This indicates
whether the voltages at MEASIOUT or MEASVOUT have
exceeded voltages set at CPL or CPH (thus providing DUT too
high or DUT too low information). A rising edge on STB is
required to clock the CPOH and CPOL data out.
Table 12. CPCK Synchronous Logic Outputs
CPOH
Low
High
CPOL
Low
High
Function
Upper Clamp Inactive
Upper Clamp Active
Function
Lower Clamp Inactive
Lower Clamp Active
Function
MEASVOUT or MEASIOUT < CPH MEASVOUT or
MEASIOUT > CPH
Function
MEASVOUT or MEASIOUT > CPL MEASVOUT or
MEASIOUT < CPL
With the use of an external high current amplifier, two high
current ranges are possible. The current range values can be set
as required in the application through appropriate selection of
the sense resistors connected between MEASI5H, MEASI4H,
and MEASIL. When one of these high current ranges (Mode 4
or Mode 5) is selected via the AMx control lines, the appropriate QM4 or QM5 output is enabled. As a result, these outputs
can be used to control relays connected in series with the high
current amplifier, as shown in Figure 26.
Table 14. High Current Range Logic Outputs
QM4
High
Low
Rev. B | Page 15 of 24
QM5
Low
High
Function
Current Range Mode 4 Enable Output
Current Range Mode 5 Enable Output
AD5520
CIRCUIT OPERATION
FORCE VOLTAGE
MEASURE CURRENT
Most PMU measurements are performed while in force voltage
and measure current modes; for example, when the device is
used as a device power supply, or in continuity or leakage
testing. In the force voltage mode, the voltage at analog input
FIN is mapped directly to the voltage forced at the DUT.
Figure 23 shows a simplified diagram of the PMU when in force
voltage mode. The control loop consists of the force amplifier
with the voltage sense amplifier making up the feedback path.
Current flowing through the DUT is measured by sensing the
current flowing through a selectable sense resistor, which is in
series with the DUT. The current sense amplifier (Gain = 16)
generates a voltage at its output, which is proportional to the
current flowing through the DUT. This voltage is compared to
the CLL and CLH levels to ensure the clamp voltages have not
been exceeded. Strobing CPCK and STB provides information
about the voltage level with respect to the comparator levels,
CPH and CPL.
When in force voltage and measure current modes, the
maximum voltage applied to the input corresponds to the
maximum current outputs. Figure 22 shows the transfer
function when forcing a voltage.
VDUT
FIN
VCLH ×
RDUT
RS × 16
FOHx
MEASIHx
VFIN
VFIN
G = 16
CLH
MEASIL
MEASVH
CLL
RS × 16
VCLH
VCLL
MEASIOUT
RDUT
MEASVOUT
VCLL ×
RS
G=1
RDUT
MEASVL
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REFGNDI/V
IDUT
VMEASVOUT
VMEASIOUT
CONDITION
VCLH > IDUT × RS × 16
VCLL < IDUT × RS × 16
VCLH < IDUT × RS × 16
VCLL < IDUT × RS × 16
VCLH > IDUT × RS × 16
VCLL > IDUT × RS × 16
OUTPUT
VDUT = VFIN
VDUT = VCLH
VDUT = VCLL
Figure 23. Force Voltage, Measure Current Mode
VCLH
RS × 16
VCLH
VCLH
VFIN
VCLL
03701-022
RS × 16
Figure 22. Force Voltage Transfer Function
Rev. B | Page 16 of 24
03701-023
V
V
AD5520
FORCE CURRENT
SHORT CIRCUIT PROTECTION
In force current mode, the voltage at FIN is now converted to a
current through the following relationship:
The AD5520 is designed to withstand a direct short circuit on
any of the amplifier outputs.
Force Current = VFIN/(RSENSE × 16)
Figure 24 shows a simplified diagram of the PMU when in force
current mode. The control loop consists of the force amplifier
with the current sense amplifier making up the feedback path.
In this case, voltage at the DUT is sensed across the voltage
measure amplifier (Gain = 1) and presented at the MEASVOUT
output.
Figure 25 illustrates the transfer function of the current force
mode.
IDUT
VCLH
RDUT
FIN
VFIN
FOHx
MEASIHx
VFIN
G = 16
CLH
MEASIL
REFGNDI/V
MEASIOUT
MEASVOUT
VCLL
V
RS
MEASVH
CLL
VCLH
VCLL
RDUT
G=1
RDUT
MEASVL
VDUT
VMEASVOUT
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CONDITION
OUTPUT
VMEASIOUT
VCLH > VDUT
VCLL < VDUT
IDUT =
VFIN
RS
VCLH < VDUT
VCLL < VDUT
IDUT =
VCLH
RS
VCLH
VCLH > VDUT
VCLL > VDUT
IDUT =
VCLL
RS
03701-024
V
VCLH
Figure 24. Current Force, Voltage Measure Mode
VCLH
MEASURE VOLTAGE
VFIN
Rev. B | Page 17 of 24
03701-025
VCLH
A DUT voltage is tested via the voltage measure amplifier by a
window comparator to ensure that CPH and CPL levels are not
exceeded. In addition, the DUT voltage is automatically tested
against the voltage levels at the clamp, and clamp flags are
enabled if the DUT voltage exceeds either of the levels.
Figure 25. Current Force Transfer Function
AD5520
SETTLING TIME CONSIDERATIONS
Fast throughput is a key requirement in automatic test
equipment because it relates directly to the cost of manufacturing the DUT; thus reducing the time required to make a
measurement is of greatest importance. When taking
measurements using a PMU, the limiting factor is usually the
time it takes the output to settle to the required accuracy so a
measurement can be taken. DUT capacitance, measurement
accuracy, and the design of the PMU are the major contributors
to this time.
Figure 26 shows a simplified block diagram of the AD5520
PMU. In brief, the device consists of a force control amplifier,
access to a number of selectable sense resistors, a voltage
measure instrumentation amplifier, and a current measure
instrumentation amplifier. To optimize the performance of the
device, there are also nodes provided where external compensation capacitors are added. As mentioned, making an accurate
measurement in the fastest time while avoiding overshoots and
ringing is the key requirement in any automatic test equipment
(ATE) system. Doing so provides challenges, however. The
external compensation capacitors set up different settling times
or bandwidths on the force control amplifier, and while one
compensation capacitor value may suit one range, it may not
suit other ranges. To optimize measurement performance and
speed, differences in signal behavior on each range and
frequency of use of each range need to be taken into account.
When selecting a faster settling time, there is a trade-off.
A small compensation value results in faster settling, but
may incur penalties in overshoots or ringing at the DUT.
Compensation capacitor selection should be optimized to
ensure minimum overshoots while still giving decent settling
time performance.
While careful selection of the compensation capacitor is
required to minimize the settling time, another factor can
greatly contribute to the overall settling of the loop if the
feedback loop is broken in some manner, and the force control
amplifier goes to either the positive or negative rails. There is a
finite amount of time required for the amplifier to recover from
this condition, typically 85 μs, which adds to the settling of the
loop. Ensuring that the force control amplifier never goes into
saturation is the best solution. This solution can be helped by
putting the device into standby mode any time the operating
mode or range selection is changed. In addition, ensure that the
selected output range can supply the required current needed by
the DUT.
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Rev. B | Page 18 of 24
AD5520
PCB LAYOUT AND POWER SUPPLY DECOUPLING
In any circuit where accuracy is important, careful consideration to the power supply and the ground return layout helps to
ensure the rated performance. The printed circuit board on
which the AD5520 is mounted should be designed so that the
analog and digital sections are separated and confined to
certain areas of the board. If the PMU is in a system where
multiple devices require an AGND-to-DGND connection, the
connection should be made at one point only. The star ground
point should be established as close as possible to the device.
This PMU should have ample supply bypassing of 10 μF in
parallel with 0.1 μF on the supply and should be located as close
as possible to the package, ideally right up against the device. The
0.1 μF capacitor should have low effective series resistance (ESR)
and effective series inductance (ESI), such as the common
ceramic types that provide a low impedance path to ground at
high frequencies, to handle transient currents due to internal
logic switching. Low ESR (1 μF to 10 μF) tantalum or electrolytic
capacitors should also be applied at the supplies to minimize
transient disturbance and filter out low frequency ripple.
Fast switching signals, such as clocks, should be shielded with
digital ground to avoid radiating noise to other parts of the
board and should never be run near the reference inputs.
Avoid crossover of digital and analog signals. Traces on
opposite sides of the board should run at right angles to each
other. This reduces the effects of feedthrough through the
board. A microstrip technique is by far the best but not always
possible with a double-sided board. In this technique, the
component side of the board is dedicated to the ground plane
while signal traces are placed on the solder side.
It is good practice to use compact, minimum lead length PCB
layout design. Leads to the input should be as short as possible
to minimize IR drops and stray inductance.
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Rev. B | Page 19 of 24
AD5520
TYPICAL CONNECTION CIRCUIT FOR THE AD5520
Figure 26 shows the AD5520 as connected in a typical application. The external components required are three compensation
capacitors and six sense resistors, depending on the number of
ranges required. If high current ranges >6 mA are required, an
external amplifier must be used with relays (or some form of
high current switch) to switch in the different current ranges to
the DUT. Other components are also required to make the
PMU function.
The PMU requires a number of discrete voltage levels: five DAC
levels for each PMU used in the system, two levels each for the
comparator and clamps, and one voltage level for the AD5520
force input voltage. To use the information measured at the
DUT, an ADC such as the AD7665 (a 16-bit ADC), must be
connected to the MEASOUT pin to convert the measured
current or voltage to digital for analysis.
3000pF
1000pF
100pF
COMPOUT2
COMPOUT1
COMPOUT0
COMPIN2
COMPIN1
AD5520
COMPIN0
+15V –15V
AVEE AVCC
AD815
FOH
BW SELECT
RELAY
FOH3
FOH2
FIN
FOH1
FOH0
FORCE
AMPLIFIER
<±11.5V
MEASI5H
CLAMP
DETECT
MEASI4H
3.126Ω
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MEASI3H
12.5Ω
MEASI2H
CLH
125Ω
MEASI1H
CLL
1.25kΩ
12.5kΩ
MEASI0H
REFGND
125kΩ
G = 16
MEASIOUT
MEASIL
ISENSE
INST AMP
GUARDIN
MEASOUT
VSENSE
INST AMP
G=1
MEASVH
G=1
MEASVOUT
COMPARATOR
CPH
GUARD
AGND
<±100mV
Figure 26. Typical Configuration of the AD5520 as Used in an ATE Circuit
Rev. B | Page 20 of 24
03701-026
DGND
CS
DVDD
QM4
AC0
AC1
CLLDETECT
CLHDETECT
MOE
QM5
AM0
AM1
AM2
MSEL
FSEL
CPSEL
STB
CPCK
STANDBY
LOGICS
CPL
DUT
MEASVL
CPOH
CPOL
≥±11V
AD5520
TYPICAL APPLICATION CIRCUIT
Figure 27 shows the AD5520 as in an ATE system. This device
can used as a per pin parametric unit in order to speed up the
rate at which testing can be done. It can also be used as a DUT
power supply, as shown in the application circuit.
The flexible function of the AD5520 also makes it suited for use
in instrumentation applications such as source measure units.
Source measure units are programmable instruments capable of
sourcing and measuring voltage or current simultaneously. The
AD5520 provides a more integrated solution in such
equipment.
The central PMU shown in the block diagram (Figure 27) is
usually a highly accurate PMU and is shared among a number
of pins in the tester. In general, many discrete levels are required
in an ATE system for the pin drivers, comparators, clamps, and
active loads. DAC devices, such as the AD5379, offer a highly
integrated solution for a number of these levels. The AD5379 is
a dense 40-channel DAC designed with high channel
requirements, such as ATE.
CENTRAL PMU
DAC
GUARD AMP
ADC
DAC
DAC
VCH
ADC
VTERM
DAC
TIMING DATA
MEMORY
PPMU
VH
DEVICE UNDER
TEST (DUT)
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DAC
RELAYS
TIMING
GENERATOR
DLL, LOGIC
FORMATTER
DE-SKEW
VCL
VL
DAC
DAC
DEVICE POWER
SUPPLIES
VTH
FORMATTER
DE-SKEW
GUARD
AMP
GND SENSE
DAC
DAC
COMP
VTL
ADC
DAC
ACTIVE LOAD
IOL
DAC
VCOM
DAC
DAC
03701-027
COMPARE
MEMORY
50Ω COAX
DRIVER
IOH
Figure 27. Typical Application ATE Circuit
Rev. B | Page 21 of 24
AD5520
EVALUATION BOARD FOR THE AD5520
A full-featured evaluation kit is available for the AD5520. It
includes an evaluation board with direct hookup via a 36-way
Centronics connector to a PC. PC-based software to control the
AD5520 is also part of the evaluation kit. The evaluation board
schematic is shown in Figure 28.
Note that VDD and VSS must provide sufficient headroom for the
force and measure voltage range. In addition to the supply
voltages for the evaluation board, it is necessary to provide the
voltage levels for the clamp, comparator, and the force input
pins (CLL, CLH, CPL, CPH, and FIN). SMB connections are
provided for these voltage inputs. To use the evaluation board, it
is also necessary to provide a DUT connected via the gold pins.
Both AGND and DGND inputs are provided on the board. The
AGND and DGND planes are connected at one location close
to the AD5520. It is recommended not to connect AGND and
DGND elsewhere in the system to avoid ground loop problems.
REFGND is routed back to AGND at the power block to
maintain a clean ground reference for accurate measurements.
Each supply is decoupled to the relevant ground plane with
10 μF and 0.1 μF capacitors. The device supply pin is again
decoupled with a 10 μF and 0.1 μF capacitor pair to the relevant
ground plane.
Care should be taken when replacing devices to ensure that the
pins line up correctly with the PCB pads.
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Rev. B | Page 22 of 24
03701-028
C26
0.1μF
C27
0.1μF
Figure 28. Evaluation Board Schematic
Rev. B | Page 23 of 24
J1–2
J1–3
J1–4
J1–5
J1–6
J1–7
J1–8
J1–9
J1–36
J1–31
J1–1
J1–14
D[0:7]
D0
D1
D2
D3
D4
D5
D6
D7
D0
D1
D2
D3
D4
D5
D6
D7
D0
D1
D2
D3
D4
D5
D6
D7
D0
D1
D2
D3
D4
D5
D6
D7
D0
D1
D2
D3
D4
D5
D6
D7
D0
D1
D2
D3
D4
D5
D6
D7
2
3
4
5
6
7
8
D6
9
D7
D0
D1
D2
D3
D4
D5
19
18
17
16
15
14
13
12
19
18
17
16
15
14
13
12
11
C
1
OE
U3
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
74HCT573
U4
Q4
Q5
Q6
Q7
Q0
Q1
Q2
Q3
J1–19
J1–20
J1–21
J1–22
J1–23
J1–24
J1–25
J1–26
J1–27
J1–28
J1–29
J1–30
19
18
17
16
15
14
13
12
U2
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
74HCT573
11
C
1
OE
2
3
4
5
6
7
8
9
11
C
1
OE
2
3
4
5
6
7
8
9
J10–2
J10–1
C20
0.1μF
20V
C6
10μF
C5
0.1μF
C21
10μF
C9, 3.3nF
C8, 1nF
C7, 100pF
20V
C4
10μF
C3
0.1μF
COMPIN0
COMPOUT0
COMPIN1
COMPOUT1
COMPIN2
COMPOUT2
CPOH
CPOL
CHL-DET
CLL-DET
QM4
QM5
AM0
AM1
AM2
FSEL
CPSEL
MSEL
AC0
AC1
STANDBY
STB
CPCK
MOEB
CSB
AVCC
AVCC_G
20V
+5VD
J11–3
J11–2
J11–1
3
58
60
61
62
63
64
1
2
C24
0.1μF
C22
0.1μF
AGND
28
MEASVH
NC
MEASVL
GAURDIN
NC
GUARD
MEASI5H
MEASI4H
FOH3
MEASI3H
FOH2
MEASI2H
FOH1
MEASI1H
FOH0
MEASIOH
MEASIL
FOH
J2
T4
T12
C25
10μF
C23
10μF
36
35
34
32
31
30
47
46
45
44
43
42
41
40
39
38
37
49
59
REFGND
57
REFGND
MEASOUT
MEASIOUT
MEASVOUT
FIN
CLH
CLL
CPH
CPL
DVDD
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DGND DGND
7
17
26
AVEE
29
AVEE_G
48
AVEE_B
54
51
55
52
56
53
4
5
8
9
10
11
21
20
19
23
25
24
15
16
22
14
6
12
13
27
33
50
DVDD
18
20V
C1
0.1μF
T5
J3
C14
R12
5kΩ
T6
J4
+15V
–15V
20V
20V
LK1
R1, 124kΩ
+5VD
T8
J6
T9
J7
R11
5kΩ
AD815ARB
U5–A
T7
J5
C18
C17
R2, 12.4kΩ
+15V
R10
R4, 124Ω
74HCT573
R3, 1.24kΩ
C28
0.1μF
T10
J8
RELAY–G6H
8
9
T11
J9
C19
7
R6
+5VD
R5, 12.4Ω
C2
10μF
R7
U2, U3, U4 BYPASS CAPACITORS
4
2
B
RL1
C15
10pF
–15V
E
Q1
C
10
1
20V
C11
0.1μF
C10
10μF
7
8
9
QM4
R8
10kΩ
D1
RELAY–G6H
+15V
20V
C13
10μF
12
AD815ARB–24
U5–C –VS
+VS
C12
13
0.1μF
3
+5VD
4
3
2
T2
16
15
T1
E
Q1
C
10
1
B
RL2
14
T3
QM5
R9
10kΩ
D2
AD815ARB–24
U5–B
C16
10pF
+5VD
AD5520
AD5520
Preliminary Technical Data
OUTLINE DIMENSIONS
0.75
0.60
0.45
12.00
BSC SQ
1.60
MAX
64
49
1
48
PIN 1
10.00
BSC SQ
TOP VIEW
(PINS DOWN)
1.45
1.40
1.35
0.15
0.05
SEATING
PLANE
0.20
0.09
7°
3.5°
0°
0.08 MAX
COPLANARITY
VIEW A
16
33
32
17
VIEW A
0.50
BSC
LEAD PITCH
0.27
0.22
0.17
ROTATED 90° CCW
COMPLIANT TO JEDEC STANDARDS MS-026-BCD
Figure 29. 64-Lead Low Profile Quad Flat Package [LQFP]
(ST-64-2)
Dimensions shown in millimeters
ORDERING GUIDE
Model
AD5520JST
AD5520JST-REEL
AD5520JSTZ-REEL 1
EVAL-AD5520EB
1
Z = Pb-free part.
Temperature Range
0°C to 70°C
0°C to 70°C
0°C to 70°C
Package Description
64-Lead Low Profile Quad Flat Package [LQFP]
64-Lead Low Profile Quad Flat Package [LQFP]
64-Lead Low Profile Quad Flat Package [LQFP]
Evaluation Board and Software
Package Option
ST-64-2
ST-64-2
ST-64-2
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© 2005 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
C03701-0-9/05(B)
Rev. B | Page 24 of 24